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    Ion transfer arrangement with spatially alternating DC and viscous ion flow
    11.
    发明授权
    Ion transfer arrangement with spatially alternating DC and viscous ion flow 有权
    离子转移排列与空间交替的直流和粘性离子流

    公开(公告)号：US08148680B2

    公开(公告)日：2012-04-03

    申请号：US12513954

    申请日：2007-11-07

    Applicant: Alexander Makarov ,  Reinhold Pesch ,  Robert Malek ,  Viacheslav Kozlovskiy

    Inventor： Alexander Makarov ,  Reinhold Pesch ,  Robert Malek ,  Viacheslav Kozlovskiy

    IPC: H01J37/301 ,  H01J49/04 ,  H01J49/24 ,  H01J3/18

    CPC classification number: H01J49/062 ,  H01J3/14

    Abstract: A method of transporting gas and entrained ions between higher and lower pressure regions of a mass spectrometer comprises providing an ion transfer conduit 60 between the higher and lower pressure regions. The ion transfer conduit 60 includes an electrode assembly 300 which defines an ion transfer channel. The electrode assembly 300 has a first set of ring electrodes 305 of a first width D1, and a second set of ring electrodes of a second width D2 (≧D1) and interleaved with the first ring electrodes 305. A DC voltage of magnitude V1 and a first polarity is supplied to the first ring electrodes 205 and a DC voltage of magnitude V2 which may be less than or equal to the magnitude of V1 but with an opposed polarity is applied to the second ring electrodes 310. The pressure of the ion transfer conduit 60 is controlled so as to maintain viscous flow of gas and ions within the ion transfer channel.

    Abstract translation: 在质谱仪的较高压力区域和较低压力区域之间输送气体和夹带离子的方法包括在较高压力区域和较低压力区域之间提供离子转移导管60。 离子传递管道60包括限定离子传递通道的电极组件300。 电极组件300具有第一组宽度为D1的环形电极305和第二组宽度D2（≧D1）的第二组环形电极，并与第一环形电极305交错。 将第一极性提供给第一环形电极205，并且可以将小于或等于V1的大小但具有相对极性的幅度为V2的DC电压施加到第二环形电极310.离子转移的压力 管道60被控制以便保持气体和离子在离子传递通道内的粘性流动。

    MULTI-REFLECTING ION OPTICAL DEVICE
    12.
    发明申请
    MULTI-REFLECTING ION OPTICAL DEVICE 有权
    多重反射光学器件

    公开(公告)号：US20100193682A1

    公开(公告)日：2010-08-05

    申请号：US12666252

    申请日：2008-06-20

    Applicant: Uriy Golikov ,  Konstantin Solovyev ,  Mikhail Sudakov ,  Sumio Kumashiro

    Inventor： Uriy Golikov ,  Konstantin Solovyev ,  Mikhail Sudakov ,  Sumio Kumashiro

    IPC: H01J49/06 ,  H01J49/40 ,  H01J3/18

    CPC classification number: H01J49/4245 ,  H01J49/406

    Abstract: A multi-reflecting ion optical device includes electrostatic field generating means configured to generate electrostatic field defined by a superposition of first and second distributions of electrostatic potential φEF, φLS. The first distribution φEF subjects ions to energy focusing in a flight direction and the second distribution φLS subjects ions to stability in one lateral direction, to stability in another lateral direction for the duration of at least a finite number of oscillations in the one lateral direction and to subject ions to energy focusing in the one lateral direction for a predetermined energy range.

    Abstract translation: 多反射离子光学器件包括静电场产生装置，其被配置为产生通过第一和第二静电势分布与EF，＆amp; LS的叠加而定义的静电场。 EF的第一个分布和离子将离子转移到沿着飞行方向聚焦的能量，而第二分布和离子将离子在一个横向方向上稳定，在另一个横向方向上稳定至少有限数量的振荡 一个横向方向，并使离子在一个横向方向聚焦在预定的能量范围内。

    FOCUSED NEGATIVE ION BEAM FIELD SOURCE
    13.
    发明申请
    FOCUSED NEGATIVE ION BEAM FIELD SOURCE 有权
    聚焦负离子束场源

    公开(公告)号：US20090032724A1

    公开(公告)日：2009-02-05

    申请号：US12135464

    申请日：2008-06-09

    Applicant: Paulo Lozano ,  Manuel Martinez-Sanchez

    Inventor： Paulo Lozano ,  Manuel Martinez-Sanchez

    IPC: H01J3/18

    CPC classification number: H01J37/08 ,  H01J27/028 ,  H01J27/26 ,  H01J2237/0048 ,  H01J2237/08 ,  H01J2237/0815 ,  H01J2237/0827 ,  H01J2237/31749

