摘要:
A pulse-width-to-voltage (“PWV”) converter, comprises: a switch, a capacitor, a current source, and a current sink. The switch is operable by a signal. The current source, the current sink, and the switch are serially connected across a high voltage potential and a low voltage potential. An output node is coupled to a serial connection between the current source and the current sink. An end of the capacitor is coupled to the output node for converting a current into a control voltage indicative of a duty cycle of the signal.
摘要:
A master-slave delay locked loop system comprises a master delay locked loop (“MDLL”) for generating at least one bias voltage and at least one slave delay locked loop (“SDLL”). The at least one SDLL is coupled to the MDLL, where the at least one SDLL comprises an analog to digital converter for converting the at least one bias voltage to at least one digital signal, an adder/subtractor block for adjusting the at least one digital signal based on at least one control signal, a digital to analog converter for converting the at least one adjusted digital signal to at least one analog signal, a voltage to current converter for converting the at least one analog signal to at least one bias current, delay elements for generating phase delayed signals based on the at least one bias current, and a phase detector and control logic for determining any phase difference between the phase delayed signals and for generating the at least one control signal to align the phase delayed signals.
摘要:
An optimized method and apparatus for determining optimal DQS delay for DDR memory interfaces are disclosed. The method performs data eye training in a two dimensional space with time delay value as x-axis and reference voltage (Vref) as y-axis to determine a rectangular data eye within an overall data eye with Vref margin.
摘要:
A content addressable memory (“CAM”) field enabling logic comprises fields and field enable logics. The fields each have local match lines and a corresponding field enable control for enabling the respective field. The field enable logics are serially connected. Each of the fields is coupled to a corresponding one of the field enable logics via the respective local match lines. The corresponding field enable control for each of the fields is coupled to the corresponding one of the field enable logic and to any ones of the field enable logics that come after the corresponding one of the field enable logic along the serially-connected field enable logics.
摘要:
A line sense amplifier comprises: a presearch block, a main search block, and a timing circuit. The presearch block is coupled to a presearch line for sensing the presearch line. The main search block is coupled to a main line for sensing the main line. The timing circuit operates the presearch block and the main search block for charging and sensing of the presearch line and the main line. The timing circuit initiates the main search block to determine a match condition for the main line based on whether a match condition is determined for the presearch line.
摘要:
A memory built-in self test (“BIST”) system comprises: a controller; a single port memory engine coupled to one or more single port memories; and a non-single port memory engine coupled to one or more non-single port memories. The controller receives operation codes (“op-codes”) for testing a plurality of memory types. An output of the controller is coupled to inputs of the single port memory engine and the non-single port memory engine. The controller generates test instructions based on the received op-codes. The single port memory engine and the non-single port memory engine interpret the test instructions to test the one or more single port memories and the one or more non-single port memories.
摘要:
A receiver for demodulating a pulse width modulated (“PWM”) signal, comprises: a voltage level shifter for shifting the PWM signal to predefined transistor voltage levels; a half-rate PWM decoder for receiving the shifted PWM signal; and a 2-bit-to-N-bit deserializer. The half-rate PWM decoder comprises a first decoder core, a second decoder core, a controller, and a sampler and retiming circuit. The first decoder core and the second decoder core are configured to decode alternating periods of the shifted PWM signal. The controller is coupled to the first decoder core, the second decoder core, the sampler and retiming circuit. The retiming circuit is configured to receive clock signals from the controller and to output half-rate even data from the first decoder core and half-rate odd data from the second decoder core. Outputs of the retiming circuit and an output of the controller are coupled to inputs of the deserializer.
摘要:
Temperature sensors for integrated circuits that use back-gate bias for low power operation. A temperature sensor can comprise a voltage-gate-source generator having sensing transistors; an Ibias generator; a back-gate bias generator; and a temperature read-out circuit. In a calibration mode, the temperature sensor determines a back-gate bias voltage and a resistor trimming code to be used during functional operation.
摘要:
A digital voltmeter, where a number of clock pulses for a first ramp voltage to reach an input voltage is determined. Next, a number of clock pulses for a second ramp voltage to reach the input voltage is determined. One of the first and the second ramp voltages having a least number of clock pulses to reach the input voltage is determined. A determination is made for a number of clock pulses for the determined one of the first and the second ramp voltages to reach a reference voltage. A digital code is generated for the input voltage based on the determined number of clock pulses for reaching the reference voltage and the determined least number of clock pulses for reaching the input voltage.
摘要:
A master-slave delay locked loop system comprises a master delay locked loop (“MDLL”) and at least one slave delay locked loop (“SDLL”). The MDLL generates one or more biases. Each of the at least one SDLL has a slave calibration unit and slave delay elements. The slave calibration unit calibrates the slave delay elements using a slave calibration loop and the generated one or more bias. Thus, each of the SDLL is calibrated to account for any electrical noise, pressure, voltage, and temperature variations that the respective SDLL experiences.