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公开(公告)号:US20220247421A1
公开(公告)日:2022-08-04
申请号:US17588493
申请日:2022-01-31
Applicant: Texas Instruments Incorporated
Inventor: Visvesvaraya Appala Pentakota , Srinivas Kumar Reddy Naru , Chirag Shetty , Eeshan Miglani , Neeraj Shrivastava , Narasimhan Rajagopal , Shagun Dusad
IPC: H03M1/10
Abstract: In described examples, a circuit includes a multiplexer. The multiplexer receives an input voltage and a calibration signal. An analog-to-digital converter (ADC) is coupled to the multiplexer and generates an output code in response to the calibration signal. A storage circuit is coupled to the ADC and stores the input code representative of the calibration signal at an address corresponding to the output code. The stored input code includes an index value and a coarse value.
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公开(公告)号:US10741268B2
公开(公告)日:2020-08-11
申请号:US16235698
申请日:2018-12-28
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Aravind Ganesan , Jaiganesh Balakrishnan , Nagarajan Viswanathan , Yeswanth Guntupalli , Ajai Paulose , Mathews John , Jagannathan Venkataraman , Neeraj Shrivastava
Abstract: A one-time write, read-only memory for storing trimming parameters includes an address pointer table, a fixed packet portion, and a flexible packet portion. The fixed packet portion includes one or more fixed packets, each fixed packet including trimming parameters for a component identified for trimming during a design phase. The flexible packet portion includes one or more flexible packets of different types. Each flexible packet includes trimming parameters for a component identified for trimming after the design phase. One packet type includes a length section and a number of fields equal to a value stored in the length section. Each field includes an address, a trimming parameter, and a mask. Another packet type includes trimming parameters associated with operands in operating instructions for a microcontroller, where the operands include an address and a mask.
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公开(公告)号:US10686461B1
公开(公告)日:2020-06-16
申请号:US16234685
申请日:2018-12-28
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Sai Aditya KrishnaSwamy Nurani , Arun Mohan , Shagun Dusad , Neeraj Shrivastava
Abstract: A top-plate sampling analog-to-digital converter (ADC) circuit includes a first ADC stage and a residue amplifier coupled to the first ADC stage. The residue amplifier comprises a first transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a second transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a linearity adjustment circuit coupled to a second current terminal of at least one of the first transistor and the second transistor. The linearity adjustment circuit comprises at least one switch that changes its state as a function of an input sampling phase and a gain phase of the residue amplifier.
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公开(公告)号:US10476542B1
公开(公告)日:2019-11-12
申请号:US16274621
申请日:2019-02-13
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Neeraj Shrivastava , Rajendrakumar Joish , Shagun Dusad , Visvesvaraya Pentakota
IPC: H04B1/04 , H04B1/18 , H03K17/94 , H03K19/173
Abstract: A digital step attenuator (DSA) includes a switch control circuit which receives the attenuated signal output by the DSA from a buffer and generates a tracked control signal for switches within the DSA. Some switch control circuits include a capacitor coupled to receive the buffered signal, a supply voltage, and a switch control logic sub-circuit for each switch. Each switch control logic sub-circuit receives a control signal, for either the gate or the bulk terminal of the switch, and generates the tracked control signal. In other embodiments, switch control circuits include a complementary MOSFET switching device coupled to receive a control signal, and a capacitor coupled to receive the buffered signal, both of which are connected to an output terminal for the tracked control signal. In those embodiments, the DSA includes a switch control circuit for each switch connected to the DSA output.
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公开(公告)号:US10439628B2
公开(公告)日:2019-10-08
申请号:US16104978
申请日:2018-08-20
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Ani Xavier , Neeraj Shrivastava , Arun Mohan
Abstract: In some examples, a system includes a first transistor comprising a first source terminal coupled to a first input terminal, a first drain terminal coupled to a first top plate sampling capacitor, and a first gate terminal. The system also includes a first input-dependent dual clock boost circuit coupled to the first input terminal via a first boost circuit input and to the first gate terminal via a first boost circuit output. The system further includes a second transistor comprising a second source terminal coupled to a second input terminal, a second drain terminal coupled to a second top plate sampling capacitor, and a second gate terminal. The system also includes a second input-dependent dual clock boost circuit coupled to the second input terminal via a second boost circuit input and to the second gate terminal of the second transistor via a second boost circuit output.
