SENSE AMPLIFIER FOR MEMORY DEVICE

    公开(公告)号:US20170301378A1

    公开(公告)日:2017-10-19

    申请号:US15363270

    申请日:2016-11-29

    CPC classification number: G11C7/065 G11C5/14 G11C7/08 G11C8/10

    Abstract: A read-amplifier circuit includes a core with a first input and a second input that are intended to receive in a measurement phase a differential signal arising from a first bit line and from a second bit line of the memory device. The circuit also includes a memory element with two inverters coupled in a crossed manner. The first and second inputs are respectively connected to two of the power supply nodes of the inverters via two transfer capacitors. A first controllable circuit is configured to temporarily render the memory element floating during an initial phase preceding the measurement phase and during the measurement phase.

    Sense amplifier for memory device

    公开(公告)号:US09792962B1

    公开(公告)日:2017-10-17

    申请号:US15363270

    申请日:2016-11-29

    CPC classification number: G11C7/065 G11C5/14 G11C7/08 G11C8/10

    Abstract: A read-amplifier circuit includes a core with a first input and a second input that are intended to receive in a measurement phase a differential signal arising from a first bit line and from a second bit line of the memory device. The circuit also includes a memory element with two inverters coupled in a crossed manner. The first and second inputs are respectively connected to two of the power supply nodes of the inverters via two transfer capacitors. A first controllable circuit is configured to temporarily render the memory element floating during an initial phase preceding the measurement phase and during the measurement phase.

    Sense amplifier
    3.
    发明授权

    公开(公告)号:US09997213B2

    公开(公告)日:2018-06-12

    申请号:US15657408

    申请日:2017-07-24

    CPC classification number: G11C7/065 G11C5/14 G11C7/08 G11C8/10

    Abstract: A read-amplifier circuit includes a core with a first input and a second input that are intended to receive in a measurement phase a differential signal arising from a first bit line and from a second bit line of the memory device. The circuit also includes a memory element with two inverters coupled in a crossed manner. The first and second inputs are respectively connected to two of the power supply nodes of the inverters via two transfer capacitors. A first controllable circuit is configured to temporarily render the memory element floating during an initial phase preceding the measurement phase and during the measurement phase.

    SENSE AMPLIFIER
    4.
    发明申请
    SENSE AMPLIFIER 审中-公开

    公开(公告)号:US20170323670A1

    公开(公告)日:2017-11-09

    申请号:US15657408

    申请日:2017-07-24

    CPC classification number: G11C7/065 G11C5/14 G11C7/08 G11C8/10

    Abstract: A read-amplifier circuit includes a core with a first input and a second input that are intended to receive in a measurement phase a differential signal arising from a first bit line and from a second bit line of the memory device. The circuit also includes a memory element with two inverters coupled in a crossed manner. The first and second inputs are respectively connected to two of the power supply nodes of the inverters via two transfer capacitors. A first controllable circuit is configured to temporarily render the memory element floating during an initial phase preceding the measurement phase and during the measurement phase.

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