摘要:
A delay-locked loop includes a phase detector, a delay line, and a filter unit. The phase detector compares the phase of the external clock signal with that of the feedback clock signal and outputs a phase difference as an error control signal. The delay line includes delay cells having various unit time delays. The number of delay cells is adjusted in response to a shift signal. The delay line receives the external clock signal and outputs an output clock signal. The filter unit generates the shift signal in response to the error control signal. In the delay-locked loop, the front delay cells, which compensate for a delay of an external clock signal having a high frequency, have short unit time delays. The rear delay cells, which compensate for a delay of the external clock signal having a low frequency, have long unit time delays.
摘要:
A time delay compensation circuit comprises delay cells having various unit time delays. A delay-locked loop, a type of the time delay compensation circuit, includes a phase detector, a delay line, and a filter unit. The phase detector compares the phase of the external clock signal with that of the feedback clock signal and outputs a phase difference as an error control signal. The delay line includes a plurality of delay cells having various unit time delays. The number of delay cells is adjusted in response to a predetermined shift signal. The delay line receives the external clock signal and outputs an output clock signal, which is obtained by controlling the phase of the external clock signal. The filter unit generates the shift signal, which selects the number of delay cells in the delay line, in response to the error control signal. In the time delay compensation circuit, the front delay cells, which are used to compensate for a delay of an external clock signal having a high frequency, have short unit time delays so as to reduce jitter due to quantization error. Also, the rear delay cells, which are used to compensate for a delay of the external clock signal having a low frequency, have long unit time delays so as to reduce the number of delay cells required for the delay compensation.
摘要:
A semiconductor memory device and method of operating same are described. The semiconductor memory device includes a first anti-fuse array having a plurality of first anti-fuse elements that store first fuse data, a second anti-fuse array having a plurality of second anti-fuse elements that store error correction code (ECC) data associated with the first fuse data, and an ECC decoder configured to generate second fuse data by correcting the first fuse data using the ECC data.
摘要:
A repair circuit and related method of repair are disclosed. In the repair circuit, row repair or column repair control units are selectively actuated to perform respective repair functions within a semiconductor memory device in relation to a commonly provided defective address. Both post-package defects and/or before package defects may be repaired in response to the defective address.
摘要:
We describe and claim an internal signal replication device and method. A circuit comprising a selector to select one of a plurality of internally generated clock signals, and a compensation circuit to replicate the selected clock signal from a reference clock signal.
摘要:
A latency control circuit includes a FIFO controller and a register unit. The FIFO controller may generate an increase signal according to an external command, and generate a decrease signal according to an internal command. The FIFO controller may also enable a depth point signal responsive to the increase signal and the decrease signal. The register unit may include n registers. The value n (rounded off) may be obtained by dividing a larger value of a maximum number of additive latencies and a maximum number of write latencies by a column cycle delay time (tCCD). The registers may store an address received with the external command responsive to the increase signal and a clock signal, and may shift either the address or a previous address to a neighboring register. The latency control circuit transmits an address stored in a register as a column address corresponding to the enabled depth point signal.
摘要:
A latency control circuit includes a FIFO controller and a register unit. The FIFO controller may generate an increase signal according to an external command, and generate a decrease signal according to an internal command. The FIFO controller may also enable a depth point signal responsive to the increase signal and the decrease signal. The register unit may include n registers. The value n (rounded off) may be obtained by dividing a larger value of a maximum number of additive latencies and a maximum number of write latencies by a column cycle delay time (tCCD). The registers may store an address received with the external command responsive to the increase signal and a clock signal, and may shift either the address or a previous address to a neighboring register. The latency control circuit transmits an address stored in a register as a column address corresponding to the enabled depth point signal.
摘要:
A delay-locked loop (DLL) is disclosed with a phase detector configured to detect a phase difference between an external clock signal and an internal clock signal, a variable delay line configured to variably delay the external clock signal in relation to the phase difference to generate an intermediate clock signal, a selection unit configured to select between the intermediate clock signal and an inverted version of the intermediate clock signal in relation to an inversion control signal, and to generate an internal clock signal according to the selection, and an inversion determination unit configured to generate the inversion control signal in relation to transition of the external clock signal within a duty error margin.
摘要:
Decoupling capacitance of at least one shared capacitor is distributed among a plurality of voltage sources for enhanced performance with minimized area of a semiconductor device. The high nodes and the low nodes of such voltage sources each comprise at least two distinct nodes for lower noise at the voltage sources. The present invention is applied to particular advantage for coupling a variable number of shared capacitors to a data charge voltage source depending on a bit organization of the semiconductor device.
摘要:
A semiconductor memory device having a memory cell array includes a plurality of first signal lines arranged on the memory cell array in the same direction and a plurality of second signal lines arranged on the memory cell array in a perpendicular direction to the first signal lines. The first signal lines are alternately arranged on at least two layers, and the second signal lines are arranged on a layer where the first signal lines are not arranged.