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11.
公开(公告)号:US09799784B2
公开(公告)日:2017-10-24
申请号:US14209740
申请日:2014-03-13
Applicant: FIRST SOLAR, INC
Inventor: Arnold Allenic , Zhigang Ban , Benyamin Buller , Markus Gloeckler , Benjamin Milliron , Xilin Peng , Rick C. Powell , Jigish Trivedi , Oomman K. Varghese , Jianjun Wang , Zhibo Zhao
IPC: H01L31/0296 , H01L31/18 , H01L31/0392 , H01L31/073
CPC classification number: H01L31/0296 , H01L31/02963 , H01L31/02966 , H01L31/03925 , H01L31/073 , H01L31/18 , H01L31/1832 , Y02E10/543
Abstract: A photovoltaic device is disclosed including at least one Cadmium Sulfide Telluride (CdSxTe1−x) layer as are methods of forming such a photovoltaic device.
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12.Method and apparatus providing multi-step deposition of thin film layer 有权
Title translation: 提供薄膜层多步沉积的方法和装置公开(公告)号:US09337376B2
公开(公告)日:2016-05-10
申请号:US14551707
申请日:2014-11-24
Applicant: First Solar, Inc.
Inventor: Arnold Allenic , Zhigang Ban , John Barden , Benjamin Milliron , Rick C. Powell
CPC classification number: H01L31/1828 , C23C14/0629 , C23C14/228 , C23C14/243 , C23C14/246 , H01L21/02557 , H01L21/02562 , H01L21/0257 , H01L21/02573 , H01L21/02581 , H01L21/02617 , H01L21/02631 , H01L31/02963
Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
Abstract translation: 一种用于在衬底上蒸发并沉积含碲的半导体材料的多级方法和装置。
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13.In situ substrate detection for a processing system using infrared detection 有权
Title translation: 使用红外检测的处理系统的原位底物检测公开(公告)号:US09151597B2
公开(公告)日:2015-10-06
申请号:US13763827
申请日:2013-02-11
Applicant: FIRST SOLAR, INC.
Inventor: Benjamin Milliron , Dale Roberts , David Berger , William Logan
IPC: G01B11/14 , H01L21/66 , G01B11/02 , H01L21/67 , H01L21/677
CPC classification number: G01B11/14 , G01B11/028 , H01L21/67248 , H01L21/67259 , H01L21/6776 , H01L22/12
Abstract: Infrared detection is used to monitor the temperature within a vapor transport deposition processing chamber. Changes in temperature that occur when a substrate passes an infrared detector are detected and used to precisely locate a position of the substrate within the chamber. Position correction of the substrate can also be implemented.
Abstract translation: 红外检测用于监测蒸气输送沉积处理室内的温度。 检测出基板通过红外检测器时发生的温度变化,并用于精确定位腔室内基板的位置。 也可以实现基板的位置校正。
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14.METHOD AND APPARATUS PROVIDING MULTI-STEP DEPOSITION OF THIN FILM LAYER 有权
Title translation: 提供薄膜层的多步沉积的方法和装置公开(公告)号:US20150079725A1
公开(公告)日:2015-03-19
申请号:US14551707
申请日:2014-11-24
Applicant: First Solar, Inc.
Inventor: Arnold Allenic , Zhigang Ban , John Barden , Benjamin Milliron , Rick C. Powell
IPC: H01L31/18 , H01L21/02 , H01L31/0296
CPC classification number: H01L31/1828 , C23C14/0629 , C23C14/228 , C23C14/243 , C23C14/246 , H01L21/02557 , H01L21/02562 , H01L21/0257 , H01L21/02573 , H01L21/02581 , H01L21/02617 , H01L21/02631 , H01L31/02963
Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
Abstract translation: 一种用于在衬底上蒸发并沉积含碲的半导体材料的多级方法和装置。
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15.Method and apparatus providing multi-step deposition of thin film layer 有权
Title translation: 提供薄膜层多步沉积的方法和装置公开(公告)号:US08921147B2
公开(公告)日:2014-12-30
申请号:US13966663
申请日:2013-08-14
Applicant: First Solar, Inc.
