APPARATUS AND METHOD FOR PROCESSING SUBSTRATE

    公开(公告)号:US20230018637A1

    公开(公告)日:2023-01-19

    申请号:US17955206

    申请日:2022-09-28

    Abstract: Disclosed is a method for processing a substrate, comprising a liquid processing step of performing liquid processing on the substrate by supplying a processing liquid onto the substrate in a liquid processing chamber, a transfer step of transferring the substrate from the liquid processing chamber to a drying chamber, and a drying step of drying the substrate in the drying chamber. In the drying step, the substrate is dried while an edge region of the substrate other than a central region of the substrate is supported by a support unit, and in the liquid processing step, the liquid processing is performed on the substrate such that a height of the processing liquid remaining on the edge region of the substrate is greater than a height of the processing liquid remaining on the central region of the substrate when the liquid processing is completed in the liquid processing chamber.

    APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING A SUBSTRATE

    公开(公告)号:US20230008351A1

    公开(公告)日:2023-01-12

    申请号:US17859900

    申请日:2022-07-07

    Abstract: Provided is an apparatus for treating a substrate. The apparatus for treating the substrate includes: a first process chamber having a first treating space therein; a second process chamber having a second treating space therein; and an exhaust unit configured to exhaust atmospheres of the first treating space and the second treating space, in which the exhaust unit includes an integrated exhaust line in which a pressure reduction unit is installed, a first exhaust line configured to connect the first process chamber and a first point of the integrated exhaust line, a second exhaust line configured to connect the first process chamber and a second point of the integrated exhaust line, and an interference alleviation unit configured to alleviate exhaust interference between the first process chamber and the second process chamber.

    APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING SUBSTRATE

    公开(公告)号:US20220415626A1

    公开(公告)日:2022-12-29

    申请号:US17846104

    申请日:2022-06-22

    Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a chamber providing a treating space; a support unit supporting a substrate at the treating space; a gas supply unit configured to introduce a gas to the treating space; a plasma source configured to provide an energy for exciting a gas introduced to the treating space to a plasma; an exhaust unit configured to exhaust an atmosphere within the treating space to an outside of the treating space; and a heating source positioned above the support unit, and wherein the heating source applies a heating energy in a pulse form to the substrate.

    SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD

    公开(公告)号:US20220406571A1

    公开(公告)日:2022-12-22

    申请号:US17842222

    申请日:2022-06-16

    Abstract: Disclosed is a substrate treating apparatus, including: a process chamber in which an inner space for treating a substrate is formed; an ion blocker for dividing the inner space into a plasma generating space and a treatment space; a substrate support unit for supporting a substrate in the treatment space; an exhaust unit for exhausting the treatment space; an anneal source positioned above the ion blocker and transmitting energy for annealing to the substrate through the ion blocker; and a gas supply unit for supplying process gas to the plasma generating space, in which the ion blocker includes: a body which is shaped like a disk, is made of a material through which microwaves are transmittable, and is formed with a plurality of through-holes; and a transparent conductive oxide film provided on at least one of an upper surface and a lower surface of the body in a first thickness or less.

    APPARATUS FOR TREATING SUBSTRATE
    187.
    发明申请

    公开(公告)号:US20220403517A1

    公开(公告)日:2022-12-22

    申请号:US17837241

    申请日:2022-06-10

    Abstract: Provided is an apparatus for treating a substrate. The apparatus for treating the substrate includes a chamber having an inner space, a support unit configured to support the substrate in the inner space, a gas supply tube configured to supply a gas onto the substrate supported on the support unit, a gas exhaust tube configured to exhaust the gas from the inner space, and a gas block connected to the gas supply tube and the gas exhaust tube and provided above the chamber.

    Apparatus of transferring an object and method of controlling the same

    公开(公告)号:US11527986B2

    公开(公告)日:2022-12-13

    申请号:US16952821

    申请日:2020-11-19

    Abstract: An apparatus includes a servo motor being configured to drive a traveling part for transferring an object along a traveling rail, a servo driver being configured to control an operation of the servo motor with adjusting a torque of the servo motor according to a load level, an overload determination unit being configured to check a degree of overload of the servo driver and a motion controller being configured to generate a speed signal and a speed profile according to a transfer command which a control unit of controlling an operation of the traveling part transmits thereto, the motion controller generating either a normal speed profile when the servo driver is not at an overload state or a corrected speed profile when the servo driver is at the overload state, and transmitting the speed signal and the speed profile to the servo driver.

    SUBSTRATE TREATING APPARATUS AND DATA CHANGE DETERMINATION METHOD

    公开(公告)号:US20220374772A1

    公开(公告)日:2022-11-24

    申请号:US17746241

    申请日:2022-05-17

    Inventor: Ki-Sung KOO

    Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes at least one sensor configured to measure a condition of the substrate or the apparatus in a process of the treating of the substrate; a data collecting unit configured to collect in time series data measured by the sensor; and a data processing unit configured to learn the data by the data collecting unit to detect a change in a current data measured by the sensor. The data processing unit comprises a data learning unit configured to learn a data of the past collected by the data collecting unit using a Siamese network; and a data inspecting unit configured to detect whether an issue has occurred in the current data based on the learned data.

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