    Abstract: An apparatus for producing negative ions including an emitter coated with an ionic liquid room-temperature molten salt, an electrode positioned downstream relative to the emitter, a power supply that applies a voltage to the emitter with respect to the electrode. The power supply is sufficient to generate a stable high brightness beam of negative ions having minimal chromatic and spherical aberrations in the beam. An electrostatic lens and deflector is used to focus and direct the beam to a target.

    Abstract translation: 一种用于产生负离子的装置，包括涂覆有离子液体室温熔融盐的发射体，位于发射极下游的电极，相对于电极向发射极施加电压的电源。 电源足以产生稳定的高亮度的负离子束，该束具有在光束中最小的色差和球面像差。 静电透镜和偏转器用于聚焦并将光束引导到目标。

    Method of operating electron tube
    15.
    发明授权
    Method of operating electron tube 失效
    电子管操作方法

    公开(公告)号：US6024618A

    公开(公告)日：2000-02-15

    申请号：US238412

    申请日：1999-01-28

    Applicant: Hideo Makishima ,  Hisashi Takemura

    Inventor： Hideo Makishima ,  Hisashi Takemura

    IPC: H01J9/44 ,  H01J1/304 ,  H01J3/02 ,  H01J3/18 ,  H01J23/06 ,  H01J29/04 ,  H01J29/48 ,  H01J29/84 ,  H01J9/02

    CPC classification number: H01J3/022 ,  H01J23/06 ,  H01J29/481 ,  H01J29/84

    Abstract: In a method of operating an electron tube including a plurality of emitters formed on a substrate and having sharp tips, gate electrodes surrounding the plurality of emitters, and a peripheral electrode surrounding an electron emission region constituted by the plurality of emitters and the gate electrodes and insulated from the plurality of emitters and the gate electrodes, the voltage applied to the peripheral electrode is set to be lower than the voltage applied to the gate electrode.

    Abstract translation: 一种操作电子管的方法，该电子管包括形成在基板上的具有尖锐尖端的多个发射体，围绕多个发射极的栅电极和围绕由多个发射极和栅电极构成的电子发射区的周边电极，以及 与多个发射极和栅电极绝缘，施加到外围电极的电压被设定为低于施加到栅电极的电压。

    Field emission cathode having focusing electrode
    18.
    发明授权
    Field emission cathode having focusing electrode 失效
    具有聚焦电极的场发射阴极

    公开(公告)号：US5723867A

    公开(公告)日：1998-03-03

    申请号：US607463

    申请日：1996-02-27

    Applicant: Hironori Imura

    Inventor： Hironori Imura

    IPC: H01J1/304 ,  B81B1/00 ,  H01J3/02 ,  H01J3/18 ,  G01N27/00 ,  H01J1/02

    CPC classification number: H01J3/022

    Abstract: In a field emission cathode, periphery portions of opening portions of a gate electrode are recessed on a side of a substrate, and a focusing electrode having opening portions which are identical in number with the opening portions of the gate electrode are disposed on the gate electrode. Further, a shield electrode having opening portions which are identical in number with opening portions of the gate electrode are disposed between the gate electrode and the focusing electrode. According to the above-mentioned construction, a focusing aberration can be reduced, and a focused electron flow can be obtained by a low electric potential of the gate electrode.

    Abstract translation: 在场发射阴极中，栅电极的开口部的周边部分在基板的一侧凹陷，并且具有与栅电极的开口部分数目相同的开口部分的聚焦电极设置在栅极上 。 此外，具有与栅电极的开口部分数量相同的开口部分的屏蔽电极设置在栅电极和聚焦电极之间。 根据上述结构，可以降低聚焦像差，并且可以通过栅电极的低电位获得聚焦的电子流。

    Micro lens array and micro deflector assembly for fly's eye electron beam tubes using silicon components and techniques of fabrication and assembly
    19.
    发明授权
    Micro lens array and micro deflector assembly for fly's eye electron beam tubes using silicon components and techniques of fabrication and assembly 失效

