摘要:
A circuit arrangement for detecting voltage changes, comprising supply terminals configured to apply a first potential and a second potential, a first oscillator and a second oscillator, which are operated with the first potential and the second potential, a voltage dependence of the frequency of the first oscillator differing from a voltage dependence of the frequency of the second oscillator, a first evaluation circuit configured to evaluate the frequency of the first oscillator and a second evaluation circuit configured to evaluate the frequency of the second oscillator, and a comparison circuit configured to compare a value based on the evaluated frequencies of the first oscillator and of the second oscillator with a predetermined threshold value, and to output a voltage change signal indicating an impermissible voltage change between the first potential and the second potential depending on the result of the comparison.
摘要:
One or more embodiments relate to an apparatus comprising: a first transistor including a fin; and a second transistor including a fin, the fin of the first transistor having a lower charge carrier mobility than the fin of the second transistor.
摘要:
One or more embodiments relate to a static random access memory cell comprising: a first inverter including a first n-channel pull-down transistor coupled between a first node and a ground voltage; a second inverter including a second n-channel pull-down transistor coupled between a second node and the ground voltage; a first n-channel access transistor coupled between a first bit line and the first node of the first inverter, a fin of the first n-channel access transistor having a lower charge carrier mobility than a fin of the first n-channel pull-down transistor; and a second n-channel access transistor coupled between a second bit line and the second node of the second inverter, a fin of the second n-channel access transistor having a lower charge carrier mobility than a fin of the second n-channel pull-down transistor.
摘要:
In a first embodiment, a multi-fin component arrangement has a plurality of multi-fin component partial arrangements. Each of the multi-fin component partial arrangements has a plurality of electronic components, which electronic components have a multi-fin structure. At least one multi-fin component partial arrangement has at least one dummy structure, which at least one dummy structure is formed between at least two of the electronic components formed in the at least one multi-fin component partial arrangement. The dummy structure is formed in such a way that electrical characteristics of the electronic components formed in the multi-fin component partial arrangements are adapted to one another.
摘要:
Nonvolatile memory cell, having a first resistor that is electrically programmable in a nonvolatile fashion, a second resistor that is electrically programmable in a nonvolatile fashion, a first leakage current reducing element connected between the first resistor and an operating potential, and a second leakage current reducing element connected between the second resistor and the operating potential.
摘要:
Nonvolatile memory cell, having a first resistor that is electrically programmable in a nonvolatile fashion, a second resistor that is electrically programmable in a nonvolatile fashion, a first leakage current reducing element connected between the first resistor and an operating potential, and a second leakage current reducing element connected between the second resistor and the operating potential.
摘要:
A method and circuit arrangement for determining performance of a digital circuit to a critical degree by the transit time of signals of the longest signal path, also called the critical path. Since the signal transit time is influenced by the operating voltage, by regulating the operating voltage, to compensate for the effects caused by temperature and process fluctuations on the signal transit time in the digital circuit. In particular, the operating voltage can be regulated as a function of the signal transit time in such a way that a required minimum operating frequency can always be achieved. To determine signal transit time, the digital circuit has associated with it a number of replicas of the critical path in the digital circuit upon which the signal transit time is determined. In order to determine the transit time, the signal path replicas are exposed to the same operating conditions as the digital circuit. Also, to allow a safety margin to be obtained, the signal path replicas have additional circuit elements that further slow down the signal transit times on the signal path replicas. Further, the mean of the transit times on the signal path replicas is determined.
摘要:
A method of fabricating an integrated circuit including arranging a plurality of cells to form a desired floor plan of the integrated circuit, wherein each cell comprises at least one transistor, forming a plurality of circuit constituents from the plurality of cells of the floor plan, wherein each circuit constituent comprises at least one cell and belongs to one of a plurality circuit constituent types, and applying mechanical stress to channel regions of the at least one transistor of each cell based on the circuit constituent type of the circuit constituent to which the cell belongs.
摘要:
A memory element comprises a resistance element having a first resistance value in a first state and a second resistance value in a second state, it being possible to convert the resistance element from the first state into the second state and from the second state into the first state and the first resistance value and the second resistance value being different, a current generating device, coupled to a first terminal of the resistance element, the current generating device being designed to generate a current with a first amplitude through the resistance element when a predetermined potential is present at a second terminal of the resistance element, in order to convert the resistance element into the first state for setting the first resistance value, or to generate a current with a second amplitude through the resistance element when the predetermined potential is present at the second terminal of the resistance element, in order to convert the resistance element into the second state for setting the second resistance value, the first resistance value representing a first memory state and the second resistance value representing a second memory state.
摘要:
The non-volatile memory cell has a volatile memory means for storing an item of binary information. Furthermore, the memory cell comprises only a single programmable resistance element for non-volatile saving of the stored information and a means for saving the information in the resistance element. A means for retrieving the saved information is additionally present.