Abstract:
An output circuit of a semiconductor device includes a signal selector configured to receive first and second input data signals and sequentially outputting the first and second input data signals in response to a phase signal; and an output level controller configured to control a voltage level of an output signal of the signal selector based on the first and second input data signals.
Abstract:
Circuit and method for recovering clock data in highly integrated semiconductor memory apparatus includes a plurality of signal receiving units configured to receive signals through a plurality of input/output pads and transfer the signals according to a receiving reference clock, the signal receiving units being divided into groups, a plurality of phase detection units configured to detect phases of signals output from the groups of the signal receiving units, a plurality of phase detection control units configured to control the phase detection units so that the phase detection units sequentially detect the phases of the signals output from each of the groups of the signal receiving units and a notification unit configured to output signals output from the phase detection units.
Abstract:
A semiconductor device includes a latency signal generating circuit for generating a latency signal corresponding CAS latency by measuring a delay amount reflected at a delay locked loop and reflecting the measured delay amount at a read command signal, and a delay locked loop for controlling an internal clock signal applied to the latency signal generating circuit corresponding to the read command and the latency signal. The semiconductor device includes an internal clock signal generating block configured to generate an internal clock signal, a latency generating block configured to generate a latency signal by synchronizing a read command signal with the internal clock signal at a time corresponding to a CAS latency value and a measured delay value, and an input controlling block configured to activate the reference clock signal using an external clock signal in response to the read command signal and the latency signal.
Abstract:
A display device includes: a plurality of pixels; a data driver connected to the plurality of pixels by a plurality of data lines and applying data signals to the plurality of pixels; a scan driver connected to the plurality of pixels by a plurality of scan lines and applying scan signals to the plurality of pixels for the data signals to be applied to the plurality of pixels; a boost driver connected to the plurality of pixels by a plurality of boost lines and applying boost signals, boosting the pixel voltage charged to the plurality of pixels by the data signals, to the plurality of pixels; and a boost voltage maintaining unit applying a restoring voltage restoring the voltage in the plurality of boost lines by the scan signal to the plurality of boost lines. The voltage generated in the boost line by the coupling may be quickly restored and the crosstalk may be minimized, thereby improving the image quality.
Abstract:
A data output driving circuit includes a plurality of driving units that are set to have different impedance values from one another, and the number of driving units is less than the number of a plurality of required driving impedance values such that the driving units can obtain the plurality of required driving impedance values by a combination thereof, and a driving control unit that independently controls the operation of the plurality of driving units so as to obtain the plurality of driving impedance values required.
Abstract:
A circuit which can reduce time taken by a clock alignment training operation in a semiconductor memory device is provided. The semiconductor memory device, which includes: a clock inputting unit configured to receive a system clock and a data clock; a clock dividing unit configured to divide a frequency of the data clock to generate a data division clock, wherein the clock dividing unit determines a phase of the data division clock in response to an inversion division control signal; a phase dividing unit configured to generate a plurality of multiple phase data division clocks having respective predetermined phase differences in response to the data division clock; a data serializing unit configured to serialize predetermined parallel pattern data in correspondence with the multiple phase data division clocks; and a signal transmitting unit configured to transmit an output signal of the data serializing unit to the outside.
Abstract:
A semiconductor memory device includes a clock supply portion for providing an external clock to the interior of the memory device, a clock transfer portion for transferring the clock from the clock supply portion to each of elements in the memory device and data output portions for outputting data in synchronism the clock from the clock transfer portion, wherein the clock from the clock supply portion to the clock transfer portion swings at a current mode logic (CML) level.
Abstract:
A low pass filter includes a driver unit configured to output a voltage proportional to an input pulse width, a charge/discharge unit configured to charge the output voltage of the driver unit, a comparator unit configured to compare an output voltage of the charge/discharge unit with a reference value to output a square wave signal, and a switching unit configured to switch the charge/discharge unit to an operation state, based on a bandwidth expansion signal.
Abstract:
A semiconductor memory device with a clock synchronization circuit capable of performing a desired phase/frequency locking operation, without the jitter peaking phenomenon and the pattern jitter of an oscillation control voltage signal using injection locking. The device includes a phase-locked loop that detects a phase/frequency difference between a feedback clock signal and a reference clock signal to generate an oscillation control voltage signal corresponding to the detected phase/frequency difference, and generates the feedback clock signal corresponding to the oscillation control voltage signal. An injection locking oscillation unit sets up a free running frequency in response to the oscillation control voltage signal and generates an internal clock signal which is synchronized with the reference clock signal.
Abstract:
A semiconductor, which includes a first phase detecting unit configured to detect a phase of a second clock on the basis of a phase of a first clock, and generate a first detection signal corresponding to a result of the detection, a second phase detecting unit configured to detect a phase of a delayed clock, which is generated by delaying the second clock by a predetermined time, on the basis of the phase of the first clock, and generate a second detection signal corresponding to a result of the detection, and a logic level determining unit configured to determine a logic level of a feedback output signal according to the first detection signal, the second detection signal and the feedback output signal.