MICROSCOPE APPARATUS
    94.
    发明申请

    公开(公告)号:US20180120549A1

    公开(公告)日:2018-05-03

    申请号:US15728726

    申请日:2017-10-10

    Inventor: Susumu HONDA

    Abstract: A microscope apparatus includes: an objective lens; an observation optical system that makes the specimen be irradiated with excitation light by the objective lens, and acquires image information of the specimen; a first stimulation optical system that includes a scanning section which scans stimulus light, makes the scanning section scan an irradiation position of the stimulus light and applies an optical stimulus to the specimen; a second stimulation optical system that includes an SLM arranged at a pupil conjugate position of the objective lens and capable of modulating a phase of the stimulus light, selectively switches the irradiation position of the stimulus light by the SLM and applies the optical stimulus to the specimen; and a light path selecting section that selects at least one of a light path of the first stimulation optical system and a light path of the second stimulation optical system.

    Projector and control method
    95.
    发明授权

    公开(公告)号:US09961311B2

    公开(公告)日:2018-05-01

    申请号:US15407635

    申请日:2017-01-17

    Abstract: A projector includes a light-emitting element that outputs light of a first wavelength band which is in a first polarization state; a retardation plate that converts a portion of the light into a second polarization state; a polarization separation element that separates the light from the retardation plate into a first flux of light in the first polarization state and a second flux of light in a second polarization state; a phosphor, excited by the first flux of light, which outputs a third flux of light of a second wavelength band; a retardation plate control unit that controls a rotation angle of the retardation plate in accordance with brightness information indicating brightness of the third flux of light; and a light-emitting element control unit that controls brightness of the light-emitting element in accordance with the brightness information and temperature information indicating a temperature of the light-emitting element.

    3D IMAGING METHOD AND APPARATUS
    97.
    发明申请

    公开(公告)号:US20180107013A1

    公开(公告)日:2018-04-19

    申请号:US15843994

    申请日:2017-12-15

    Abstract: The present application discloses a 3D imaging method and apparatus, which divide a source 3D image light into two polarized light beams carrying image information through a birefringence effect, adjust optical paths of the two polarized light beams obtained through birefringence, and control the two polarized light beams to be alternately irradiated, thereby achieving 3D imaging; since the implementation of the above imaging method only requires one imaging apparatus having corresponding functions, the present application can simplify the system structure and reduce the system cost relative to a conventional 3D projection technology that requires two imaging devices; moreover, a viewer can directly see, with no need to wear corresponding 3D glasses, a 3D image due to the parallax caused by alternate irradiation of two polarized light beams carrying image information out of a projection device. As a result, the investment in configuring 3D glasses can be saved and the system cost is further reduced.

    IMAGER AND OPTICAL SYTEM WITH IMAGER
    99.
    发明申请

    公开(公告)号:US20180088448A1

    公开(公告)日:2018-03-29

    申请号:US15713266

    申请日:2017-09-22

    Inventor: Eberhard Piehler

    Abstract: Described are an imager and an optical system with an imager. The imager includes a beam deflector to deflect light beams within the imager, a light source with an active surface, to emit light beams in the direction of the beam deflector, a reflector with a main plane, to reflect incident light beams from the direction of the beam deflector in the direction of the beam deflector, a light modulator with an active surface, to modulate incident light beams from the direction of the beam deflector and to reflect them in the direction of the beam deflector. The beam deflector is between the reflector and the light modulator. The main plane of the reflector and the active surface of the light modulator enclose an angle of greater than 0° which faces the beam deflector.

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