公开(公告)号：US4929559A

公开(公告)日：1990-05-29

申请号：US161414

申请日：1988-02-23

申请人： Shoji Mizushima ,  Hideo Yamagata

发明人： Shoji Mizushima ,  Hideo Yamagata

IPC分类号： C12N15/09 ,  C12N1/00 ,  C12N9/52 ,  C12N15/62 ,  C12R1/19

CPC分类号： C12N9/52 ,  C12N15/625 ,  Y10S435/849

摘要： One of the E. coli strains of the Clarke and Carbon collection [Cell, 9, 91-99] has been found to contain a plasmid which we have isolated and termed pLC3-13, which contains genetic information coding for prolipoprotein signal peptidase. A 4.3 kb fragment containing this genetic information has been prepared, other plasmids have been prepared containing at least this fragment and strains of E. coli have been transformed thereby.

摘要翻译： 已经发现Clarke和Carbon收集的一种大肠杆菌菌株[Cell，9,91-99]含有我们已经分离并命名为pLC3-13的质粒，其含有编码上游蛋白信号肽酶的遗传信息。 已经制备了含有该遗传信息的4.3kb片段，至少含有该片段的其他质粒已被制备，并且已经转化了大肠杆菌菌株。

公开(公告)号：US5082781A

公开(公告)日：1992-01-21

申请号：US611480

申请日：1990-11-09

申请人： Hideo Yamagata ,  Noriyuki Kitamoto ,  Takeo Kato ,  Norihiro Tsukagoshi ,  Shigezo Udaka

发明人： Hideo Yamagata ,  Noriyuki Kitamoto ,  Takeo Kato ,  Norihiro Tsukagoshi ,  Shigezo Udaka

IPC分类号： C12N1/21 ,  C12N9/26 ,  C12N15/00 ,  C12N15/09 ,  C12N15/56 ,  C12R1/145

CPC分类号： C12N9/2425

摘要： A novel .beta.-amylase gene is provided. This gene is useful for production of a thermophilic .beta.-amylase obtained from Clostridium thermosulfurogenes on a large scale, especially from genetically engineered microorganisms introduced with this gene. B. subtilis was transformed with a plasmid pNK1 containing the above gene and the transformed B. subtilis cells produced .beta.-amylase having the same thermostability as that of .beta.-amylase obtained from C. thermosulfurogenes.

公开(公告)号：US07507642B2

公开(公告)日：2009-03-24

申请号：US11747575

申请日：2007-05-11

申请人： Hideo Yamagata ,  Takeyoshi Koumoto ,  Kenji Atsuumi ,  Yoichi Negoro ,  Tatsushiro Hirata ,  Takashi Noguchi

发明人： Hideo Yamagata ,  Takeyoshi Koumoto ,  Kenji Atsuumi ,  Yoichi Negoro ,  Tatsushiro Hirata ,  Takashi Noguchi

IPC分类号： H01L21/322 ,  H01L21/22 ,  H01L21/38

CPC分类号： H01L21/02505 ,  C30B25/02 ,  C30B29/52 ,  H01L21/02381 ,  H01L21/0245 ,  H01L21/02488 ,  H01L21/02502 ,  H01L21/0251 ,  H01L21/02532 ,  H01L21/0262 ,  H01L21/02636 ,  H01L29/66242

摘要： In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.

摘要翻译： 在半导体基板上沉积硅 - 锗混晶层的气相生长方法中，气相生长方法包括将硅原料气体引入反应炉的第一步骤，即将硅 原料气体分压与时间成比例地增加，从而在半导体衬底上沉积硅层的第一半导体层减压，第二步是将硅原料气体和锗原料气体引入反应炉中 可以获得期望的锗浓度，从而在减压下在第一半导体层上沉积硅 - 锗混合晶体层的第二半导体层，并且在减压下将硅原料气体引入反应炉中的第三步骤 从而在第二半导体层上沉积硅层的第三半导体层。 因此，可以获得其中可以提高失配位错的半导体层。