Inventor: Arnold Allenic , Zhigang Ban , John Barden , Benjamin Milliron , Rick C. Powell
CPC classification number: H01L31/1828 , C23C14/0629 , C23C14/228 , C23C14/243 , C23C14/246 , H01L21/02557 , H01L21/02562 , H01L21/0257 , H01L21/02573 , H01L21/02581 , H01L21/02617 , H01L21/02631 , H01L31/02963
Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
Abstract translation: 一种用于在衬底上蒸发并沉积含碲的半导体材料的多级方法和装置。
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16.HIGH EFFICIENCY PHOTOVOLTAIC DEVICE EMPLOYING CADMIUM SULFIDE TELLURIDE AND METHOD OF MANUFACTURE 有权
Title translation: 使用堇青石的高效光伏器件及其制造方法公开(公告)号:US20140261688A1
公开(公告)日:2014-09-18
申请号:US14209740
申请日:2014-03-13
Applicant: FIRST SOLAR, INC
Inventor: Arnold Allenic , Zhigang Ban , Benyamin Buller , Markus Gloeckler , Benjamin Milliron , Xilin Peng , Rick C. Powell , Jigish Trivedi , Oomman K. Varghese , Jianjun Wang , Zhibo Zhao
IPC: H01L31/0296 , H01L31/18
CPC classification number: H01L31/0296 , H01L31/02963 , H01L31/02966 , H01L31/03925 , H01L31/073 , H01L31/18 , H01L31/1832 , Y02E10/543
Abstract: A photovoltaic device is disclosed including at least one Cadmium Sulfide Telluride (CdSxTe1-x) layer as are methods of forming such a photovoltaic device.
Abstract translation: 公开了包含至少一种硫镉碲化镉(CdSxTe1-x)层的光伏器件,以及形成这种光伏器件的方法。
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17.METHOD AND APPARATUS PROVIDING MULTI-STEP DEPOSITION OF THIN FILM LAYER 有权
Title translation: 提供薄膜层的多步沉积的方法和装置公开(公告)号:US20140051206A1
公开(公告)日:2014-02-20
申请号:US13966663
申请日:2013-08-14
Applicant: First Solar, Inc
Inventor: Arnold Allenic , Zhigang Ban , John Barden , Benjamin Milliron , Rick C. Powell
IPC: H01L31/18
CPC classification number: H01L31/1828 , C23C14/0629 , C23C14/228 , C23C14/243 , C23C14/246 , H01L21/02557 , H01L21/02562 , H01L21/0257 , H01L21/02573 , H01L21/02581 , H01L21/02617 , H01L21/02631 , H01L31/02963
Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
Abstract translation: 一种用于在衬底上蒸发并沉积含碲的半导体材料的多级方法和装置。
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18.IN SITU SUBSTRATE DETECTION FOR A PROCESSING SYSTEM USING INFRARED DETECTION 有权
Title translation: 用于使用红外检测的处理系统的基站检测公开(公告)号:US20130206065A1
公开(公告)日:2013-08-15
申请号:US13763827
申请日:2013-02-11
Applicant: FIRST SOLAR, INC.
Inventor: Benjamin Milliron , Dale Roberts , David Berger , William Logan
IPC: G01B11/14
CPC classification number: G01B11/14 , G01B11/028 , H01L21/67248 , H01L21/67259 , H01L21/6776 , H01L22/12
Abstract: Infrared detection is used to monitor the temperature within a vapor transport deposition processing chamber. Changes in temperature that occur when a substrate passes an infrared detector are detected and used to precisely locate a position of the substrate within the chamber. Position correction of the substrate can also be implemented.
Abstract translation: 红外检测用于监测蒸气输送沉积处理室内的温度。 检测出基板通过红外检测器时发生的温度变化,并用于精确定位腔室内基板的位置。 也可以实现基板的位置校正。
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