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公开(公告)号:US10320405B2
公开(公告)日:2019-06-11
申请号:US15909378
申请日:2018-03-01
Applicant: Texas Instruments Incorporated
Inventor: Srinivas Kumar Reddy Naru , Visvesvaraya Pentakota Appala , Shagun Dusad , Neeraj Shrivastava , Viswanathan Nagarajan , Ani Xavier , Rishi Soundararajan , Sai Aditya Nurani , Roswald Francis
Abstract: In described examples, an analog to digital converter (ADC) includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.
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公开(公告)号:US10200052B2
公开(公告)日:2019-02-05
申请号:US15859437
申请日:2017-12-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Neeraj Shrivastava , Jafar Sadique Kaviladath
Abstract: In some examples, a system comprises an analog-to-digital converter (ADC) to receive an analog input signal and a reset signal, the ADC to convert the analog input signal into a digital signal. The system comprises a digital-to-analog converter (DAC), coupled to the ADC, to convert the digital signal into an internal analog signal. The system includes a first capacitor, coupled to the DAC, to receive the internal analog signal. The system comprises a first switch, coupled to the first capacitor, to provide the analog input signal to the first capacitor. The system comprises a second switch to couple the first capacitor to ground.
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公开(公告)号:US20250105854A1
公开(公告)日:2025-03-27
申请号:US18973169
申请日:2024-12-09
Applicant: Texas Instruments Incorporated
Inventor: Visvesvaraya Appala Pentakota , Srinivas Kumar Reddy Naru , Chirag Shetty , Eeshan Miglani , Neeraj Shrivastava , Narasimhan Rajagopal , Shagun Dusad
IPC: H03M1/10
Abstract: In described examples, a circuit includes a multiplexer. The multiplexer receives an input voltage and a calibration signal. An analog-to-digital converter (ADC) is coupled to the multiplexer and generates an output code in response to the calibration signal. A storage circuit is coupled to the ADC and stores the input code representative of the calibration signal at an address corresponding to the output code. The stored input code includes an index value and a coarse value.
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公开(公告)号:US12224761B2
公开(公告)日:2025-02-11
申请号:US17729374
申请日:2022-04-26
Applicant: Texas Instruments Incorporated
Inventor: Nithin Gopinath , Visvesvaraya A. Pentakota , Neeraj Shrivastava , Harshit Moondra
Abstract: An analog-to-digital converter circuit module utilizing dither to reduce multiplicative noise. A dither generation circuit generates a noise-shaped analog dither signal having lower amplitudes at frequencies below a cutoff frequency than at frequencies above the cutoff frequency. The noise-shaped analog dither signal is added to the input analog signal to be converted and the summed signal applied to an analog-to-digital converter The dither generation circuit may be implemented as an analog dither generator followed by an analog high-pass filter. The dither generation circuit may alternatively be implemented digitally, for example with a digital noise-shaping filter applying a high-pass digital filter to a pseudo-random binary sequence. The digital dither generation circuit may alternatively be implemented by one or more 1-bit sigma-delta modulators, each generating a bit of a digital dither sequence that is converted to analog.
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公开(公告)号:US20220247420A1
公开(公告)日:2022-08-04
申请号:US17467561
申请日:2021-09-07
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Narasimhan Rajagopal , Eeshan Miglani , Chirag Chandrahas Shetty , Neeraj Shrivastava , Shagun Dusad , Srinivas Kumar Reddy Naru , Nithin Gopinath , Charls Babu , Shivam Srivastava , Viswanathan Nagarajan , Jagannathan Venkataraman , Harshit Moondra , Prasanth K , Visvesvaraya Appala Pentakota
IPC: H03M1/10
Abstract: In described examples, a circuit includes a calibration engine. The calibration engine generates multiple input codes. A digital to analog converter (DAC) is coupled to the calibration engine, and generates a first calibration signal in response to a first input code of the multiple input codes. An analog to digital converter (ADC) is coupled to the DAC, and generates multiple raw codes responsive to the first calibration signal. A storage circuit is coupled to the ADC and stores a first output code corresponding to the first input code. The first output code is obtained using the multiple raw codes generated by the ADC.
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