Method and device for measuring the thickness of thin layers over large-area surfaces to be measured
    13.
    发明申请
    Method and device for measuring the thickness of thin layers over large-area surfaces to be measured 有权
    用于测量要测量的大面积表面上的薄层厚度的方法和装置

    公开(公告)号:US20110271750A1

    公开(公告)日:2011-11-10

    申请号:US13068407

    申请日:2011-05-10

    Applicant: Helmut Fischer

    Inventor: Helmut Fischer

    CPC classification number: G01B7/105

    Abstract: The invention relates to a method and a device for measuring the thickness of thin layers over large-area surfaces to be measured (12), in which at least one measuring probe (28), which comprises at least one sensor element (29) and at least one contact spherical cap (31) associated with the sensor element (29), is applied to the surface to be measured (12) in order to obtain a measured value, wherein the large-area surface to be measured (12) is subdivided into individual partial areas (14), a matrix of measurement points (16) is determined for each partial area (14) to be inspected, measured values are ascertained at equidistant measurement points (16) along at least one row (17) of the matrix of the partial area (14) using a device (21) carrying the at least one measuring probe (28), and the measured values are ascertained successively for all rows (17) in the matrix in the partial area (14) and evaluated for this partial area (14).

    Abstract translation: 本发明涉及一种用于测量要测量的大面积表面(12)上的薄层的厚度的方法和装置,其中至少一个测量探针(28)包括至少一个传感器元件(29)和 将与传感器元件(29)相关联的至少一个接触球形盖(31)施加到被测量表面(12)以获得测量值,其中待测量的大面积表面(12)为 被分为单独的部分区域(14),对于要检查的每个部分区域(14)确定测量点(16)的矩阵,测量值沿着至少一行(17)的等距测量点(16)确定 使用承载至少一个测量探针(28)的装置(21)的部分区域(14)的矩阵以及在部分区域(14)中的矩阵中的所有行(17)连续地确定测量值,以及 评估该部分区域(14)。

    Measuring probe for non-destructive measuring of the thickness of thin layers
    14.
    发明申请
    Measuring probe for non-destructive measuring of the thickness of thin layers 有权
    测量探头用于非破坏性测量薄层厚度

    公开(公告)号:US20110260721A1

    公开(公告)日:2011-10-27

    申请号:US13066797

    申请日:2011-04-25

    Applicant: Helmut Fischer

    Inventor: Helmut Fischer

    CPC classification number: G01B7/10 G01B7/001 G01B7/105 G01B21/08

    Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.

    Abstract translation: 本发明涉及一种用于非破坏性地测量薄层厚度的测量探针,特别是在通过开口或弯曲表面可访问的空腔中,测量头包括至少一个传感器元件并且至少包括 分配给待检查的空腔中的传感器元件的一个接触球形盖,以及用于在测量表面上和/或沿着待测量表面定位和引导测量探针的夹持元件,其中在夹持元件上 提供了一种长而弹性屈服的导向杆,其在其与夹持元件相对的端部上接收至少一个测量头,使得其可相对于导向杆至少一个自由度移动。

    Input circuit for receiving an input signal, and a method for adjusting an operating point of an input circuit
    15.
    发明授权
    Input circuit for receiving an input signal, and a method for adjusting an operating point of an input circuit 有权
    用于接收输入信号的输入电路,以及用于调整输入电路的工作点的方法

    公开(公告)号:US07323936B2

    公开(公告)日:2008-01-29

    申请号:US11128625

    申请日:2005-05-13

    CPC classification number: H03F1/301 H03F3/45183

    Abstract: The present invention relates to an input circuit for receiving an input signal in an integrated circuit, having a differential amplifier whose first input can have a predetermined reference voltage applied to it and whose second input can have the input signal applied to it, and having a current source for operating the differential amplifier at its operating point, wherein a setting circuit is connected to the current source in order to set the operating point of the differential amplifier in an optimum manner on the basis of the predetermined reference voltage.

