公开(公告)号：US20160033455A1

公开(公告)日：2016-02-04

申请号：US14745757

申请日：2015-06-22

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Christopher R. Muggli ,  Martin Rockwell ,  Ira G. Pollock

IPC: G01N29/30 ,  G01N29/24

CPC classification number: G01N29/30 ,  G01N29/24 ,  G01R1/06766 ,  G01R1/06772 ,  G01R31/31706

Abstract: A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.

Abstract translation: 探头，包括被配置为接收第一输入信号的第一输入，被配置为接收第二输入信号的第二输入，连接到第一输入的第一电缆，连接到第二输入的第二电缆，连接到 所述第一电缆，所述电子可调节延迟被配置为延迟所述第一输入信号以去除所述第一输入信号和所述第二输入信号之间的偏斜;以及放大器，被配置为从所述电子可调延迟接收所述第一输入信号，以及第二输入信号 。

公开(公告)号：US09172362B2

公开(公告)日：2015-10-27

申请号：US13922125

申请日：2013-06-19

Applicant: Tektronix, Inc.

Inventor： John F. Stoops ,  Daniel G. Knierim

IPC: H03K5/22 ,  H03K5/24 ,  G01R31/3177 ,  G01R13/02

CPC classification number: H03K5/2481 ,  G01R13/0254 ,  G01R31/3177

Abstract: A circuit includes a load; a first differential pair coupled to the load and responsive to input data; a second differential pair coupled to the load and responsive to the input data; a third differential pair coupled to the first differential pair and the second differential pair and responsive to a first control signal and a second control signal; a bias circuit configured to pull a node coupled to both the first differential pair and the second differential pair to a predetermined state; and a current source coupled to the third differential pair and the bias circuit.

Abstract translation: 电路包括负载; 耦合到所述负载并响应于输入数据的第一差分对; 耦合到所述负载并响应于所述输入数据的第二差分对; 耦合到所述第一差分对和所述第二差分对并响应于第一控制信号和第二控制信号的第三差分对; 偏置电路，被配置为将耦合到所述第一差分对和所述第二差分对的节点拉到预定状态; 以及耦合到第三差分对和偏置电路的电流源。

公开(公告)号：US20150084660A1

公开(公告)日：2015-03-26

申请号：US14317389

申请日：2014-06-27

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Barton T. Hickman

IPC: G01R1/067 ,  G01R19/00

CPC classification number: G01R31/31908 ,  G01R1/06772 ,  G01R27/28 ,  G01R31/2839 ,  G01R35/002

Abstract: A de-embed probe including an input configured to connect to a device under test, a memory, a signal generator connected to the input, the signal generator configured to generate a test signal, and a controller connected to the signal generator and configured to control the signal generator. The de-embed probe may be used in a test and measurement system. The test and measurement system also includes a test and measurement instrument including a processor connected to the controller of the de-embed probe, the processor configured to provide instructions to the controller, and a test and measurement input to receive an output from the de-embed probe.

Abstract translation: 一种解嵌入探针，包括被配置为连接到被测器件的输入，存储器，连接到输入的信号发生器，被配置为产生测试信号的信号发生器，以及连接到信号发生器并被配置为控制 信号发生器。 解嵌式探头可用于测试和测量系统。 所述测试和测量系统还包括测试和测量仪器，包括连接到所述解嵌入探针的控制器的处理器，所述处理器被配置为向所述控制器提供指令，以及测试和测量输入以接收所述解嵌入探测器的输出， 嵌入探针。

公开(公告)号：US20140225591A1

公开(公告)日：2014-08-14

申请号：US14254373

申请日：2014-04-16

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  James S. Lamb

IPC: G01R23/14

CPC classification number: H03M1/121 ,  G01R13/0272

Abstract: A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers.

公开(公告)号：US20130221985A1

公开(公告)日：2013-08-29

申请号：US13854566

申请日：2013-04-01

Applicant: TEKTRONIX, INC.

Inventor： Josiah A. Bartlett ,  Ira G. Pollock ,  Daniel G. Knierim ,  Lester L. Larson ,  Scott R. Jansen ,  Kenneth P. Dobyns ,  Michael Duane Stevens

IPC: G01R35/00

CPC classification number: G01R35/005 ,  G01R1/06766

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统提供极零对，以保持信号采集系统频率带宽的平坦度。

公开(公告)号：US20240353470A1

公开(公告)日：2024-10-24

申请号：US18641314

申请日：2024-04-19

Applicant: Tektronix, Inc.

Inventor： Niranjan R. Hegde ,  Daniel G. Knierim ,  Vivek Shivaram ,  Krishna N H Sri ,  Joshua J. O'Brien ,  Shubha B ,  Yogesh M. Pai

IPC: G01R31/26

CPC classification number: G01R31/2621

Abstract: A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.

公开(公告)号：US20240061021A1

公开(公告)日：2024-02-22

申请号：US18499143

申请日：2023-10-31

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  Emily L. Becher ,  David M. Ediger ,  Matthew J. Hull ,  Daniel G. Knierim

IPC: G01R15/18 ,  G01R19/00 ,  G01R15/14

CPC classification number: G01R15/181 ,  G01R19/0092 ,  G01R15/146

Abstract: A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski core. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt resistor. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.

公开(公告)号：US20220349917A1

公开(公告)日：2022-11-03

申请号：US17730096

申请日：2022-04-26

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett ,  Andrew W. Rusinek ,  David Thomas Engquist

IPC: G01R1/067 ,  G01R31/28 ,  H05K9/00

Abstract: A probe tip for an isolated probe having a triaxial cable has a conductive probe tip interface at one end of the cable, a signal conductor, the signal conductor traversing a length of the cable and electrically connected to the conductive probe tip interface, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor at least along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the probe tip, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor. A method of manufacturing a tip for an isolated probe having a triaxial cable includes accessing a shield conductor of the triaxial cable, inserting a high magnetic permeability material between the shield conductor and a reference conductor in the triaxial cable, electrically connecting the shield conductor to the reference conductor. A triaxial cable has a signal conductor, the signal conductor traversing a length of the cable, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the cable, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor.

公开(公告)号：US11249111B2

公开(公告)日：2022-02-15

申请号：US16028236

申请日：2018-07-05

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

IPC: G01R1/067 ,  G01R31/02 ,  G01R31/50 ,  G01R31/54

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

公开(公告)号：US20210088553A1

公开(公告)日：2021-03-25

申请号：US17114468

申请日：2020-12-07

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

IPC: G01R1/067 ,  G01R31/50

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.