Providing talk burst authority in group communication system supporting PTT service
    11.
    发明授权
    Providing talk burst authority in group communication system supporting PTT service 有权
    在支持PTT业务的组通信系统中提供通话突发权限

    公开(公告)号:US07761108B2

    公开(公告)日:2010-07-20

    申请号:US11191443

    申请日:2005-07-27

    申请人: Guk-Chan Lim

    发明人: Guk-Chan Lim

    摘要: A method for managing a talk burst in a PTT service system comprises: allocating, by a PTT server, master authority to a particular PTT client; and controlling, by the PTT server, another PTT clients according to a talk burst management procedure selected by the PTT client having the master authority. The PTT server allocates the master authority to the PTT client initiating a session and the PTT client having the master authority freely controls the talk burst management procedure, so that session establishment can be smoothly controlled.

    摘要翻译: 一种用于管理PTT服务系统中的通话突发的方法,包括:由PTT服务器将主机授权分配给特定的PTT客户机; 并且由PTT服务器根据由具有主权限的PTT客户端选择的通话突发管理过程来控制另一PTT客户端。 PTT服务器将主机权限分配给发起会话的PTT客户端,具有主机的PTT客户端可以自由地控制通话突发管理过程,从而可以平滑地控制会话建立。

    Talk burst allocation in a PTT communication network
    12.
    发明授权
    Talk burst allocation in a PTT communication network 有权
    在PTT通信网络中进行会话突发分配

    公开(公告)号:US07738893B2

    公开(公告)日:2010-06-15

    申请号:US11192250

    申请日:2005-07-27

    申请人: Guk-Chan Lim

    发明人: Guk-Chan Lim

    摘要: A server servicing a plurality of mobile communication systems for half-duplex communication is provided. The server comprises a transceiver to send and receive communication signals; a processor in operational relationship with the transceiver for processing executable code stored in a storage medium accessible by the processor, the executable code configured to cause the processor to detect a time duration in which a user continuously activates a half-duplex function.

    摘要翻译: 提供服务于用于半双工通信的多个移动通信系统的服务器。 服务器包括发送和接收通信信号的收发器; 与所述收发器操作关系的处理器,用于处理存储在由所述处理器可访问的存储介质中的可执行代码,所述可执行代码被配置为使得所述处理器检测用户连续激活半双工功能的持续时间。

    METHOD FOR EQUALIZING AUDIO, AND VIDEO APPARATUS USING THE SAME
    15.
    发明申请
    METHOD FOR EQUALIZING AUDIO, AND VIDEO APPARATUS USING THE SAME 有权
    使音频平均化的方法和使用其的视频设备

    公开(公告)号:US20090067664A1

    公开(公告)日:2009-03-12

    申请号:US12041124

    申请日:2008-03-03

    申请人: Soo-chan LIM

    发明人: Soo-chan LIM

    IPC分类号: H04R1/02 H03G5/00

    摘要: A method for equalizing audio and a video apparatus using the audio equalizing method are provided. The method for equalizing audio includes detecting the distance between a speaker mounted in a video apparatus and a reflective surface, and equalizing an audio signal to be output from the speaker based on the detected distance. Accordingly, attenuation of audio output is reduced, so audio output is optimized.

    摘要翻译: 提供了一种使用音频均衡方法来均衡音频和视频设备的方法。 用于均衡音频的方法包括检测安装在视频设备中的扬声器与反射表面之间的距离,以及基于检测到的距离来均衡从扬声器输出的音频信号。 因此,音频输出的衰减减小,音频输出被优化。

    Methods of fabricating semiconductor devices
    16.
    发明申请
    Methods of fabricating semiconductor devices 审中-公开
    制造半导体器件的方法

    公开(公告)号:US20060068535A1

    公开(公告)日:2006-03-30

    申请号:US11216662

    申请日:2005-08-31

    IPC分类号: H01L21/8234

    摘要: Methods of forming semiconductor devices are provided. A preliminary gate structure is formed on a semiconductor substrate. The preliminary gate structure includes a gate insulation layer pattern, a polysilicon layer pattern and a conductive layer pattern. A first oxidation process is performed on the preliminary gate structure using an oxygen radical. The first oxidation process is carried out at a first temperature. A second oxidation process is carried out on the oxidized preliminary gate structure to provide a gate structure on the substrate, the second oxidation process being carried out at a second temperature, the second temperature being higher than the first temperature.

