公开(公告)号：US20140159800A1

公开(公告)日：2014-06-12

申请号：US14103171

申请日：2013-12-11

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Jose Luis Flores ,  Anthony Martin Hill ,  Francisco Adolfo Cano

IPC: H03K19/00

CPC classification number: H03K19/0016 ,  G01R31/31725 ,  G01R31/31727 ,  G06F1/206 ,  G06F1/324 ,  G06F1/3296 ,  Y02D10/126 ,  Y02D10/172

Abstract: A method of adaptive voltage scaling is shown incorporating a lookup table holding manufacturing characterization data in conjunction with one or more precision analog temperature sensors used for correcting for temperature effects.

Abstract translation: 示出了一种自适应电压缩放的方法，其结合了用于校正温度效应的一个或多个精密模拟温度传感器，其结合了查找表，其保存制造表征数据。

公开(公告)号：US08890588B2

公开(公告)日：2014-11-18

申请号：US13852326

申请日：2013-03-28

Applicant: Texas Instruments Incorporated

Inventor： Kalpesh Amrutlal Shah ,  Arvind Kumar ,  Francisco Adolfo Cano

IPC: H03L7/00 ,  H03L7/24

CPC classification number: G06F1/24 ,  G06F1/04 ,  G06F1/06

Abstract: In an embodiment, a circuit configured for asymmetric ageing prevention in an integrated circuit (IC) comprises a primary clock configured to generate a primary clock signal, a secondary clock configured to generate a secondary clock signal, a state determination circuit, and a control circuit. The state determination circuit is configured to determine a current operating state associated with at least one of a primary clock condition and a power-on-reset condition in the IC. The control circuit is configured to generate a control signal in response to a determination of an first operating state. The control signal is configured to facilitate a transition from the primary clock to the secondary clock upon determination of the first operating state, and a transition from a safe operating mode to a normal operating mode upon determination of a second operating state. The secondary clock is associated with a safe operating mode of the IC.

Abstract translation: 在一个实施例中，在集成电路（IC）中配置用于非对称衰减防止的电路包括主时钟，其被配置为产生主时钟信号，辅时钟被配置为产生辅时钟信号，状态确定电路和控制电路 。 状态确定电路被配置为确定与IC中的主时钟条件和上电复位状态中的至少一个相关联的当前工作状态。 控制电路被配置为响应于第一操作状态的确定而产生控制信号。 控制信号被配置为在确定第一操作状态时促进从主时钟到次时钟的转换，以及在确定第二操作状态时从安全操作模式转换到正常操作模式。 次级时钟与IC的安全工作模式相关联。

公开(公告)号：US11881275B2

公开(公告)日：2024-01-23

申请号：US18148312

申请日：2022-12-29

Applicant: Texas Instruments Incorporated

Inventor： Francisco Adolfo Cano ,  Devanathan Varadarajan ,  Anthony Martin Hill

IPC: G11C29/00 ,  G11C29/38 ,  G11C29/50 ,  G11C11/419 ,  G11C11/418 ,  G11C11/412

CPC classification number: G11C29/38 ,  G11C11/412 ,  G11C11/418 ,  G11C11/419 ,  G11C29/50004 ,  G11C2029/5004

Abstract: Systems of screening memory cells of a memory include modulating bitline and/or wordline voltage. In a read operation, the wordline may be overdriven or underdriven with respect to a nominal operating voltage on the wordline. In a write operation, one or both of the bitline and wordline may be overdriven or underdriven with respect to corresponding a nominal operating voltage. Such a system has margin control circuity, which may be in the form of bitline and wordline margin controls, to modulate bitline and wordline voltages, respectively, in the memory cells of the memory array.

公开(公告)号：US12301229B2

公开(公告)日：2025-05-13

申请号：US16369360

申请日：2019-03-29

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Jose Luis Flores ,  Anthony Martin Hill ,  Francisco Adolfo Cano

IPC: G06F1/324 ,  G01R31/317 ,  G06F1/20 ,  G06F1/3296 ,  H03K19/00

Abstract: An adaptive voltage scaling technique includes using a temperature sensor arranged on a semiconductor die to determine a current die temperature of the semiconductor die, using a performance sensor arranged on a semiconductor die to determine a current performance metric of the semiconductor die, determining whether the current performance metric matches an expected performance metric based at least partially on the current die temperature and, if the current performance metric does not match the expected performance metric, indicate a performance sensor error, when a performance sensor error is indicated, determining an updated power supply voltage for correcting the performance sensor error, and causing a current power supply voltage supplied by a power supply voltage source of the semiconductor die to be changed to the updated power supply voltage.