公开(公告)号：US07060582B2

公开(公告)日：2006-06-13

申请号：US10480061

申请日：2002-06-04

申请人： Takeyoshi Koumoto ,  Hideo Yamagata

发明人： Takeyoshi Koumoto ,  Hideo Yamagata

IPC分类号： H01L21/331

CPC分类号： H01L29/66242 ,  H01L29/7378 ,  Y10S438/933 ,  Y10S438/938

摘要： The present invention relates to a semiconductor layer applicable to a hetero-junction bipolar transistor, a forming method thereof, and a semiconductor device and a manufacturing method thereof, for example. The semiconductor layer and the forming method thereof according to the present invention includes a first SiGe film or SiGeC film containing Ge of which the concentration become equal to a thermal expansion coefficient of silicon oxide and a second SiGe film or SiGeC film formed on the first film. In a semiconductor device according to the present invention and a manufacturing method thereof, first and second layers are laminated on an oxide film having an opening, and the first layer has the substantially same thermal expansion coefficient as that of the oxide film and has a thermal expansion coefficient different from that of the second layer. Thus, a stress that is caused by a difference between the thermal expansion coefficients becomes difficult to occur in the laminated film, and hence the occurrence of misfit dislocation can be suppressed. Thus, the present invention is suitable as the application to a hetero-junction bipolar transistor.

摘要翻译： 本发明涉及例如可应用于异质结双极晶体管的半导体层及其形成方法以及半导体器件及其制造方法。 根据本发明的半导体层及其形成方法包括含有Ge的第一SiGe膜或SiGeC膜，其浓度变得等于氧化硅的热膨胀系数，以及形成在第一膜上的第二SiGe膜或SiGeC膜 。 在根据本发明的半导体器件及其制造方法中，第一层和第二层层叠在具有开口的氧化物膜上，并且第一层具有与氧化膜大致相同的热膨胀系数，并且具有热 膨胀系数与第二层不同。 因此，难以在层压膜中产生由热膨胀系数之差引起的应力，因此能够抑制失配位错的发生。 因此，本发明适用于异质结双极晶体管。

公开(公告)号：US06284552B1

公开(公告)日：2001-09-04

申请号：US09190461

申请日：1998-11-13

申请人： Hideo Yamagata ,  Takashi Noguchi ,  Satoshi Hashidume

发明人： Hideo Yamagata ,  Takashi Noguchi ,  Satoshi Hashidume

IPC分类号： H01L2166

CPC分类号： G01N21/33 ,  H01L22/12 ,  Y10S438/964

摘要： Correlation formulae having predetermined forms (i.e., straight lines representing relationships between the surface roughness of the reflectance) are determined in advance between measurement values of the ultraviolet reflectance of the surfaces of respective sample epitaxial growth layers obtained by using an ultraviolet spectrophotometer at a wavelength of 200 nm and measured values of the surface roughness of the same samples by using an atomic force microscope. The surface roughness of an ensuing measurement object is determined by measuring only its ultraviolet reflectance and substituting a resulting measurement value into the correlation formulae.

摘要翻译： 具有预定形式的相关公式（即，表示反射率的表面粗糙度之间的关系的直线）预先在通过使用紫外分光光度计获得的各个样品外延生长层的表面的紫外反射率的测量值之间确定波长 通过使用原子力显微镜测量相同样品的表面粗糙度的测量值。 通过仅测量其紫外反射率并将所得到的测量值代入相关公式来确定随后的测量对象的表面粗糙度。