    Abstract translation: 本发明涉及一种用于在集成电路中接收输入信号的输入电路,其具有差分放大器,该差分放大器的第一输入可以具有施加到其上的预定参考电压,并且其第二输入可以具有施加到其上的输入信号,并且具有 用于在其工作点操作差分放大器的电流源,其中设置电路连接到电流源,以便基于预定参考电压以最佳方式设置差分放大器的工作点。

    Semiconductor memory device, system with semiconductor memory device, and method for operating a semiconductor memory device
    16.
    发明授权
    Semiconductor memory device, system with semiconductor memory device, and method for operating a semiconductor memory device 有权
    半导体存储器件,具有半导体存储器件的系统和用于操作半导体存储器件的方法

    公开(公告)号:US07317657B2

    公开(公告)日:2008-01-08

    申请号:US11319754

    申请日:2005-12-29

    CPC classification number: G11C11/4076 G11C7/1045 G11C7/22

    Abstract: The invention relates to a semiconductor memory device, a system with a semiconductor memory device, and a method for operating a semiconductor memory device, comprising the steps of reading out a data value, in particular a CAS latency time data value (CL) stored in a memory; activating or deactivating a device provided on said semiconductor memory device in support of a high speed operation, as a function of the data value (CL) stored.

    Abstract translation: 本发明涉及半导体存储器件,具有半导体存储器件的系统和用于操作半导体存储器件的方法,包括以下步骤:读出数据值,特别是存储在存储器中的CAS等待时间数据值(CL) 记忆 作为存储的数据值(CL)的函数,激活或去激活设置在所述半导体存储器件上的设备以支持高速操作。

    Apparatus for measurement of the thickness of thin layers
    17.
    发明授权
    Apparatus for measurement of the thickness of thin layers 有权
    用于测量薄层厚度的装置

    公开(公告)号:US07076021B2

    公开(公告)日:2006-07-11

    申请号:US10739673

    申请日:2003-12-17

    CPC classification number: G01B15/02 G01N23/223 G01N2223/076

    Abstract: An apparatus for measurement of the thickness of thin layers by means of X-rays using an X-ray tube which emits X-rays which are directed at a layer to be measured, has at least one aperture apparatus arranged between the X-ray tube and the layer to be measured. The apparatus includes an area absorbing X-rays and an aperture opening. At least one aperture opening in the aperture apparatus has a geometric shape which, seen in the beam direction, projects an area which at least in places is matched to the geometry of the layer to be measured.

    Abstract translation: 一种利用X射线管测量薄层厚度的装置,该X射线管发射指向被测层的X射线,具有至少一个孔径装置,其设置在X射线管 和要测量的层。 该装置包括吸收X射线和孔径开口的区域。 开口装置中的至少一个开口开口具有几何形状,其在波束方向上看到至少在与被测量层的几何形状匹配的区域上突出。

    Method for fabricating at least one mesa or ridge structure or at least one electrically pumped region in a layer or layer sequence
    18.
    发明授权
    Method for fabricating at least one mesa or ridge structure or at least one electrically pumped region in a layer or layer sequence 有权
    用于在层或层序列中制造至少一个台面或脊结构或至少一个电泵浦区域的方法

    公开(公告)号:US07008810B2

    公开(公告)日:2006-03-07

    申请号:US10804514

    申请日:2004-03-19

    Abstract: A method for fabricating at least one mesa or ridge structure in a layer or layer sequence, in which a sacrificial layer (4) is applied and patterned above the layer or layer sequence. A mask layer is applied and patterned above the sacrificial layer for definition of the mesa or ridge dimensions. The sacrificial layer (4) and of the layer or layer sequence are removed so that the mesa or ridge structure is formed in the layer or layer sequence. A part of the sacrificial layer (4) is selectively removed from the side areas thereof which have been uncovered in the previous step, so that a sacrificial layer remains which is narrower in comparison with a layer that has remained above the sacrificial layer as seen from the layer or layer sequence. A coating is applied at least to the sidewalls of the structure produced in the previous steps so that the side areas of the residual sacrificial layer are not completely overformed by the coating material. The sacrificial layer (4) is removed so that the layer that has remained above the sacrificial layer as seen from the layer or layer sequence is lifted off. A method is also disclosed for fabricating at least one gain-controlled laser diode in a layer sequence, in which method steps analogous to those described above are employed.

