公开(公告)号：US10903396B1

公开(公告)日：2021-01-26

申请号：US16545615

申请日：2019-08-20

Applicant: International Business Machines Corporation ,  Cambridge Enterprise Ltd.

Inventor： Michael Engel ,  Mathias B. Steiner ,  Andrea C. Ferrari ,  Antonio Lombardo ,  Matteo Barbone ,  Mete Atature ,  Carmen Palacios Berraquero ,  Dhiren Manji Kara ,  Ilya Goykhman

IPC: H01L29/06 ,  H01L33/46 ,  H01L33/06 ,  H01L33/00 ,  H01L33/38

Abstract: A quantum light emitting device includes a carrier substrate, an insulator, a first semiconductor device, a second semiconductor device, a first contact, and a second contact. The quantum light device includes a carrier substrate comprising silicon and configured with an electrically insulating top surface. The quantum light device also includes an insulator configured on the carrier substrate. The quantum light device includes a first semiconductor structure comprising a first semiconductor material configured on the insulator. Further, the quantum light device includes a second semiconductor structure comprising a second semiconductor material configured on the insulator, with an overlap region of the second semiconductor structure electrically coupling with the first semiconductor structure, a dimensional characteristic of the overlap region being configured to limit a photon emission from the overlap region to a single photon.

公开(公告)号：US10605826B2

公开(公告)日：2020-03-31

申请号：US16010500

申请日：2018-06-17

Applicant: International Business Machines Corporation ,  Universidade Federal de Minas Gerais (UFMG)

Inventor： Michael Engel ,  Mathias Steiner ,  Ado Jorio de Vasconcelos ,  Cassiano Rabelo ,  Luiz Gustavo Cancado ,  Hudson Miranda

IPC: G01Q40/00 ,  G01Q60/18 ,  G01J3/44

Abstract: A calibration apparatus for a tip-enhanced Raman microscope includes a substrate; a two-dimensional Raman scatterer that is mounted on an upper surface of the substrate; and a well-defined topographic structure that is formed at the upper surface of the substrate. The topographic structure may include convex geometric shapes such as triangles and squares arranged in one or more periodic lattices. Calibration is via adjusting a focal length of a laser beam until a signal from a spectrometer repeatedly exhibits a stepped response when a focal point of the laser beam traverses an edge of a two-dimensional Raman scatterer, then adjusting the relative lateral positions of a scanning probe microscope probe tip and the focal point until the signal from the spectrometer and a signal from the scanning probe microscope repeatedly change within an acceptable time delay while the focal point and the probe tip traverse edges of the topographic structure.

公开(公告)号：US10546924B2

公开(公告)日：2020-01-28

申请号：US15426677

申请日：2017-02-07

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Sarunya Bangsaruntip ,  Michael Engel ,  Shu-Jen Han

IPC: H01L29/06 ,  H01L21/28 ,  H01L51/05 ,  H01L29/423 ,  H01L29/66 ,  H01L29/78 ,  H01L51/00 ,  H01L21/285 ,  H01L21/02

Abstract: A field effect transistor including a dielectric layer on a substrate, a nano-structure material (NSM) layer on the dielectric layer, a source electrode and a drain electrode formed on the NSM layer, a gate dielectric formed on at least a portion of the NSM layer between the source electrode and the drain electrode, a T-shaped gate electrode formed between the source electrode and the drain electrode, where the NSM layer forms a channel of the FET, and a doping layer on the NSM layer extending at least from the sidewall of the source electrode to a first sidewall of the gate dielectric, and from a sidewall of the drain electrode to a second sidewall of the gate dielectric.

公开(公告)号：US20190383854A1

公开(公告)日：2019-12-19

申请号：US16010500

申请日：2018-06-17

Applicant: International Business Machines Corporation ,  Universidade Federal de Minas Gerais (UFMG)

Inventor： Michael Engel ,  Mathias Steiner ,  Ado Jorio de Vasconcelos ,  Cassiano Rabelo ,  Luiz Gustavo Cancado ,  Hudson Miranda

IPC: G01Q40/00 ,  G01Q60/18 ,  G01J3/44

Abstract: A calibration apparatus for a tip-enhanced Raman microscope includes a substrate; a two-dimensional Raman scatterer that is mounted on an upper surface of the substrate; and a well-defined topographic structure that is formed at the upper surface of the substrate. The topographic structure may include convex geometric shapes such as triangles and squares arranged in one or more periodic lattices. Calibration is via adjusting a focal length of a laser beam until a signal from a spectrometer repeatedly exhibits a stepped response when a focal point of the laser beam traverses an edge of a two-dimensional Raman scatterer, then adjusting the relative lateral positions of a scanning probe microscope probe tip and the focal point until the signal from the spectrometer and a signal from the scanning probe microscope repeatedly change within an acceptable time delay while the focal point and the probe tip traverse edges of the topographic structure.

