公开(公告)号：US12181472B2

公开(公告)日：2024-12-31

申请号：US16621185

申请日：2018-06-12

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Li ,  Ji Qi ,  Jun Tian

IPC: G01N33/543 ,  G06T7/00

Abstract: Among other things, the present invention is related to devices and methods of performing biological and chemical assays, such as but not limited to immunoassays and nucleic assay acid, particularly the homogeneous assay that does not use the step of wash and that is fast (e.g. 60 seconds from dropping a sample to displaying results).

公开(公告)号：US20240159999A1

公开(公告)日：2024-05-16

申请号：US18539243

申请日：2023-12-13

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Yuechang Zhang ,  Wu Chou ,  Mingquan Wu ,  Xing Li ,  Jun Tian

IPC: G02B21/34 ,  G01N33/543

CPC classification number: G02B21/34 ,  G01N33/54386 ,  G01N33/5094 ,  G01N2496/05

Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.

公开(公告)号：US11415504B2

公开(公告)日：2022-08-16

申请号：US17175585

申请日：2021-02-12

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Jun Tian ,  Wu Chou

IPC: G01N21/03 ,  G01N1/28 ,  G01N21/25 ,  G01N21/64 ,  G01N33/49

Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between two plates.

公开(公告)号：US20200033579A1

公开(公告)日：2020-01-30

申请号：US16526864

申请日：2019-07-30

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Yuechang Zhang ,  Wu Chou ,  Mingquan Wu ,  Xing Li ,  Jun Tian

IPC: G02B21/34 ,  G01N33/543

Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.

公开(公告)号：US12120407B2

公开(公告)日：2024-10-15

申请号：US17896973

申请日：2022-08-26

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Qi ,  Jun Tian ,  Wei Dong

IPC: H04N23/51 ,  G01N21/84 ,  H04N23/55 ,  H04N23/56 ,  H04N23/57

CPC classification number: H04N23/51 ,  G01N21/8483 ,  H04N23/55 ,  H04N23/56 ,  H04N23/57

Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of an image-based assay. One aspect of the present invention is to sandwich a sample between two plates and add reference marks in the sample areas of the plates, with at least one of the geometric and/optical properties of the reference marks being predetermined and known, and taking images of the sample with the reference marks, and applying a machine learning model in the analysis of the image-based assay.

公开(公告)号：US12007320B2

公开(公告)日：2024-06-11

申请号：US18215302

申请日：2023-06-28

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wu Chou ,  Xing Li ,  Hongbing Li ,  Yuecheng Zhang ,  Mingquan Wu ,  Wei Ding ,  Jun Tian

IPC: G01N15/1433 ,  G06N20/00 ,  G06T7/00 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62

CPC classification number: G01N15/1433 ,  G06N20/00 ,  G06T7/0012 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62 ,  G06T2207/10056 ,  G06T2207/30004 ,  G06T2207/30024 ,  G06T2207/30204

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.

公开(公告)号：US11885952B2

公开(公告)日：2024-01-30

申请号：US16526864

申请日：2019-07-30

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Yuecheng Zhang ,  Wu Chou ,  Mingquan Wu ,  Xing Li ,  Jun Tian

IPC: G02B21/34 ,  G01N33/543 ,  G01N33/50

CPC classification number: G02B21/34 ,  G01N33/54386 ,  G01N33/5094 ,  G01N2496/05

Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.

公开(公告)号：US11719618B2

公开(公告)日：2023-08-08

申请号：US17268847

申请日：2019-08-28

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Wu Chou ,  Jun Tian ,  Yuecheng Zhang ,  Mingquan Wu ,  Xing Li

IPC: G01N15/14 ,  G02B21/34 ,  G06T7/00 ,  G06V10/34 ,  G06V10/44 ,  G06V20/69 ,  G06F18/2413 ,  G06V10/764 ,  G06V10/82 ,  G01N15/10

CPC classification number: G01N15/1475 ,  G02B21/34 ,  G06F18/24143 ,  G06T7/0012 ,  G06V10/34 ,  G06V10/44 ,  G06V10/454 ,  G06V10/764 ,  G06V10/82 ,  G06V20/69 ,  G01N2015/1006 ,  G06T2207/30004

Abstract: One aspect of the present invention is to provide systems and methods that improve the accuracy of an assay that comprise at least one or more parameters each having a random error.

公开(公告)号：US11674883B2

公开(公告)日：2023-06-13

申请号：US17565115

申请日：2021-12-29

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Wu Chou ,  Jun Tian ,  Yuecheng Zhang ,  Mingquan Wu ,  Xing Li

IPC: G06T1/00 ,  G01N15/14 ,  G06N20/00 ,  G01N1/28 ,  G06N3/08

CPC classification number: G01N15/1484 ,  G01N1/2813 ,  G06N3/08 ,  G06N20/00 ,  G06T1/0014 ,  G01N2001/282

Abstract: The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.

公开(公告)号：US20220341842A1

公开(公告)日：2022-10-27

申请号：US17858931

申请日：2022-07-06

Applicant: Essenlix Corporation

Inventor： Stephen Y. CHOU ,  Wei DING ,  Ji QI ,  Jun Tian ,  Wu Chou

IPC: G01N21/03 ,  G01N1/28 ,  G01N21/25 ,  G01N21/64 ,  G01N33/49

Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.