    Abstract translation: 一种用于在层或层序列中制造至少一个台面或脊状结构的方法,其中牺牲层(4)被施加并在层或层序列上形成图案。 掩模层被施加和图案化在牺牲层上方以定义台面或脊尺寸。 去除牺牲层(4)和层或层序列,使得台层或脊结构以层或层序列形成。 牺牲层(4)的一部分从其前面的步骤中未被覆盖的侧面区域选择性地去除,从而与牺牲层上方的层相比较,牺牲层保持较窄,如从 层或层序列。 至少将涂层施加到在前述步骤中制造的结构的侧壁上,使得残余牺牲层的侧面区域不会被涂层材料完全覆盖。 去除牺牲层(4),使得从层或层序列看到的保留在牺牲层上方的层被提升。 还公开了一种用于在层序列中制造至少一个增益控制的激光二极管的方法,其中采用与上述类似的方法步骤。

    Circuit and method for writing and reading data from a dynamic memory circuit
    19.
    发明授权
    Circuit and method for writing and reading data from a dynamic memory circuit 失效
    用于从动态存储器电路写入和读取数据的电路和方法

    公开(公告)号:US06859411B2

    公开(公告)日:2005-02-22

    申请号:US10623831

    申请日:2003-07-21

    CPC classification number: G11C11/4097 G11C11/4087

    Abstract: A method for writing and reading data is performed on a dynamic memory circuit. The memory circuit has memory cells that can be addressed via word lines and bit lines. A word line is activated in the event of addressing of a memory area with a specific address. A word line has a plurality of mutually separate word line sections. Via the bit lines, in the event of addressing with the specific address, in parallel, a first number of data can be written to memory cells addressed by the address or the first number of data can be read from memory cells addressed by the address. In the event of addressing with a specific address, only a portion of the word line sections are activated, in order that only a portion of the memory cells connected to the word line are written to in parallel or read from in parallel.

    Abstract translation: 在动态存储器电路上执行用于写入和读取数据的方法。 存储器电路具有可通过字线和位线寻址的存储单元。 在使用特定地址寻址存储区域的情况下,字线被激活。 字线具有多个相互分离的字线部分。 通过位线,在与特定地址进行寻址的情况下,并行地将第一数量的数据写入由地址寻址的存储器单元,或者可以从地址寻址的存储单元读取第一数据数。 在使用特定地址进行寻址的情况下,只有一部分字线部分被激活,以便仅连接到字线的存储器单元的一部分被并行地并行地并行地读取。

    Addressing device for selecting regular and redundant elements
    20.
    发明授权
    Addressing device for selecting regular and redundant elements 失效
    用于选择常规和冗余元素的寻址设备

    公开(公告)号:US06788228B2

    公开(公告)日:2004-09-07

    申请号:US10364014

    申请日:2003-02-10

    CPC classification number: G11C29/781 G11C29/787 G11C29/812

    Abstract: An addressing device selects an element from a set of N≦2K regular elements or alternatively from a set of R

    Abstract translation: 寻址装置从一组N <= 2KK个常规元素中选择一个元素,或者根据一个R-N个冗余元素来选择一个元素,这取决于一个K位输入地址, N解码器,并且其解析常规元素。 对于每个冗余元件,提供旁路电路,并且在每种情况下都具有用于提供通过选择性破坏可编程的K个参考位或者通过选择性地引入导电链路以将比较器件设置为所选择的标识的参考位发射器 地址。 如果相关地址被识别,则旁路电路解决分配给它的冗余元件,同时关闭1-out-N解码器,只要它是敏感的。 对于其敏化,每个双稳态电路检查参考位的M

Patent Agency Ranking