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公开(公告)号:US20210066144A1
公开(公告)日:2021-03-04
申请号:US16556105
申请日:2019-08-29
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Lei Fu , Milind S. Bhagavat , Chia-Hao Cheng
IPC: H01L21/66 , H01L23/00 , H01L21/768
Abstract: Various semiconductor chips with solder capped probe test pads are disclosed. In accordance with one aspect of the present invention, a semiconductor chip is provided that includes a substrate, plural input/output (I/O) structures on the substrate and plural test pads on the substrate. Each of the test pads includes a first conductor pad and a first solder cap on the first conductor pad.
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公开(公告)号:US10930621B2
公开(公告)日:2021-02-23
申请号:US16930761
申请日:2020-07-16
Applicant: Advanced Micro Devices, Inc.
Inventor: Rahul Agarwal , Milind S. Bhagavat
IPC: H01L25/065 , H01L21/78 , H01L23/00 , H01L25/00
Abstract: Various die stacks and methods of creating the same are disclosed. In one aspect, a method of manufacturing is provided that includes mounting a first semiconductor die on a second semiconductor die of a first semiconductor wafer. The second semiconductor die is singulated from the first semiconductor wafer to yield a first die stack. The second semiconductor die of the first die stack is mounted on a third semiconductor die of a second semiconductor wafer. The third semiconductor die is singulated from the second semiconductor wafer to yield a second die stack. The second die stack is mounted on a fourth semiconductor die of a third semiconductor wafer.
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公开(公告)号:US10825692B2
公开(公告)日:2020-11-03
申请号:US16226790
申请日:2018-12-20
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Rahul Agarwal , Milind S. Bhagavat , Ivor Barber , Venkatachalam Valliappan , Yuen Ting Cheng , Guan Sin Chok
IPC: H01L21/322 , H01L29/34 , H01L21/268
Abstract: Various semiconductor chips with gettering regions and methods of making the same are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip that has a first side and a second side opposite the first side. The first side has a plurality of laser ablation craters. Each of the ablation craters has a bottom. A gettering region is in the semiconductor chip beneath the laser ablation craters. The gettering region includes plural structural defects. At least some of the structural defects emanate from at least some of the bottoms of the laser ablation craters.
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公开(公告)号:US11810891B2
公开(公告)日:2023-11-07
申请号:US17189324
申请日:2021-03-02
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Priyal Shah , Milind S. Bhagavat
IPC: H01L23/00
CPC classification number: H01L24/80 , H01L24/03 , H01L24/05 , H01L24/06 , H01L24/08 , H01L2224/0384 , H01L2224/05082 , H01L2224/05118 , H01L2224/05124 , H01L2224/05166 , H01L2224/05184 , H01L2224/05186 , H01L2224/05557 , H01L2224/05647 , H01L2224/05655 , H01L2224/0603 , H01L2224/0614 , H01L2224/06515 , H01L2224/08146 , H01L2224/8034 , H01L2224/8089 , H01L2224/80801 , H01L2224/80906
Abstract: Various chip stacks and methods and structures of interconnecting the same are disclosed. In one aspect, an apparatus is provided that includes a first semiconductor chip that has a first glass layer and plural first groups of plural conductor pads in the first glass layer. Each of the plural first groups of conductor pads is configured to bumplessly connect to a corresponding second group of plural conductor pads of a second semiconductor chip to make up a first interconnect of a plurality interconnects that connect the first semiconductor chip to the second semiconductor chip. The first glass layer is configured to bond to a second glass layer of the second semiconductor chip.
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公开(公告)号:US11715691B2
公开(公告)日:2023-08-01
申请号:US17323454
申请日:2021-05-18
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Milind S. Bhagavat , Rahul Agarwal , Chia-Hao Cheng
IPC: H01L23/52 , H01L23/528 , H01L23/31 , H01L23/522 , H01L23/00 , H01L21/56 , H01L25/065
CPC classification number: H01L23/5283 , H01L21/566 , H01L23/3128 , H01L23/5227 , H01L24/09 , H01L24/17 , H01L25/0655 , H01L2224/0231 , H01L2224/02373 , H01L2224/02379 , H01L2224/02381 , H01L2224/0401 , H01L2924/1206 , H01L2924/1427
Abstract: Various semiconductor chip devices and methods of making the same are disclosed. In one aspect, an apparatus is provided that includes a first redistribution layer (RDL) structure having a first plurality of conductor traces, a first molding layer on the first RDL structure, plural conductive pillars in the first molding layer, each of the conductive pillars including a first end and a second end, a second RDL structure on the first molding layer, the second RDL structure having a second plurality of conductor traces, and wherein some of the conductive pillars are electrically connected between some of the first plurality of conductor traces and some of the second plurality of conductor traces to provide a first inductor coil.
