摘要:
An apparatus and method for growing large diameter silicon crystals using the Czochralski (Cz) method, wherein the neck section of the crystal is significantly strengthened to eliminate the risk of breakage in the neck section, by providing a heat shield assembly which is located adjacent to the neck section and ascends in conjunction therewith to force the cooling gas directly onto the neck section of the silicon ingot.
摘要:
In a color image forming apparatus, an image retainer, a charger, a plurality of developing devices and a cleaner are made in one unit. The unit is dismountably supported in a housing so that the unit can be moved out from a first position at which the unit is set in the housing to a second position at which jam disposition is conducted. When the unit means is placed at the second position, a part of the apparatus is used to cover the image retaining surface at the transfer section.
摘要:
An improved developing device includes a rotatable sleeve, a reservoir from which developer is available for image development, a hopper containing fresh replenishment toner, a plate for scraping used developer from the sleeve and for directing it into a conduit in which it is mixed with fresh replenishment toner, and at least an opening in the conduit from which replenished developer comprising used developer mixed with fresh toner is returned to the reservoir in a substantially uniformly mixed condition for use in subsequent image development.
摘要:
A process for preparation of photoconductive powders of a cadmium sulfide type material comprising firing cadmium sulfide type material in an oxygen-containing atmosphere in the presence of a dispersant at a temperature at which the substance to be fired does not melt. The fired substance is water washed in order to remove the dispersant therefrom, if it is water soluble.
摘要:
A projector includes a light modulation section provided with a plurality of pixels arranged, and adapted to modulate light from a light source by the pixel, and when executing a keystone distortion correction on an image to be projected on a projection surface in response to an operation of an operation section, a maximum pixel area, which is a maximum area in which an image of the light modulation section is formed, and an image forming area in which the image to be the object of the keystone distortion correction is formed are projected simultaneously on the projection surface.
摘要:
To provide a processor capable of achieving high processing efficiency by performing the exclusive control between task processing and interrupt handling properly even in a multiprocessor. An interrupt processor that includes a plurality of unit processors, in which at least of the plurality of unit processors is capable of performing interrupt handling requested from the outside is configured such that the unit processor P1 of the unit processors P0 to P3 comprises an purge inhibit flag 106 for causing the unit processor P1 to enter a lock state where the purge of the task is being inhibited, a hardware semaphore unit 13 for inhibiting other unit processors from accessing a predetermined region in memory accessed by the unit processor P1 after the unit processor P1 is brought into the lock state, and an interrupt control unit 11 for inhibiting the interrupt processor from performing the interrupt handling during the execution of exclusive control.
摘要:
The present invention provides a method for reusing a delaminated wafer, which is a method for applying reprocessing that is at least polishing to a delaminated wafer 17 byproduced when manufacturing an SOI wafer based on an ion implantation delamination method and thereby again reusing the delaminated wafer 17 as a bond wafer 21 in an SOI wafer manufacturing process, wherein, at least, a CZ wafer 11 used as the bond wafer is a low-defect wafer whose entire surface is formed of an N region, and an RTA treatment is carried out in the reprocessing with respect to the delaminated wafer 17 at a higher temperature than a temperature in formation of a thermal oxide film 12 performed with respect to the bond wafer in the SOI wafer manufacturing process. As a result, there can be provided the method for reusing a delaminated wafer which does not induce a bonding failure or a reduction in quality of an SOI layer even if the delaminated wafer byproduced when the CZ wafer having a large diameter of 200 mm or above is used as the bond wafer to fabricate the SOI wafer based on the ion implantation delamination method is repeatedly reused as the bond wafer.
摘要:
A processor comprises a plurality of processor sections that process a task or a thread, wherein the processor includes a dedicated processor section that exclusively processes a predetermined high priority processing, a general-purpose processor section that performs processing other than the predetermined high priority processing and a high priority processing control section that causes the dedicated processor section to process the predetermined high priority processing.
摘要:
An inkjet recording head for ejecting ink, having a plurality of piezoelectric sidewalls to form a plurality of ink channels; a piezoelectric bottom plate; and a plurality of electrodes All of the ink channels are divided into two or more groups of ink channels composed of ink channels between which at least one ink channel is sandwiched; wherein an ink ejection operation is performed successively in a time-sharing mode for each of the group of ink channels, while satisfying the condition of |CTC+CTE|≦10 (%); where a crosstalk between ink channels in one group due to a compliance ratio of the sidewalls to the ink in the ink channel is CTC; and a crosstalk between ink channels in one group due to a leak of electric field caused by electric voltage applied to the electrodes is CTE.
摘要:
A method of introducing nitrogen into a melt for use in producing a nitrogen-doped silicon single crystal by the Czochralski method includes adding a silicon material to a vessel, such as a quartz crucible, adding a nitrogen-containing powder, preferably silicon nitride powder, to the vessel, and heating the vessel for a time sufficient to melt the silicon material and to dissolve the nitrogen-containing in the silicon material in order to form the melt. A nitrogen-doped silicon single crystal is then produced from the melt by the Czochralski method by pulling the silicon single crystal from the melt with a seed crystal.