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    Flash Memory System Using Complementary Voltage Supplies
    132.
    发明申请
    Flash Memory System Using Complementary Voltage Supplies 审中-公开
    使用互补电压源的闪存系统

    公开(公告)号：US20170076809A1

    公开(公告)日：2017-03-16

    申请号：US15361473

    申请日：2016-11-27

    Applicant: Silicon Storage Technology, Inc.

    Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu ,  Hung Quoc Nguyen

    IPC: G11C16/30 ,  H01L27/115 ,  G11C16/04 ,  G11C16/14 ,  G11C16/26

    CPC classification number: G11C16/30 ,  G11C5/14 ,  G11C5/145 ,  G11C5/147 ,  G11C8/08 ,  G11C16/0408 ,  G11C16/0425 ,  G11C16/08 ,  G11C16/10 ,  G11C16/14 ,  G11C16/16 ,  G11C16/26 ,  G11C2216/04 ,  H01L27/11521

    Abstract: A non-volatile memory device comprises a semiconductor substrate of a first conductivity type. An array of non-volatile memory cells is located in the semiconductor substrate and arranged in a plurality of rows and columns. Each memory cell comprises a first region on a surface of the semiconductor substrate of a second conductivity type, and a second region on the surface of the semiconductor substrate of the second conductivity type. A channel region is between the first region and the second region. A word line overlies a first portion of the channel region and is insulated therefrom, and adjacent to the first region and having little or no overlap with the first region. A floating gate overlies a second portion of the channel region, is adjacent to the first portion, and is insulated therefrom and is adjacent to the second region. A coupling gate overlies the floating gate. A bit line is connected to the first region. During the operations of program, read, or erase, a negative voltage can be applied to the word lines and/or coupling gates of the selected or unselected memory cells.

    Abstract translation: 非易失性存储器件包括第一导电类型的半导体衬底。 非易失性存储单元的阵列位于半导体衬底中并且被布置成多个行和列。 每个存储单元包括第二导电类型的半导体衬底的表面上的第一区域和第二导电类型的半导体衬底的表面上的第二区域。 沟道区域在第一区域和第二区域之间。 字线覆盖在沟道区域的第一部分上，并且与第一区域绝缘，并且与第一区域相邻并且与第一区域几乎没有或没有重叠。 浮动栅极覆盖沟道区域的第二部分，与第一部分相邻，并与第二部分绝缘并与第二区域相邻。 耦合栅极覆盖浮栅。 位线连接到第一区域。 在程序，读取或擦除的操作期间，负电压可以被施加到所选择的或未选择的存储单元的字线和/或耦合门。

    Non-volatile Memory Device And A Method Of Programming Such Device
    137.
    发明申请
    Non-volatile Memory Device And A Method Of Programming Such Device 有权
    非易失性存储器件及其编程方法

    公开(公告)号：US20150003166A1

    公开(公告)日：2015-01-01

    申请号：US14449926

    申请日：2014-08-01

    Applicant: Silicon Storage Technology, Inc.

    Inventor： Hieu Van Tran ,  Hung Quoc Nguyen ,  Anh Ly ,  Thuan Vu

    IPC: G11C16/10 ,  G11C16/26 ,  H01L27/115

    CPC classification number: G11C16/10 ,  G11C7/00 ,  G11C7/22 ,  G11C16/26 ,  G11C16/28 ,  G11C2207/2263 ,  G11C2211/5647 ,  H01L27/11517

    Abstract: A non-volatile memory device has a charge pump for providing a programming current and an array of non-volatile memory cells. Each memory cell of the array is programmed by the programming current from the charge pump. The array of non-volatile memory cells is partitioned into a plurality of units, with each unit comprising a plurality of memory cells. An indicator memory cell is associated with each unit of non-volatile memory cells. A programming circuit programs the memory cells of each unit using the programming current, when fifty percent or less of the memory cells of each unit is to be programmed, and programs the inverse of the memory cells of each unit and the indicator memory cell associated with each unit, using the programming current, when more than fifty percent of the memory cells of each unit is to be programmed.

    Abstract translation: 非易失性存储器件具有用于提供编程电流和非易失性存储器单元阵列的电荷泵。 阵列的每个存储单元都由来自电荷泵的编程电流编程。 非易失性存储器单元的阵列被分割成多个单元，每个单元包括多个存储器单元。 指示器存储单元与每单位的非易失性存储单元相关联。 编程电路使用编程电流来对每个单元的存储器单元进行编程，当每个单元的存储单元的百分之五十或更少被编程时，编程每个单元的存储器单元的反相和与 每个单元使用编程电流时，每个单元的存储单元的百分之五十以上将被编程。

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