公开(公告)号：US11568951B2

公开(公告)日：2023-01-31

申请号：US16817096

申请日：2020-03-12

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Francisco Adolfo Cano ,  Devanathan Varadarajan ,  Anthony Martin Hill

IPC: G11C29/00 ,  G11C29/38 ,  G11C29/50 ,  G11C11/419 ,  G11C11/418 ,  G11C11/412

Abstract: Systems and methods of screening memory cells by modulating bitline and/or wordline voltage. In a read operation, the wordline may be overdriven or underdriven as compared to a nominal operating voltage on the wordline. In a write operation, the one or both of the bitline and wordline may be overdriven or underdriven as compared to a nominal operating voltage of each. A built-in self test (BIST) system for screening a memory array has bitline and wordline margin controls to modulate bitline and wordline voltage, respectively, in the memory array.

公开(公告)号：US20190229732A1

公开(公告)日：2019-07-25

申请号：US16369360

申请日：2019-03-29

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Jose Luis Flores ,  Anthony Martin Hill ,  Francisco Adolfo Cano

IPC: H03K19/00 ,  G06F1/20 ,  G01R31/317 ,  G06F1/3296 ,  G06F1/324

Abstract: An adaptive voltage scaling technique includes using a temperature sensor arranged on a semiconductor die to determine a current die temperature of the semiconductor die, using a performance sensor arranged on a semiconductor die to determine a current performance metric of the semiconductor die, determining whether the current performance metric matches an expected performance metric based at least partially on the current die temperature and, if the current performance metric does not match the expected performance metric, indicate a performance sensor error, when a performance sensor error is indicated, determining an updated power supply voltage for correcting the performance sensor error, and causing a current power supply voltage supplied by a power supply voltage source of the semiconductor die to be changed to the updated power supply voltage.

公开(公告)号：US20140292383A1

公开(公告)日：2014-10-02

申请号：US13852326

申请日：2013-03-28

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Kalpesh Amrutlal Shah ,  Arvind Kumar ,  Francisco Adolfo Cano

IPC: H03L7/24

CPC classification number: G06F1/24 ,  G06F1/04 ,  G06F1/06

Abstract: In an embodiment, a circuit configured for asymmetric ageing prevention in an integrated circuit (IC) comprises a primary clock configured to generate a primary clock signal, a secondary clock configured to generate a secondary clock signal, a state determination circuit, and a control circuit. The state determination circuit is configured to determine a current operating state associated with at least one of a primary clock condition and a power-on-reset condition in the IC. The control circuit is configured to generate a control signal in response to a determination of an first operating state. The control signal is configured to facilitate a transition from the primary clock to the secondary clock upon determination of the first operating state, and a transition from a safe operating mode to a normal operating mode upon determination of a second operating state. The secondary clock is associated with a safe operating mode of the IC.

Abstract translation: 在一个实施例中，在集成电路（IC）中配置用于非对称衰减防止的电路包括主时钟，其被配置为产生主时钟信号，辅时钟被配置为产生辅时钟信号，状态确定电路和控制电路 。 状态确定电路被配置为确定与IC中的主时钟条件和上电复位状态中的至少一个相关联的当前工作状态。 控制电路被配置为响应于第一操作状态的确定而产生控制信号。 控制信号被配置为在确定第一操作状态时促进从主时钟到次时钟的转换，以及在确定第二操作状态时从安全操作模式转换到正常操作模式。 次级时钟与IC的安全工作模式相关联。

公开(公告)号：US20140159801A1

公开(公告)日：2014-06-12

申请号：US14103433

申请日：2013-12-11

Applicant: Texas Instruments Incorporated

Inventor： Jose Luis Flores ,  Anthony Martin Hill ,  Francisco Adolfo Cano

IPC: H03K3/012

CPC classification number: G06F1/3296 ,  Y02D10/172

Abstract: Power consumption is reduced by the use of a plurality of parameter reference targets, optimized for a subset of the complete temperature range. The prediction accuracy of the performance tracking sensor is optimized by using small segments of the operating temperature range.

Abstract translation: 通过使用针对整个温度范围的子集而优化的多个参数参考目标来降低功耗。 通过使用工作温度范围的小段来优化性能跟踪传感器的预测精度。