摘要:
A novel .beta.-amylase gene is provided. This gene is useful for production of a thermophilic .beta.-amylase obtained from Clostridium thermosulfurogenes on a large scale, especially from genetically engineered microorganisms introduced with this gene. B. subtilis was transformed with a plasmid pNK1 containing the above gene and the transformed B. subtilis cells produced .beta.-amylase having the same thermostability as that of .beta.-amylase obtained from C. thermosulfurogenes.
摘要:
An improved vector for expression in Bacillus brevis having:(1) a nucleotide sequence (a) represented by a general formula MNOACP;(2) a nucleotide sequence (b) located in the downstream of the nucleotide sequence (a) and represented by a general formula QRSWXY;(3) a nucleotide sequence (c) located in the downstream of the nucleotide sequence (b) and acting as a binding site to ribosome in the cell of Bacillus brevis;(4) a nucleotide sequence (d) located in the downstream of the nucleotide sequence (c) and acting as a translation initiation condon in the cell of Bacillus brevis; and(5) a gene directly connected with the nucleotide sequence (d) and to express in the cell of Bacillus brevis;wherein M represents G or T; N represents C, T or A; O represents A, C or T; P represents T or G; Q represents T or A; R represents T or A; S represents T, C or A; W represents A or G; X represents A or C; and Y represents T or G; and furthermore, wherein A represents adenine, C cytosine, G guanine and T thymine.
摘要:
A xylose isomerase gene from Thermus bacteria, such as Thermos aquaticus (ATCC 27634) and a gene having 60% or more of homology to the nucleotide sequence of Thermus aquaticus xylose isomerase gene of FIG. 1-3. A xylose isomerase from Thermus aquaticus characterized in that the xylose isomerase has the optimal pH of about 7, the stable pH range of from about 6 to 8.5, the optimal temperature of about 95.degree. C. and the molecular weight of about 44,000, and is stabilized with manganese or magnesium. A process for preparing a xylose isomerase comprising transforming a microorganism with a plasmid containing the above gene and a promoter, culturing the transformed microorganism and harvesting the produced xylose isomerase. A process for preparing fructose comprising isomerization of glucose to fructose in the presence of the above xylose isomerase.
摘要:
A bacterium of the genus Bacillus is transformed by introducing a vector incorporating DNA encoding an antibody; the resulting transformant is cultivated in a medium to produce and accumulate the antibody in an active form in the culture liquid. According to this method, a recombinant antibody can be easily produced in an active form in large amounts, owing to success in secretory expression using a bacterium of the genus Bacillus.
摘要:
One of the E. coli strains of the Clarke and Carbon collection [Cell, 9, 91-99] has been found to contain a plasmid which we have isolated and termed pLC3-13, which contains genetic information coding for prolipoprotein signal peptidase. A 4.3 kb fragment containing this genetic information has been prepared, other plasmids have been prepared containing at least this fragment and strains of E. coli have been transformed thereby.
摘要:
In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.
摘要:
The present invention relates to a semiconductor layer applicable to a hetero-junction bipolar transistor, a forming method thereof, and a semiconductor device and a manufacturing method thereof, for example. The semiconductor layer and the forming method thereof according to the present invention includes a first SiGe film or SiGeC film containing Ge of which the concentration become equal to a thermal expansion coefficient of silicon oxide and a second SiGe film or SiGeC film formed on the first film. In a semiconductor device according to the present invention and a manufacturing method thereof, first and second layers are laminated on an oxide film having an opening, and the first layer has the substantially same thermal expansion coefficient as that of the oxide film and has a thermal expansion coefficient different from that of the second layer. Thus, a stress that is caused by a difference between the thermal expansion coefficients becomes difficult to occur in the laminated film, and hence the occurrence of misfit dislocation can be suppressed. Thus, the present invention is suitable as the application to a hetero-junction bipolar transistor.
摘要:
Correlation formulae having predetermined forms (i.e., straight lines representing relationships between the surface roughness of the reflectance) are determined in advance between measurement values of the ultraviolet reflectance of the surfaces of respective sample epitaxial growth layers obtained by using an ultraviolet spectrophotometer at a wavelength of 200 nm and measured values of the surface roughness of the same samples by using an atomic force microscope. The surface roughness of an ensuing measurement object is determined by measuring only its ultraviolet reflectance and substituting a resulting measurement value into the correlation formulae.
摘要:
In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.
摘要:
In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.