公开(公告)号：US4994380A

公开(公告)日：1991-02-19

申请号：US928125

申请日：1986-11-07

申请人： Shigezo Udaka ,  Norihiro Tsukagoshi ,  Hideo Yamagata

发明人： Shigezo Udaka ,  Norihiro Tsukagoshi ,  Hideo Yamagata

IPC分类号： C12N15/09 ,  C12N1/21 ,  C12N9/28 ,  C12N15/00 ,  C12N15/75 ,  C12P21/00 ,  C12P21/02 ,  C12R1/08

CPC分类号： C12N9/2417 ,  C12N15/75 ,  Y10S435/833

摘要： An improved vector for expression in Bacillus brevis having:(1) a nucleotide sequence (a) represented by a general formula MNOACP;(2) a nucleotide sequence (b) located in the downstream of the nucleotide sequence (a) and represented by a general formula QRSWXY;(3) a nucleotide sequence (c) located in the downstream of the nucleotide sequence (b) and acting as a binding site to ribosome in the cell of Bacillus brevis;(4) a nucleotide sequence (d) located in the downstream of the nucleotide sequence (c) and acting as a translation initiation condon in the cell of Bacillus brevis; and(5) a gene directly connected with the nucleotide sequence (d) and to express in the cell of Bacillus brevis;wherein M represents G or T; N represents C, T or A; O represents A, C or T; P represents T or G; Q represents T or A; R represents T or A; S represents T, C or A; W represents A or G; X represents A or C; and Y represents T or G; and furthermore, wherein A represents adenine, C cytosine, G guanine and T thymine.

摘要翻译： 一种用于在短芽孢杆菌中表达的改良载体，其具有：（1）由通式MNOACP表示的核苷酸序列（a） （2）位于核苷酸序列（a）的下游并由通式QRSWXY表示的核苷酸序列（b）; （3）位于核苷酸序列（b）下游的核苷酸序列（c），并且作为芽孢杆菌细胞中核糖体的结合位点; （4）位于核苷酸序列（c）下游的核苷酸序列（d），并在短芽孢杆菌细胞中作为翻译起始细菌; 和（5）与核苷酸序列（d）直接连接并在短芽孢杆菌细胞中表达的基因; 其中M表示G或T; N表示C，T或A; O表示A，C或T; P表示T或G; Q表示T或A; R表示T或A; S表示T，C或A; W代表A或G; X表示A或C; Y表示T或G; 此外，其中A表示腺嘌呤，C胞嘧啶，G鸟嘌呤和T胸腺嘧啶。

公开(公告)号：US07303979B2

公开(公告)日：2007-12-04

申请号：US10818821

申请日：2004-04-06

申请人： Hideo Yamagata ,  Takeyoshi Koumoto ,  Kenji Atsuumi ,  Yoichi Negoro ,  Tatsushiro Hirata ,  Takashi Noguchi

发明人： Hideo Yamagata ,  Takeyoshi Koumoto ,  Kenji Atsuumi ,  Yoichi Negoro ,  Tatsushiro Hirata ,  Takashi Noguchi

IPC分类号： H01L21/322

CPC分类号： H01L21/02505 ,  C30B25/02 ,  C30B29/52 ,  H01L21/02381 ,  H01L21/0245 ,  H01L21/02488 ,  H01L21/02502 ,  H01L21/0251 ,  H01L21/02532 ,  H01L21/0262 ,  H01L21/02636 ,  H01L29/66242

摘要： In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.

摘要翻译： 在半导体基板上沉积硅 - 锗混晶层的气相生长方法中，气相生长方法包括将硅原料气体引入反应炉的第一步骤，即将硅 原料气体分压与时间成比例地增加，从而在半导体衬底上沉积硅层的第一半导体层减压，第二步是将硅原料气体和锗原料气体引入反应炉中 可以获得期望的锗浓度，从而在减压下在第一半导体层上沉积硅 - 锗混合晶体层的第二半导体层，并且在减压下将硅原料气体引入反应炉中的第三步骤 从而在第二半导体层上沉积硅层的第三半导体层。 因此，可以获得其中可以提高失配位错的半导体层。

公开(公告)号：US07157344B2

公开(公告)日：2007-01-02

申请号：US10204386

申请日：2001-12-20

申请人： Hideo Yamagata ,  Takeyoshi Koumoto ,  Kenji Atsuumi ,  Yoichi Negoro ,  Tatsushiro Hirata ,  Takashi Noguchi

发明人： Hideo Yamagata ,  Takeyoshi Koumoto ,  Kenji Atsuumi ,  Yoichi Negoro ,  Tatsushiro Hirata ,  Takashi Noguchi

IPC分类号： H01L21/331

CPC分类号： H01L21/02505 ,  C30B25/02 ,  C30B29/52 ,  H01L21/02381 ,  H01L21/0245 ,  H01L21/02488 ,  H01L21/02502 ,  H01L21/0251 ,  H01L21/02532 ,  H01L21/0262 ,  H01L21/02636 ,  H01L29/66242

摘要： In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.