    公开(公告)号：US4200794A

    公开(公告)日：1980-04-29

    申请号：US958657

    申请日：1978-11-08

    Applicant: Sterling P. Newberry ,  John R. Burgess

    Inventor： Sterling P. Newberry ,  John R. Burgess

    IPC: H01J3/12 ,  H01J3/18 ,  H01J9/02 ,  H01J29/18 ,  H01J29/46 ,  H01J29/62 ,  H01J29/74 ,  H01J29/80 ,  G21K1/08 ,  G21K5/00

    CPC classification number: H01J9/02 ,  H01J29/803

    Abstract: A combined fine focusing micro lens array and micro deflector assembly for use in electron beam tubes of the fly's eye type is provided. The assembly comprises a fine focusing micro lens array sub-assembly formed from a plurality of spaced-apart stacked parallel thin planar apertured silicon semiconductor lens plates each having an array of micro lens aperture openings. The lens plates each have highly conductive surfaces and are secured to glass rods for holding the plates in stacked parallel spaced-apart relationship with the apertures axially aligned in parallel. A micro deflector assembly is adjacent to the micro lens array sub-assembly. A micro deflector element axially aligned with each respective fine focusing lens element serves for deflecting an electron beam passing through along orthogonal x-y directional axes of movement normal to the electron beam path. The deflector elements are comprised by two orthogonally arrayed sets of parallel spaced-apart deflector bars with alternate bars of each set of deflector bars being interconnected electrically for common connection to a respective source of fine x-y deflection potential.The thin planar apertured silicon lens plates comprising the micro lens array are held together in stacked parallel assembled relationship by spaced-apart glass support rods whose longitudinal axes extend at right angles to the plates and to which the planar silicon lens plates are secured at their periphery. The two orthogonally arrayed sets of parallel spaced-apart deflection bars forming the sets of micro-deflector elements likewise preferably comprise parallel plates or bars of polycrystalline silicon having a highly conductive metalized surface. The micro deflector bars likewise are held in assembled spaced-apart parallel relationship by respective sets of spaced-apart parallel supporting glass rods whose longitudinal axes extend in a plane parallel to the plane of the deflector bars but at right angles thereto and to which the ends of the deflector bars are thermally bonded. The fine focusing micro lens array and micro deflector sub-assembly thus comprised, are secured together in assembled relation by additional glass support rods being disposed about the outer peripheries of the micro lens and micro deflector sub-assemblies and being secured thereto by thermal bonding such as by fusion.

    Method and apparatus for producing electrostatic fields by surface currents on resistive materials with applications to charged particle optics and energy analysis
    20.
    发明授权
    Method and apparatus for producing electrostatic fields by surface currents on resistive materials with applications to charged particle optics and energy analysis 失效
    用于通过电阻材料上的表面电流产生静电场的方法和装置，用于带电粒子光学和能量分析

    公开(公告)号：US4126781A

    公开(公告)日：1978-11-21

    申请号：US795614

    申请日：1977-05-10

    Applicant: Melvin W. Siegel

    Inventor： Melvin W. Siegel

    IPC: G21K1/087 ,  H01J3/18 ,  H01J49/48 ,  B01D59/44 ,  H01J39/34

    CPC classification number: H01J3/18 ,  G21K1/087 ,  H01J49/48

    Abstract: Electric fields for electrostatic optics for focusing or otherwise controlling beams of ions, electrons and charged particles in general produced by surface current distributions which flow on appropriately shaped and located resistive elements from electrical power sources of appropriate voltage connected to two or more points or regions of the resistive surfaces; the resulting electric fields in the proximity of the current carrying surfaces are parallel to these surfaces. Useful electric field configurations may be produced which are inconvenient or impossible to produce by the prior art using surface charge distributions. New and improved analyzers of "concentric hemisphere" and "parallel plate" types are specifically utilized for ion kinetic energy selection prior to measurement of the mass-to-charge ratio of secondary ions produced by primary ion bombardment of surfaces.

    Abstract translation: 用于聚焦或以其他方式控制离子，电子和带电粒子束的静电光学电场，通常由表面电流分布产生，其通过适当形状和位置的电阻元件流过适当电压的电源，该电源连接到两个或更多个点或 电阻表面; 在载流表面附近产生的电场平行于这些表面。 可以产生有用的电场结构，其通过使用表面电荷分布的现有技术产生不方便或不可能。 在测量表面初级离子轰击产生的二次离子的质荷比之前，将“同心半球”和“平行板”类型的新型改进分析仪专门用于离子动能选择。

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