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公开(公告)号:US11244717B2
公开(公告)日:2022-02-08
申请号:US16700948
申请日:2019-12-02
Applicant: Micron Technology, Inc.
Inventor: Zhongyuan Lu , Christina Papagianni , Hongmei Wang , Robert J. Gleixner
IPC: G11C11/406 , G11C11/409 , G11C7/22 , G11C11/56 , G11C11/408
Abstract: Methods, systems, and devices for write operation techniques for memory systems are described. In some memory systems, write operations performed on target memory cells of the memory device may disturb logic states stored by one or more adjacent memory cells. Such disturbances may cause reductions in read margins when accessing one or more memory cells, or may cause a loss of data in one or more memory cells. The described techniques may reduce aspects of logic state degradation by supporting operational modes where a host device, a memory device, or both, refrains from writing information to a region of a memory array, or inhibits write commands associated with write operations on a region of a memory array.
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公开(公告)号:US10748615B2
公开(公告)日:2020-08-18
申请号:US16419831
申请日:2019-05-22
Applicant: Micron Technology, Inc.
Inventor: Hongmei Wang , Luca Crespi , Debayan Mahalanabis , Fabio Pellizzer
IPC: G11C13/00
Abstract: Methods, systems, and devices for polarity-conditioned memory cell write operations are described. A memory cell may be written with a logic state by performing a write operation that includes applying a first write voltage across the memory cell with a first polarity, and applying a second write voltage across the memory cell after applying the first write voltage of the write operation, the second write voltage of the write operation having a second polarity that is different than the first polarity. In some examples, performing a write operation on a memory cell having different voltage polarities across the memory call may allow such a write operation to be completed in a shorter time than a write operation having a voltage of a single polarity.
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公开(公告)号:US20190311768A1
公开(公告)日:2019-10-10
申请号:US16419831
申请日:2019-05-22
Applicant: Micron Technology, Inc.
Inventor: Hongmei Wang , Luca Crespi , Debayan Mahalanabis , Fabio Pellizzer
IPC: G11C13/00
Abstract: Methods, systems, and devices for polarity-conditioned memory cell write operations are described. A memory cell may be written with a logic state by performing a write operation that includes applying a first write voltage across the memory cell with a first polarity, and applying a second write voltage across the memory cell after applying the first write voltage of the write operation, the second write voltage of the write operation having a second polarity that is different than the first polarity. In some examples, performing a write operation on a memory cell having different voltage polarities across the memory call may allow such a write operation to be completed in a shorter time than a write operation having a voltage of a single polarity.
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公开(公告)号:US10403359B2
公开(公告)日:2019-09-03
申请号:US15918662
申请日:2018-03-12
Applicant: Micron Technology, Inc.
Inventor: Amitava Majumdar , Rajesh Kamana , Hongmei Wang , Shawn D. Lyonsmith , Ervin T. Hill , Zengtao T. Liu , Marlon W. Hug
Abstract: Methods, systems, and devices for non-contact electron beam probing techniques, including at one or more intermediate stages of fabrication, are described. One subset of first access lines may be grounded and coupled with one or more memory cells. A second subset of first access lines may be floating and coupled with one or more memory cells. A second access line may correspond to each first access line and may be configured to be coupled with the corresponding first access line, by way of one or more corresponding memory cells, when scanned with an electron beam. A leakage path may be determined by comparing an optical pattern generated in part by determining a brightness of each scanned access line and comparing the generated optical pattern with a second optical pattern.
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公开(公告)号:US10354729B1
公开(公告)日:2019-07-16
申请号:US15857188
申请日:2017-12-28
Applicant: Micron Technology, Inc.
Inventor: Hongmei Wang , Luca Crespi , Debayan Mahalanabis , Fabio Pellizzer
IPC: G11C13/00
Abstract: Methods, systems, and devices for polarity-conditioned memory cell write operations are described. A memory cell may be written with a logic state by performing a write operation that includes applying a first write voltage across the memory cell with a first polarity, and applying a second write voltage across the memory cell after applying the first write voltage of the write operation, the second write voltage of the write operation having a second polarity that is different than the first polarity. In some examples, performing a write operation on a memory cell having different voltage polarities across the memory call may allow such a write operation to be completed in a shorter time than a write operation having a voltage of a single polarity.
