PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    1.
    发明申请
    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE 有权
    图案形成方法,抗紫外线敏感性或辐射敏感性树脂组合物,电阻膜,制造电子器件的方法和电子器件

    公开(公告)号:US20140248556A1

    公开(公告)日:2014-09-04

    申请号:US14280128

    申请日:2014-05-16

    Abstract: A pattern forming method including: (i) forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (A) having a repeating unit having a group generating a polar group upon being decomposed by the action of an acid, and a repeating unit having an aromatic group, a compound (B) generating an acid upon irradiation with actinic rays or radiation, and a solvent (C); (ii) exposing the film; and (iii) developing the exposed film using a developer including an organic solvent to form a negative tone pattern, wherein the resin (A) is a resin having a repeating unit having a naphthyl group, and the like, and/or the actinic ray-sensitive or radiation-sensitive resin composition contains a compound (D) having a naphthalene ring, and the like.

    Abstract translation: 一种图案形成方法,包括:(i)使用含有具有通过酸的作用分解产生极性基团的重复单元的树脂(A)的光化射线敏感性或辐射敏感性树脂组合物形成膜 和具有芳基的重复单元,在用光化射线或辐射照射时产生酸的化合物(B)和溶剂(C); (ii)曝光胶片; 和(iii)使用包含有机溶剂的显影剂显影曝光的膜以形成负色调图案,其中树脂(A)是具有萘基的重复单元的树脂等,和/或光化射线 敏感性或辐射敏感性树脂组合物含有具有萘环的化合物(D)等。

    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION FOR ORGANIC SOLVENT DEVELOPMENT USED THEREFOR AND METHOD OF MANUFACTURING THE SAME, METHOD OF MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    4.
    发明申请
    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION FOR ORGANIC SOLVENT DEVELOPMENT USED THEREFOR AND METHOD OF MANUFACTURING THE SAME, METHOD OF MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE 审中-公开
    图案形成方法,用于其有机溶剂开发的丙烯酸敏感或辐射敏感性树脂组合物及其制造方法,制造电子设备的方法和电子设备

    公开(公告)号:US20160004156A1

    公开(公告)日:2016-01-07

    申请号:US14853119

    申请日:2015-09-14

    Abstract: There is provided a pattern forming method including: (1) filtering, by using a filter, a resin solution containing (A) a resin capable of increasing its polarity by an action of an acid to decrease solubility in a developer including an organic solvent, and (C1) a solvent; (2) preparing an actinic ray-sensitive or radiation-sensitive resin composition containing the resin (A) obtained from the filtrating (1) and a solvent (C2) different from the solvent (C1); (3) filtering the actinic ray-sensitive or radiation-sensitive resin composition by using a filter; (4) forming a film by using a filtrate obtained by the filtering (3); (5) exposing the film; and (6) performing development using a developer containing an organic solvent to form a negative pattern, wherein an absolute value of the difference between solubility parameter (SPC1) of the solvent (C1) and solubility parameter (SPDEV) of the developer (C1), |SPC1−SPDEV|, is 1.00 (cal/cm3)1/2 or less.

    Abstract translation: 提供了一种图案形成方法,包括:(1)通过使用过滤器过滤包含(A)能够通过酸的作用增加其极性的树脂的树脂溶液,以降低在包含有机溶剂的显影剂中的溶解度, 和(C1)溶剂; (2)制备含有从过滤(1)得到的树脂(A)和不同于溶剂(C1)的溶剂(C2))的光化射线敏感或辐射敏感性树脂组合物; (3)使用过滤器过滤光化学敏感或辐射敏感性树脂组合物; (4)通过使用通过过滤(3)获得的滤液形成膜; (5)曝光胶片; 和(6)使用包含有机溶剂的显影剂进行显影以形成负图案,其中溶剂(C1)的溶解度参数(SPC1)与显影剂(C1)的溶解度参数(SPDEV)之间的差异的绝对值 SPC1-SPDEV |为1.00(cal / cm3)1/2以下。

    PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM
    10.
    发明申请
    PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM 有权
    图案形成方法,化学放大电阻组合物和电阻膜

    公开(公告)号:US20130045365A1

    公开(公告)日:2013-02-21

    申请号:US13656960

    申请日:2012-10-22

    Abstract: A pattern forming method comprising: (i) a step of forming a film from a chemical amplification resist composition, (ii) a step of exposing the film, and (iii) a step of developing the exposed film by using an organic solvent-containing developer, wherein the resist composition contains: (A) a resin, (B) a nonionic compound capable of generating an acid upon irradiation with an actinic ray or radiation, (C) a crosslinking agent, and (D) a solvent.

    Abstract translation: 一种图案形成方法,包括:(i)从化学放大抗蚀剂组合物形成膜的步骤,(ii)曝光所述膜的步骤,和(iii)通过使用含有机溶剂的显影膜的步骤 显影剂,其中抗蚀剂组合物包含:(A)树脂,(B)在用光化射线或辐射照射时能够产生酸的非离子化合物,(C)交联剂和(D)溶剂。

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