Exchange bias structure for abutted junction GMR sensor
    1.
    发明授权
    Exchange bias structure for abutted junction GMR sensor 失效
    对接结GMR传感器的交换偏置结构

    公开(公告)号:US07529067B2

    公开(公告)日:2009-05-05

    申请号:US11375323

    申请日:2006-03-14

    IPC分类号: G11B5/39

    摘要: Although it is known that exchange bias can be utilized in abutted junctions for longitudinal stabilization, a relatively large moment is needed to pin down the sensor edges effectively. Due to the inverse dependence of the exchange bias on the magnetic layer thickness, a large exchange bias has been difficult to achieve by the prior art. This problem has been solved by introducing a structure in which the magnetic moment of the bias layer has been approximately doubled by pinning it from both above and below through exchange with antiferromagnetic layers. Additionally, since the antiferromagnetic layer is in direct abutted contact with the free layer, it acts directly to help stabilize the sensor edge, which is an advantage over the traditional magnetostatic pinning that had been used.

    摘要翻译: 虽然已知交换偏压可用于邻接接头用于纵向稳定化,但是需要相对较大的力矩来有效地将传感器边缘压下。 由于交换偏压对磁性层厚度的反向依赖性,现有技术难以实现大的交换偏压。 通过引入通过与反铁磁层交换而将偏压层的磁矩从上下两端钉住而将偏置层的磁矩大致加倍的结构已经解决了这个问题。 另外,由于反铁磁层直接与自由层接触,所以它直接作用以帮助稳定传感器边缘,这是相对于已经使用的传统静磁钉扎的优点。

    Junction stability and yield for spin valve heads
    9.
    发明授权
    Junction stability and yield for spin valve heads 失效
    自旋阀头的结点稳定性和产量

    公开(公告)号:US06879474B2

    公开(公告)日:2005-04-12

    申请号:US10718878

    申请日:2003-11-21

    摘要: The possibility of shorting between a spin valve and its underlying magnetic shield layer can be largely eliminated by choosing the bottom spin valve structure. However, doing so causes the hard longitudinal bias that is standard for all such devices to degrade. The present invention overcomes this problem by inserting a thin NiCr, Ni, Fe, or Cr layer between the antiferromagnetic layer and the longitudinal bias layers. This provides a smoother surface for the bias layers to be deposited onto, thereby removing structural distortions to the longitudinal bias layer that would otherwise be present. A process for manufacturing the structure is also described.

    摘要翻译: 通过选择底部自旋阀结构,可以大大消除自旋阀与其下面的磁屏蔽层之间短路的可能性。 然而,这样做会导致所有这些设备的标准硬的纵向偏差降级。 本发明通过在反铁磁层和纵向偏置层之间插入薄的NiCr,Ni,Fe或Cr层来克服这个问题。 这为偏压层沉积提供了更平滑的表面,从而消除了否则将存在的纵向偏置层的结构变形。 还描述了用于制造该结构的方法。