Abstract:
A data verifying method, a chip, and a verifying apparatus are provided. In the method, an encoder is provided for at least one processing circuit of a chip. One or more transmitting data of a to-be-test circuit of the processing circuit is encoded through the encoder to generate one or more parity data. The transmitting data is a computing result generated by the to-be-test circuit. The parity data is transmitted without the transmitting data. The parity data is used for data verification of the transmitting data.
Abstract:
The present disclosure relates to a device and method to reduce the dynamic/static power consumption of an MCML logic device. In order to retain register contents during power off mode, an MCML retention latch and flip-flop are disclosed. Retention Latch circuits in MCML architecture are used to retain critical register contents during power off mode, wherein combination logic including clock buffers on the clock tree paths are powered off to reduce dynamic/static power consumption. The MCML retention flip-flop comprises a master latch and a slave latch, wherein a power switch is added to the master latch to power the master latch off during power off mode. The slave latch includes pull-down circuits that remain active to enable the slave latch to retain data at a proper voltage level during power off mode. Other devices and methods are also disclosed.
Abstract:
The present disclosure relates to a method of generating a transistor device having an epitaxial layer disposed over a recessed active region. The epitaxial layer improves transistor device performance. In some embodiments, the method is performed by providing a semiconductor substrate. An epitaxial growth is performed to form an epitaxial layer onto the semiconductor substrate. An electrically insulating layer is then formed onto the epitaxial layer, and a gate structure is formed onto the electrically insulating layer. By forming the epitaxial layer over the semiconductor substrate the surface roughness of the semiconductor substrate is improved, thereby improving transistor device performance.