SEMICONDUCTOR MEMORY DEVICE
    1.
    发明公开

    公开(公告)号:US20240071478A1

    公开(公告)日:2024-02-29

    申请号:US18504018

    申请日:2023-11-07

    CPC classification number: G11C11/4096 G11C5/063 G11C11/4072 G11C11/4076

    Abstract: A semiconductor memory device comprises a first memory cell and a second memory cell. The semiconductor memory device is configured to be able to perform: a first operation which is a read operation or the like to the first memory cell; and a second operation which is a read operation or the like to the second memory cell. The semiconductor memory device transitions to a standby mode after performing the first operation in response to an input of a first command set and a second command set. The semiconductor memory device performs a charge share operation after the standby mode is released in response to an input of a third command set and a fourth command set during the standby mode. The semiconductor memory device performs the second operation using at least a part of an electric charge generated when the first operation is performed.

    SEMICONDUCTOR DEVICE
    3.
    发明申请

    公开(公告)号:US20220223611A1

    公开(公告)日:2022-07-14

    申请号:US17369453

    申请日:2021-07-07

    Abstract: A semiconductor device has a first conductivity type semiconductor substrate. A second conductivity type first impurity diffusion layer is disposed in a surface region of the semiconductor substrate. A resistance element is configured with a first conductivity type second impurity diffusion layer disposed in the first impurity diffusion layer in the surface region of the semiconductor substrate. In a transistor, a gate is connected to an input portion of the resistance element, a source is connected to the first impurity diffusion layer, and a drain is connected to a voltage source higher than the voltage of the input portion. A current source is connected to the source.

    SEMICONDUCTOR STORAGE DEVICE
    4.
    发明申请

    公开(公告)号:US20220238167A1

    公开(公告)日:2022-07-28

    申请号:US17461848

    申请日:2021-08-30

    Abstract: A semiconductor storage device includes a memory cell array and a voltage generation circuit configured to supply voltages of different levels to the memory cell array. The voltage generation circuit includes a first charge pump having a first characteristic and a second charge pump having a second characteristic that is substantially different from the first characteristic, and is controlled to electrically disconnect an output end of the first charge pump and an input end of the second charge pump in a first operation during which a first voltage is supplied to the memory cell array, and to electrically connect the output end of the first charge pump and the input end of the second charge pump in a second operation during which a second voltage higher than the first voltage is supplied to the memory cell array.

    SEMICONDUCTOR DEVICE
    5.
    发明申请

    公开(公告)号:US20220076734A1

    公开(公告)日:2022-03-10

    申请号:US17184123

    申请日:2021-02-24

    Inventor: Yoshinao SUZUKI

    Abstract: A semiconductor device includes a first pad, a comparison circuit, and a control circuit. A first voltage may be applicable to the first pad. The comparison circuit may include a first input terminal connected to the first pad, a second input terminal to which a second voltage is applicable, and an output terminal configured to output a comparison result between the first voltage and the second voltage. The control circuit may be configured to output, external to the semiconductor device, a signal based on the comparison result.

    SEMICONDUCTOR DEVICE
    7.
    发明公开

    公开(公告)号:US20240233835A1

    公开(公告)日:2024-07-11

    申请号:US18408680

    申请日:2024-01-10

    CPC classification number: G11C16/30 G11C16/0483 H02M3/07 G11C16/26

    Abstract: A semiconductor device includes a regulator circuit, a charge pump circuit, and a control circuit. The regulator circuit is configured to regulate a voltage input from outside and output a regulated voltage. The charge pump circuit is configured to receive the regulated voltage as an input voltage, boost the input voltage, and output a boosted voltage. The control circuit is configured to cause the regulator circuit to vary a voltage level of the regulated voltage based on voltage value information about the voltage input from the outside.

    SEMICONDUCTOR STORAGE DEVICE AND MEMORY SYSTEM

    公开(公告)号:US20230062829A1

    公开(公告)日:2023-03-02

    申请号:US17665391

    申请日:2022-02-04

    Inventor: Yoshinao SUZUKI

    Abstract: A semiconductor storage device includes a first memory chip having a first memory cell, a first word line connected to the first memory cell, a first voltage step-up circuit, and a second voltage step-up circuit, and a second memory chip having a second memory cell, a second word line connected to the second memory cell, a third voltage step-up circuit, and a fourth voltage step-up circuit. During a read operation executed in the first memory chip, the first, second, and fourth voltage step-up circuits supply a first voltage to the first word line, and when a voltage of the first word line reaches a predetermined voltage, the first voltage step-up circuit continues to supply the first voltage to the first word line, and the second voltage step-up circuit and the fourth voltage step-up circuit stop supplying the first voltage to the first word line.

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