公开(公告)号：US20060163625A1

公开(公告)日：2006-07-27

申请号：US11341578

申请日：2006-01-26

申请人： Takeyoshi Koumoto ,  Hideo Yamagata

发明人： Takeyoshi Koumoto ,  Hideo Yamagata

IPC分类号： H01L29/76 ,  H01L21/331

CPC分类号： H01L29/66242 ,  H01L29/7378 ,  Y10S438/933 ,  Y10S438/938

摘要： The present invention relates to a semiconductor layer applicable to a hetero-junction bipolar transistor, a forming method thereof, and a semiconductor device and a manufacturing method thereof, for example. The semiconductor layer and the forming method thereof according to the present invention includes a first SiGe film or SiGeC film containing Ge of which the concentration become equal to a thermal expansion coefficient of silicon oxide and a second SiGe film or SiGeC film formed on the first film. In a semiconductor device according to the present invention and a manufacturing method thereof, first and second layers are laminated on an oxide film having an opening, and the first layer has the substantially same thermal expansion coefficient as that of the oxide film and has a thermal expansion coefficient different from that of the second layer. Thus, a stress that is caused by a difference between the thermal expansion coefficients becomes difficult to occur in the laminated film, and hence the occurrence of misfit dislocation can be suppressed. Thus, the present invention is suitable as the application to a hetero-junction bipolar transistor.

摘要翻译： 本发明涉及例如可应用于异质结双极晶体管的半导体层及其形成方法以及半导体器件及其制造方法。 根据本发明的半导体层及其形成方法包括含有Ge的第一SiGe膜或SiGeC膜，其浓度变得等于氧化硅的热膨胀系数，以及形成在第一膜上的第二SiGe膜或SiGeC膜 。 在根据本发明的半导体器件及其制造方法中，第一层和第二层层叠在具有开口的氧化物膜上，并且第一层具有与氧化膜大致相同的热膨胀系数，并且具有热 膨胀系数与第二层不同。 因此，难以在层压膜中产生由热膨胀系数之差引起的应力，因此能够抑制失配位错的发生。 因此，本发明适用于异质结双极晶体管。

公开(公告)号：US5665570A

公开(公告)日：1997-09-09

申请号：US384545

申请日：1995-02-07

申请人： Hideo Yamagata ,  Shigezo Udaka ,  Yasushi Inoue ,  Hiroko Tada ,  Susumu Iwasa

发明人： Hideo Yamagata ,  Shigezo Udaka ,  Yasushi Inoue ,  Hiroko Tada ,  Susumu Iwasa

IPC分类号： C07K16/00 ,  C07K16/18 ,  C07K16/40 ,  C12N15/13 ,  C12N15/75 ,  C12P21/08 ,  C07H21/04 ,  C12N1/20

CPC分类号： C12N15/75 ,  C07K16/00 ,  C07K16/18 ,  C07K16/40 ,  C07K2319/00

摘要： A bacterium of the genus Bacillus is transformed by introducing a vector incorporating DNA encoding an antibody; the resulting transformant is cultivated in a medium to produce and accumulate the antibody in an active form in the culture liquid. According to this method, a recombinant antibody can be easily produced in an active form in large amounts, owing to success in secretory expression using a bacterium of the genus Bacillus.

摘要翻译： 通过引入含有编码抗体的DNA的载体来转化芽孢杆菌属的细菌; 将所得转化体在培养基中培养，以活性形式产生并积累培养液中的抗体。 根据该方法，由于使用芽孢杆菌属的细菌的分泌表达的成功，重组抗体可以大量容易地以活性形式产生。