Abstract:
An integrated circuit (IC) configurable to perform adaptive thermal ceiling control in a per-functional-block manner, an associated main circuit, an associated electronic device and an associated thermal control method are provided. The IC may include a plurality of hardware circuits arranged to perform operations of a first functional block, and at least one thermal control circuit. At least one temperature sensor is coupled with the first functional block to detect temperature and to generate at least one temperature sensing result of the first functional block. The thermal control circuit performs thermal control on the first functional block to prevent the first functional block from overheating and inducing abnormal function operations, by monitoring the temperature sensing result and by trying to prevent the temperature sensing result from exceeding first temperature upper-limit, wherein the first temperature upper-limit is configurable with respect to per-functional-block thermal operation capability of the first functional block.
Abstract:
A microelectronic package includes a packaging substrate having a chip mounting surface; a chip mounted on the chip mounting surface of the packaging substrate with the chip's active surface facing down to the chip mounting surface; a plurality of input/output (I/O) pads distributed on the active surface of the chip; and a discrete passive element mounted on the active surface of the chip. The discrete passive element may be a decoupling capacitor, a resistor, or an inductor.
Abstract:
The present invention provides a method for flip chip packaging co-design. The method comprises steps of: providing an I/O pad information of a chip and a connection information of a PCB; performing a first I/O pad placement according to the I/O pad information of the chip and the connection information of the PCB; utilizing a RDL routing analysis device to perform a bump pad pitch analysis for the first I/O pad placement of the chip to generate a bump pad pitch analysis result; performing a bump pad planning for a package according to the bump pad pitch analysis result to generate a bump pad planning result; and performing a second I/O pad placement for the chip according to the bump pad planning result to generate an I/O pad placement result.
Abstract:
The present invention provides a flip chip scheme and a method of forming the flip chip scheme. The flip chip scheme comprises: a plurality of bumps, some of the bumps arranged in a first pattern, respectively, and some of the bumps arranged in a second pattern different from the first pattern, respectively; wherein the first pattern is an equilateral triangle arranged by three bumps, and the second pattern is a square arranged by four bumps. The method comprises: arranging some of the bumps in a first pattern, respectively, and arranging some of the bumps in a second pattern different from the first pattern, respectively; wherein the first pattern is an equilateral triangle arranged by three bumps, and the second pattern is a square arranged by four bumps.
Abstract:
A semiconductor package includes a packaging substrate having a first surface and a second surface opposite to the first surface; and a semiconductor die assembled on the first surface of the packaging substrate. The semiconductor die includes a plurality of first bump pads and second bump pads on an active surface of the semiconductor die, a plurality of first copper pillars on the first bump pads, and a plurality of second copper pillars on the second bump pads. The first copper pillars have a diameter that is smaller than that of the second copper pillars.
Abstract:
A system performs adaptive thermal ceiling control at runtime. The system includes computing circuits and a thermal management module. When detecting a runtime condition change that affects power consumption in the system, the thermal management module determines an adjustment to the thermal ceiling of a computing circuit, and increases the thermal ceiling of the computing circuit according to the adjustment.
Abstract:
A semiconductor package includes a substrate and a flip-chip on the substrate The flip-chip includes first bump pads and second bump pads on an active surface of the flip-chip. Vias are disposed on the second bump pads. The first bump pads have a pad size that is smaller than that of the second bump pads. An underfill layer is disposed between the flip-chip and the substrate to surround the vias. The underfill layer is in direct contact with a surface of each of the first bump pads.
Abstract:
The present invention provides a method for flip chip packaging co-design. The method comprises steps of: providing an I/O pad information of a chip and a connection information of a PCB; performing a first I/O pad placement according to the I/O pad information of the chip and the connection information of the PCB; utilizing a RDL routing analysis device to perform a bump pad pitch analysis for the first I/O pad placement of the chip to generate a bump pad pitch analysis result; performing a bump pad planning for a package according to the bump pad pitch analysis result to generate a bump pad planning result; and performing a second I/O pad placement for the chip according to the bump pad planning result to generate an I/O pad placement result.
Abstract:
The present invention provides a flip chip scheme and a method of forming the flip chip scheme. The flip chip scheme comprises: a plurality of bumps, some of the bumps arranged in a first pattern, respectively, and some of the bumps arranged in a second pattern different from the first pattern, respectively; wherein the first pattern is an equilateral triangle arranged by three bumps, and the second pattern is a square arranged by four bumps. The method comprises: arranging some of the bumps in a first pattern, respectively, and arranging some of the bumps in a second pattern different from the first pattern, respectively; wherein the first pattern is an equilateral triangle arranged by three bumps, and the second pattern is a square arranged by four bumps.
Abstract:
The present invention provides a method for flip chip packaging co-design. The method comprises steps of: providing an I/O pad information of a chip and a connection information of a PCB; performing a first I/O pad placement according to the I/O pad information of the chip and the connection information of the PCB; utilizing a RDL routing analysis device to perform a bump pad pitch analysis for the first I/O pad placement of the chip to generate a bump pad pitch analysis result; performing a bump pad planning for a package according to the bump pad pitch analysis result to generate a bump pad planning result; and performing a second I/O pad placement for the chip according to the bump pad planning result to generate an I/O pad placement result.