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公开(公告)号:US11676924B2
公开(公告)日:2023-06-13
申请号:US17195046
申请日:2021-03-08
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Priyal Shah , Milind S. Bhagavat , Lei Fu
IPC: H01L23/00
CPC classification number: H01L24/13 , H01L24/11 , H01L2224/10145 , H01L2224/1145 , H01L2224/11462 , H01L2224/11849 , H01L2224/13007 , H01L2224/13014 , H01L2224/13026 , H01L2224/13084 , H01L2224/13111 , H01L2224/13139 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/13164 , H01L2224/13166 , H01L2224/13169 , H01L2224/13172 , H01L2224/13181 , H01L2224/13184 , H01L2924/014 , H01L2924/381
Abstract: Various semiconductor chips and packages are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip that has a side, and plural conductive pillars on the side. Each of the conductive pillars includes a pillar portion that has an exposed shoulder facing away from the semiconductor chip. The shoulder provides a wetting surface to attract melted solder. The pillar portion has a first lateral dimension at the shoulder. A solder cap is positioned on the pillar portion. The solder cap has a second lateral dimension smaller than the first lateral dimension.
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公开(公告)号:US11164807B2
公开(公告)日:2021-11-02
申请号:US16563077
申请日:2019-09-06
Applicant: Advanced Micro Devices, Inc.
Inventor: John Wuu , Samuel Naffziger , Patrick J. Shyvers , Milind S. Bhagavat , Kaushik Mysore , Brett P. Wilkerson
IPC: H01L23/367 , H01L25/00 , H01L25/065 , H01L23/36 , H01L23/373
Abstract: Various semiconductor chip devices with stacked chips are disclosed. In one aspect, a semiconductor chip device is provided. The semiconductor chip device includes a first semiconductor chip that has a floor plan with a high heat producing area and a low heat producing area. At least one second semiconductor chip is stacked on the low heat producing area. The semiconductor chip device also includes means for transferring heat from the high heat producing area.
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公开(公告)号:US11011466B2
公开(公告)日:2021-05-18
申请号:US16367731
申请日:2019-03-28
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Milind S. Bhagavat , Rahul Agarwal , Chia-Hao Cheng
IPC: H01L23/52 , H01L23/528 , H01L23/31 , H01L23/522 , H01L23/00 , H01L21/56 , H01L25/065
Abstract: Various semiconductor chip devices and methods of making the same are disclosed. In one aspect, an apparatus is provided that includes a first redistribution layer (RDL) structure having a first plurality of conductor traces, a first molding layer on the first RDL structure, plural conductive pillars in the first molding layer, each of the conductive pillars including a first end and a second end, a second RDL structure on the first molding layer, the second RDL structure having a second plurality of conductor traces, and wherein some of the conductive pillars are electrically connected between some of the first plurality of conductor traces and some of the second plurality of conductor traces to provide a first inductor coil.
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公开(公告)号:US20210098441A1
公开(公告)日:2021-04-01
申请号:US16586309
申请日:2019-09-27
Applicant: Advanced Micro Devices, Inc.
Inventor: John J. Wuu , Milind S. Bhagavat , Brett P. Wilkerson , Rahul Agarwal
IPC: H01L25/18 , H01L23/48 , H01L23/528 , H01L23/00
Abstract: Systems, apparatuses, and methods for routing traffic through vertically stacked semiconductor dies are disclosed. A first semiconductor die has a second die stacked vertically on top of it in a three-dimensional integrated circuit. The first die includes a through silicon via (TSV) interconnect that does not traverse the first die. The first die includes one or more metal layers above the TSV, which connect to a bonding pad interface through a bonding pad via. If the signals transferred through the TSV of the first die are shared by the second die, then the second die includes a TSV aligned with the bonding pad interface of the first die. If these signals are not shared by the second die, then the second die includes an insulated portion of a wafer backside aligned with the bonding pad interface.
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公开(公告)号:US10943880B2
公开(公告)日:2021-03-09
申请号:US16414389
申请日:2019-05-16
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Priyal Shah , Milind S. Bhagavat , Lei Fu
IPC: H01L23/00
Abstract: Various semiconductor chips and packages are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip that has a side, and plural conductive pillars on the side. Each of the conductive pillars includes a pillar portion that has an exposed shoulder facing away from the semiconductor chip. The shoulder provides a wetting surface to attract melted solder. The pillar portion has a first lateral dimension at the shoulder. A solder cap is positioned on the pillar portion. The solder cap has a second lateral dimension smaller than the first lateral dimension.
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