公开(公告)号：US20180275056A1

公开(公告)日：2018-09-27

申请号：US15469007

申请日：2017-03-24

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Michael Engel ,  Jeannette M. Garcia ,  Ricardo L. Ohta ,  Ademir F. Silva ,  Mathias B. Steiner ,  Jaione Tirapu Azpiroz ,  Thomas G. Zimmerman

IPC: G01N21/64 ,  G01V8/12

CPC classification number: G01N21/645 ,  G01N21/643 ,  G01N21/6452 ,  G01N2021/0118 ,  G01N2021/7793 ,  G01N2201/0221

Abstract: A portable optical measurement system is provided for performing metal trace analysis on a liquid sample. The system includes a sample holder for holding an analysis substrate that includes the liquid sample during the metal trace analysis. The system further includes an ultraviolet (UV) light source for emitting ultraviolet light illuminating the liquid sample. The system also includes an optical sensor for detecting radiation emanating from the liquid sample and converting the detected radiation into an electrical signal. The system additionally includes a microcontroller for processing the electrical signal. The system further includes an external interface for transmitting the processed electrical signal to an external device.

公开(公告)号：US20180151668A1

公开(公告)日：2018-05-31

申请号：US15362191

申请日：2016-11-28

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Michael Engel ,  Mathias B. Steiner ,  Jaione Tirapu Azpiroz

IPC: H01L29/06 ,  H01L29/41 ,  H01L29/16 ,  H01L51/10 ,  H01L51/00 ,  H01L21/02

CPC classification number: H01L21/02376 ,  B82Y40/00 ,  H01L51/0023 ,  H01L51/0045 ,  H01L51/0048 ,  H01L51/102 ,  Y10S977/742

Abstract: A method of positioning nanomaterials that includes forming a set of electrodes on a substrate, and covering the electrodes and substrate with a single layer of guiding dielectric material. The method may continue with patterning the guiding dielectric to provide dielectric guide features, wherein an exposed portion of the substrate between the dielectric guide features provides a deposition surface. A liquid medium containing at least one nanostructure is applied to the guiding dielectric features and the deposition surface. An electric field produced by the electrodes that is attenuated by the dielectric guide features creates an attractive force that guides the nanostructures to the deposition surface.

公开(公告)号：US09702748B2

公开(公告)日：2017-07-11

申请号：US14944766

申请日：2015-11-18

Applicant: International Business Machines Corporation

Inventor： Michael Engel ,  Rodrigo Neumann Barros Ferreira ,  Mathias Steiner

IPC: G01N27/08 ,  G01F1/708 ,  H01L43/04 ,  H01L43/06 ,  H01L43/10

CPC classification number: G01R33/072 ,  G01F1/708 ,  G01F1/7088 ,  G01N27/745 ,  G01R33/07 ,  G01R33/1269 ,  H01L43/04 ,  H01L43/06 ,  H01L43/10 ,  H01L43/14

Abstract: A method of detecting a particle comprises magnetizing a particle using an AC magnetic field; generating an AC voltage in a sensing device having a conductive substantially 2-dimensional lattice structure from the magnetized particle; superimposing a DC magnetic field on the generated AC voltage in the sensing device; and measuring an AC Hall voltage at the sensing device.