    摘要翻译: 提供了形成半导体器件的方法。 在半导体衬底上形成初步栅极结构。 预栅极结构包括栅极绝缘层图案,多晶硅层图案和导电层图案。 使用氧自由基对预选栅极结构进行第一氧化处理。 第一氧化过程在第一温度下进行。 在氧化的预选栅极结构上进行第二氧化工艺以在衬底上提供栅极结构,第二氧化工艺在第二温度下进行,第二温度高于第一温度。

    Semiconductor devices including high-k dielectric materials and methods of forming the same
    17.
    发明申请
    Semiconductor devices including high-k dielectric materials and methods of forming the same 失效
    包括高k电介质材料的半导体器件及其形成方法

    公开(公告)号:US20060057794A1

    公开(公告)日:2006-03-16

    申请号:US11227541

    申请日:2005-09-15

    IPC分类号: H01L21/8234

    摘要: A semiconductor device includes a first conductive layer on a semiconductor substrate, a dielectric layer including a high-k dielectric material on the first conductive layer, a second conductive layer including polysilicon doped with P-type impurities on the dielectric layer, and a third conductive layer including a metal on the second conductive layer. In some devices, a first gate structure is formed in a main cell region and includes a tunnel oxide layer, a floating gate, a first high-k dielectric layer, and a control gate. The control gate includes a layer of polysilicon doped with P-type impurities and a metal layer. A second gate structure is formed outside the main cell region and includes a tunnel oxide layer, a conductive layer, and a metal layer. A third gate structure is formed in a peripheral cell region and includes a tunnel oxide, a conductive layer, and a high-k dielectric layer having a width narrower than the conductive layer. Method embodiments are also disclosed.

    摘要翻译: 半导体器件包括在半导体衬底上的第一导电层,在第一导电层上包括高k电介质材料的电介质层,在电介质层上包含掺杂有P型杂质的多晶硅的第二导电层,以及第三导电层 层,其包括在第二导电层上的金属。 在一些器件中,第一栅极结构形成在主单元区域中,并且包括隧道氧化物层,浮置栅极,第一高k电介质层和控制栅极。 控制栅极包括掺杂有P型杂质和金属层的多晶硅层。 第二栅极结构形成在主单元区域的外部,并且包括隧道氧化物层,导电层和金属层。 第三栅极结构形成在周边单元区域中,并且包括具有比导电层窄的宽度的隧道氧化物,导电层和高k电介质层。 还公开了方法实施例。

    Methods of manufacturing semiconductor device gate structures by performing a surface treatment on a gate oxide layer
    18.
    发明申请
    Methods of manufacturing semiconductor device gate structures by performing a surface treatment on a gate oxide layer 审中-公开
    通过对栅极氧化物层进行表面处理来制造半导体器件栅极结构的方法

    公开(公告)号:US20060051921A1

    公开(公告)日:2006-03-09

    申请号:US11215504

    申请日:2005-08-30

    IPC分类号: H01L21/336 H01L21/31

    摘要: In methods of manufacturing semiconductor devices, a preliminary gate oxide layer is formed on a substrate. A surface treatment process is performed on the preliminary gate oxide layer that reduces a diffusion of an oxidizing agent in the preliminary gate oxide layer to form a gate oxide layer on the substrate. A preliminary gate structure is formed on the gate oxide layer. The preliminary gate structure includes a first conductive layer pattern on the gate oxide layer and a second conductive layer pattern on the first conductive layer pattern. An oxidation process is performed on the preliminary gate structure using the oxidizing agent to form an oxide layer on a sidewall of the first conductive layer pattern and on the gate oxide layer, and to round at least one edge portion of the first conductive layer pattern.

    摘要翻译: 在半导体器件的制造方法中,在基板上形成预备栅氧化层。 在预栅极氧化物层上进行表面处理工艺,其减少预选栅极氧化物层中的氧化剂的扩散,以在衬底上形成栅极氧化物层。 在栅极氧化物层上形成初步栅极结构。 预栅极结构包括栅极氧化物层上的第一导电层图案和第一导电层图案上的第二导电层图案。 使用氧化剂对预选栅极结构进行氧化处理,以在第一导电层图案和栅极氧化物层的侧壁上形成氧化物层,并且使第一导电层图案的至少一个边缘部分圆弧化。

    Method for manufacturing a semiconductor device having incorporated therein a high K capacitor dielectric
    20.
    发明授权
    Method for manufacturing a semiconductor device having incorporated therein a high K capacitor dielectric 有权
    制造具有高K电容电介质的半导体器件的方法

    公开(公告)号:US06486021B2

    公开(公告)日:2002-11-26

    申请号:US09727584

    申请日:2000-12-04

    申请人: Min-Soo Kim Chan Lim

    发明人: Min-Soo Kim Chan Lim

    IPC分类号: H01L218242

    摘要: A semiconductor device for use in a memory cell includes an active matrix an active matrix provided with a semiconductor substrate, a plurality of transistors formed on the semiconductor substrate and conductive plugs electrically connected to the transistors, a number of lower electrodes formed on top of the conductive plugs, Ta2O5 films formed on the lower electrodes, composite films formed on the Ta2O5 films and upper electrodes formed on the composite films.

    摘要翻译: 用于存储单元的半导体器件包括有源矩阵,设置有半导体衬底的有源矩阵,形成在半导体衬底上的多个晶体管和与晶体管电连接的导电插头,多个下电极形成在 导电插头,形成在下电极上的Ta2O5膜,形成在Ta2O5膜上的复合膜和形成在复合膜上的上电极。