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公开(公告)号:US20190206506A1
公开(公告)日:2019-07-04
申请号:US16284491
申请日:2019-02-25
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli , Agostino Pirovano , Andrea Redaelli , Fabio Pellizzer , Hongmei Wang
CPC classification number: G11C29/00 , G11C13/00 , G11C13/0004 , G11C13/0033 , G11C13/004 , G11C29/52 , G11C2013/0052 , G11C2213/71 , H01L27/2409 , H01L27/2427 , H01L27/2463 , H01L27/2481 , H01L45/06 , H01L45/08 , H01L45/1233 , H01L45/142 , H01L45/143 , H01L45/144
Abstract: Methods, systems, and devices for drift mitigation with embedded refresh are described. A memory cell may be written to and read from using write and read voltages, respectively, that are of different polarities. For example, a memory cell may be written to by applying a first write voltage and may be subsequently read from by applying a first read voltage of a first polarity. At least one additional (e.g., a second) read voltage—a setback voltage—of a second polarity may be utilized to return the memory cell to its original state. Thus the setback voltage may mitigate a shift in the voltage distribution of the cell caused by the first read voltage.
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公开(公告)号:US20190189237A1
公开(公告)日:2019-06-20
申请号:US15849262
申请日:2017-12-20
Applicant: Micron Technology, Inc.
Inventor: Amitava Majumdar , Rajesh Kamana , Hongmei Wang , Shawn D. Lyonsmith , Ervin T. Hill , Zengtao T. Liu , Marlon W. Hug
CPC classification number: G11C29/50004 , G11C13/0004 , G11C13/0026 , G11C13/0028 , G11C13/0069 , G11C29/50008 , G11C29/56 , G11C29/56008 , G11C29/56016 , G11C2013/0078 , G11C2029/0403 , G11C2029/5004 , G11C2029/5602 , G11C2213/71 , G11C2213/72 , H01L22/14 , H01L27/2427 , H01L27/2463 , H01L45/06 , H01L45/144 , H01L45/1608
Abstract: Methods, systems, and devices for non-contact measurement of memory cell threshold voltage, including at one or more intermediate stages of fabrication, are described. One access line may be grounded and coupled with one or more memory cells. Each of the one or more memory cells may be coupled with a corresponding floating access line. A floating access line may be scanned with an electron beam configured to set the floating access line to a particular surface voltage at the scanned bit line, and the threshold voltage of the corresponding memory cell may be determined based on whether setting the scanned bit line to the surface voltage causes a detectable amount current to flow through the corresponding memory cell.
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公开(公告)号:US10269442B1
公开(公告)日:2019-04-23
申请号:US15857125
申请日:2017-12-28
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli , Agostino Pirovano , Andrea Redaelli , Fabio Pellizzer , Hongmei Wang
Abstract: Methods, systems, and devices for drift mitigation with embedded refresh are described. A memory cell may be written to and read from using write and read voltages, respectively, that are of different polarities. For example, a memory cell may be written to by applying a first write voltage and may be subsequently read from by applying a first read voltage of a first polarity. At least one additional (e.g., a second) read voltage—a setback voltage—of a second polarity may be utilized to return the memory cell to its original state. Thus the setback voltage may mitigate a shift in the voltage distribution of the cell caused by the first read voltage.
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公开(公告)号:US12033753B2
公开(公告)日:2024-07-09
申请号:US16989749
申请日:2020-08-10
Applicant: Micron Technology, Inc.
Inventor: Gitanjali T. Ghosh , Irene K. Thompson , Jessica M. Maderos , Hongmei Wang , Fatma Arzum Simsek-Ege , Kathryn H. Russo
Abstract: Systems, apparatuses, and methods related to medical device data analysis are described. In some examples, a medical device is implanted in a user of the medical device and the data generated by the medical device is not easily accessible to the user. In an example, a controller can be configured to receive, by a mobile device coupled to a medical device, data from the medical device, where the data is a part of a baseline dataset related to the medical device. The controller can be configured to receive different data from the medical device, where the different data is received from the medical device as the different data is generated by the medical device, analyze the data from the medical device and the different data generated by the medical device, and perform an action based on the analyzed data and the different data generated by the medical device.
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公开(公告)号:US20240055190A1
公开(公告)日:2024-02-15
申请号:US17884450
申请日:2022-08-09
Applicant: Micron Technology, Inc.
Inventor: Hongmei Wang , Huiqi Gong , Peng Zhao , Jingshan Wang , Giovanni Ferrari
IPC: H01G7/06
CPC classification number: H01G7/06
Abstract: Methods, systems, and devices for programmable chalcogenide capacitors are described. A first programming pulse may be applied, for a first duration, to a capacitor comprising a chalcogenide material to adjust a capacitance of the capacitor from a first capacitance to a second capacitance. A pulse may be applied to the capacitor based on applying the first programming pulse to the capacitor. A first voltage may be stored in the capacitor based on adjusting the capacitance of the capacitor from the first capacitance to the second capacitance, and the first voltage may be stored based on the capacitor having the second capacitance.
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