公开(公告)号：US09412815B2

公开(公告)日：2016-08-09

申请号：US14496048

申请日：2014-09-25

Applicant: International Business Machines Corporation ,  Taiwan Bluestone Technology Ltd. ,  Karlsruhe Institute of Technology

Inventor： Phaedon Avouris ,  Christos Dimitrakopoulos ,  Damon B. Farmer ,  Mathias B. Steiner ,  Michael Engel ,  Ralph Krupke ,  Yu-Ming Lin

IPC: H01L29/06 ,  B82Y40/00 ,  H01L21/02 ,  B82Y10/00 ,  H01L29/16 ,  H01L29/41 ,  H01L51/00 ,  H01L51/10 ,  H01L29/45 ,  H01L51/05

CPC classification number: H01L29/0669 ,  B82Y10/00 ,  B82Y40/00 ,  H01L21/02376 ,  H01L29/0673 ,  H01L29/1606 ,  H01L29/413 ,  H01L29/45 ,  H01L51/0048 ,  H01L51/0512 ,  H01L51/102 ,  Y10S977/742

Abstract: A semiconductor device includes a substrate having at least one electrically insulating portion. A first graphene electrode is formed on a surface of the substrate such that the electrically insulating portion is interposed between a bulk portion of the substrate and the first graphene electrode. A second graphene electrode formed on the surface of the substrate. The electrically insulating portion of the substrate is interposed between the bulk portion of the substrate and the second graphene electrode. The second graphene electrode is disposed opposite the first graphene electrode to define an exposed substrate area therebetween.

Abstract translation: 半导体器件包括具有至少一个电绝缘部分的衬底。 第一石墨烯电极形成在基板的表面上，使得电绝缘部分插入在基板的主体部分和第一石墨烯电极之间。 形成在基板表面上的第二个石墨烯电极。 基板的电绝缘部分插入在基板的主体部分和第二石墨烯电极之间。 第二石墨烯电极与第一石墨烯电极相对设置，以限定其间的暴露的基板区域。

公开(公告)号：US20140291606A1

公开(公告)日：2014-10-02

申请号：US13852798

申请日：2013-03-28

Applicant: International Business Machines Corporation ,  Taiwan Bluestone Technology LTD. ,  Karlsruhe Institute of Technology

Inventor： Phaedon Avouris ,  Christos Dimitrakopoulos ,  Damon B. Farmer ,  Mathias B. Steiner ,  Michael Engel ,  Ralph Krupke ,  Yu-Ming Lin

IPC: H01L29/06 ,  H01L21/02

CPC classification number: H01L29/0669 ,  B82Y10/00 ,  B82Y40/00 ,  H01L21/02376 ,  H01L29/0673 ,  H01L29/1606 ,  H01L29/413 ,  H01L29/45 ,  H01L51/0048 ,  H01L51/0512 ,  H01L51/102 ,  Y10S977/742

Abstract: A semiconductor device includes a substrate having at least one electrically insulating portion. A first graphene electrode is formed on a surface of the substrate such that the electrically insulating portion is interposed between a bulk portion of the substrate and the first graphene electrode. A second graphene electrode formed on the surface of the substrate. The electrically insulating portion of the substrate is interposed between the bulk portion of the substrate and the second graphene electrode. The second graphene electrode is disposed opposite the first graphene electrode to define an exposed substrate area therebetween.

Abstract translation: 半导体器件包括具有至少一个电绝缘部分的衬底。 第一石墨烯电极形成在基板的表面上，使得电绝缘部分插入在基板的主体部分和第一石墨烯电极之间。 形成在基板表面上的第二个石墨烯电极。 基板的电绝缘部分插入在基板的主体部分和第二石墨烯电极之间。 第二石墨烯电极与第一石墨烯电极相对设置，以限定其间的暴露的基板区域。

公开(公告)号：US20220011212A1

公开(公告)日：2022-01-13

申请号：US16923180

申请日：2020-07-08

Applicant: International Business Machines Corporation

Inventor： Michael Engel ,  Filipe Viana Ferreira ,  Rodrigo Neumann Barros Ferreira ,  Ronaldo Giro ,  Mathias Steiner

IPC: G01N13/02 ,  G01Q60/28

Abstract: Aspects of the invention include determining, by a first AFM tip, a first snap-off force of a solid surface immersed in a first fluid, determining, by a second AFM tip, a second snap-off force, determining, by a third AFM tip, a third snap-off force, determining, by the first AFM tip, a fourth snap-off force of a droplet of the first fluid immersed in the second fluid on the solid surface, determining, by the second AFM tip, a fifth snap-off force, determining, by the third AFM tip, a sixth snap-off force, determining a first capillary force for first AFM tip and first droplet based on first snap-off force and fourth snap-off force, determining a second capillary force for second AFM tip and first droplet and a third capillary force for third AFM tip and first droplet, and determining interfacial tension between first fluid and second fluid based on the capillary forces.