Abstract:
A thin film transistor array substrate and the manufacturing method thereof are disclosed herein. A first patterned metal layer, an insulating layer, a patterned layer, and a second patterned metal layer are sequentially formed on a substrate. Then, a plurality of scan lines and a plurality of source lines are disposed on the substrate and define a plurality of pixel regions. A plurality of the storage capacitance lines are disposed on the substrate in a direction extending along the scan lines and across the pixel regions, wherein each of the storage capacitance lines is essentially perpendicular to each of the source lines and to form a cross portion. A plurality of patterned thin films are disposed on the storage capacitance lines and above the cross portion.
Abstract:
A stylus includes a circuit module, a battery module electrically connected to the circuit module, and a fine adjustment module. The circuit module has a circuit board and a variable resistor mounted on the circuit board. The fine adjustment module has a conductor and a conductive refill movably contact with the conductor. The conductor is connected to the circuit board and is electrically connected to the variable resistor via the conductor and the circuit board. The resistance value of the variable resistor can be adjusted to cause the stylus to output a first signal strength through the conductive refill. The conductive refill can be moved with respect to the conductor to enable the stylus to have a signal strength, which is X˜Y % of the first signal strength (80≦X≦100 and 100
Abstract:
A metal gate structure located on a substrate includes a gate dielectric layer, a metal layer and a titanium aluminum nitride metal layer. The gate dielectric layer is located on the substrate. The metal layer is located on the gate dielectric layer. The titanium aluminum nitride metal layer is located on the metal layer.
Abstract:
A formulation including: an organic semiconducting material; and a carrier liquid including at least one of: a first liquid of the formulas (III) or (II): or mixtures of formulas (III) and (II); and a second liquid of a saturated or unsaturated cyclic hydrocarbylene compound of the formula (I): where the respective R1-8, x, and n are as defined herein, and optionally a tertiary liquid carrier, as defined herein. Also disclosed are semiconducting articles prepared with the formulations as defined herein.
Abstract:
A polyurethane composite is disclosed comprising rigid polyurethane and foamed thereupon a flexible integral skin (surface pore closed) polyurethane foam, wherein the rigid polyurethane having a density range of 600 kg/m3 to 1200 kg/m3, a Shore A hardness range of 90 to 99, a Shore D hardness range of 40 to 80, a tensile strength range of 10MPa to 60 MPa, a flexural strength range of 20 MPa to 60 Mpa, a elastic flexural modulus range of 800 MPa to 2500 Mpa, an elongation rate at break of 10-100% and an elongation at break of 25-150%; wherein the flexible integral skin (surface pore closed) polyurethane foam having a density range of 60 kg/m3 to 200 kg/m3, a tensile strength of 60 kPa to 250 kPa, an elongation at break of 70-180%, a tearing strength of 130-220 N/m, a resilience of falling ball of 40-70%, IFD25% of 200-600 N and IFD65% of 600-1800 N.
Abstract translation:公开了一种聚氨酯复合材料,其包含刚性聚氨酯并且随后发泡的柔性整体表面(表面孔封闭)聚氨酯泡沫,其中密度范围为600kg / m 3至1200kg / m 3的硬质聚氨酯,肖氏A硬度范围为90至 99,肖氏D硬度范围为40〜80,拉伸强度范围为10MPa〜60MPa,弯曲强度范围为20MPa〜60Mpa,弹性挠曲模量范围为800MPa〜2500Mpa,断裂伸长率 为10-100%,断裂伸长率为25-150%; 其中密度范围为60kg / m 2至200kg / m 3,抗拉强度为60kPa至250kPa,断裂伸长率为70-180%的柔软整体表面(表面孔封闭)聚氨酯泡沫,撕裂强度 130-220 N / m,落球弹性为40-70%,IFD25%为200-600N,IFD65%为600-1800N。
Abstract:
A method for cleaning a surface is disclosed. First, a substrate including Cu and a barrier layer is provided. Second, a first chemical mechanical polishing procedure is performed on the substrate. Then, a second chemical mechanical polishing procedure is performed on the barrier layer. The second chemical mechanical polishing procedure includes performing a main chemical mechanical polishing procedure to partially remove the barrier layer and performing a chemical buffing procedure on the substrate using a chemical solution which has a pH value of about 6 to about 8 to remove residues on the substrate after the main chemical mechanical polishing procedure. Later, a water rinsing procedure is performed on the substrate. Afterwards, a post clean procedure is performed on the substrate after the second chemical mechanical polishing procedure.
Abstract:
A thin film transistor array substrate and the manufacturing method thereof are disclosed herein. A first patterned metal layer, an insulating layer, a patterned layer, and a second patterned metal layer are sequentially formed on a substrate. Then, a number of scan lines and a number of source lines are disposed on the substrate and define a number of pixel regions. A number of the storage capacitance lines are disposed on the substrate in a direction extending along the scan lines and across the pixel regions, wherein each of the storage capacitance lines is essentially perpendicular to each of the source lines and to form a cross portion. A number of patterned thin films are disposed on the storage capacitance lines and above the cross portion.
Abstract:
An immunoassay cartridge for sensing at least one analyte in a biological sample is disclosed. The immunoassay cartridge comprises a supporting plate, a reaction cavity made within the supporting plate and having at least one analyte-binding molecule immobilized therein, a sample receiving end connected to the reaction cavity to allow the biological sample to flow into the reaction cavity for forming at least one complex of the analyte and the analyte-binding molecule, a first package containing a recognizing molecule, a first channel communicating the first package and the reaction cavity to allow the recognizing molecule to flow into the reaction cavity for forming a first product of the complex and the complex-binding molecule, a second package containing a buffer solution and a second channel communicating the second package and the reaction cavity to allow the buffer solution to flow into the reaction cavity.
Abstract:
A formulation including: an organic semiconducting material; and a carrier liquid including at least one of: a first liquid of the formulas (III) or (II): or mixtures of formulas (III) and (II); and a second liquid of a saturated or unsaturated cyclic hydrocarbylene compound of the formula (I): where the respective R1-8, x, and n are as defined herein, and optionally a tertiary liquid carrier, as defined herein. Also disclosed are semiconducting articles prepared with the formulations as defined herein.
Abstract:
A method for manufacturing TSVs, wherein the method comprises several steps as follows: A stack structure having a substrate and an ILD layer (inter layer dielectric layer) is provided, in which an opening penetrating through the ILD layer and further extending into the substrate is formed. After an insulator layer and a metal barrier layer are formed on the stack structure and the sidewalls of the opening, a top metal layer is then formed on the stack structure to fulfill the opening. A first planarization process stopping on the barrier layer is conducted to remove a portion of the top metal layer. A second planarization process stopping on the ILD layer is subsequently conducted to remove a portion of the metal barrier layer, a portion of the insulator layer and a portion of the top metal layer, wherein the second planarization process has a polishing endpoint determined by a light interferometry or a motor current.