公开(公告)号：US09513110B2

公开(公告)日：2016-12-06

申请号：US14403223

申请日：2014-01-31

Applicant: Halliburton Energy Services, Inc.

Inventor： Dale E. Jamison ,  Cato Russell McDaniel

IPC: G01B11/16 ,  G01L1/25 ,  G01L1/24

CPC classification number: G01B11/16 ,  G01L1/241 ,  G01L1/25

Abstract: Mechanical quantities associated with a deformation force impacting a structure may be determined using one or more integrated computational elements. Methods for determining a mechanical quantity may comprise: optically interacting electromagnetic radiation with one or more integrated computational elements and a target area of a structure, the structure comprising a deformable material in an initial amount and a reference material in an initial amount within the target area; exposing the structure to a deformation force; determining a change in amount of the deformable material or the reference material within the target area, using the one or more integrated computational elements; and correlating the change in amount of the deformable material or the reference material within the target area to a mechanical quantity associated with the deformation force.

Abstract translation: 与影响结构的变形力相关联的机械量可以使用一个或多个集成的计算元件来确定。 用于确定机械量的方法可以包括：将电磁辐射与一个或多个集成的计算元件和结构的目标区域光学相互作用，所述结构包括初始量的可变形材料和在目标区域内初始量的参考材料 ; 将结构暴露于变形力; 使用所述一个或多个集成的计算元件确定所述目标区域内的可变形材料或参考材料的量的变化; 并将目标区域内的可变形材料或参考材料的量的变化与与变形力相关联的机械量相关联。

公开(公告)号：US09488595B2

公开(公告)日：2016-11-08

申请号：US14229824

申请日：2014-03-28

Applicant: Liang W. Zhang ,  Zhihua Zou ,  Osborne A. Martin, III ,  Robert F. Wiedmaier

Inventor： Liang W. Zhang ,  Zhihua Zou ,  Osborne A. Martin, III ,  Robert F. Wiedmaier

IPC: G01N21/95 ,  G01B11/16 ,  G01L1/24 ,  G01N21/88 ,  H01L21/66

CPC classification number: G01B11/14 ,  G01B11/18 ,  G01B11/272 ,  G01L1/241 ,  G01L1/248 ,  G01N21/8806 ,  G01N21/9501 ,  G03F7/70775 ,  G03F9/7007 ,  G03F9/7046 ,  G03F9/7065 ,  H01L22/12 ,  H05K1/0269 ,  H05K3/0008

Abstract: Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.

Abstract translation: 使用近红外光描述微电子器件的检查。 在一个示例中，用近红外光束照射基板上的电介质材料层。 衬底具有至少一个接触焊盘，电介质材料层覆盖接触焊盘的至少一部分，并且衬底具有限定在介电材料层中的至少一个通孔，该通孔暴露至少一部分接触焊盘。 反射的近红外光在相机处从基板反射。 使用图像处理装置，相对于来自反射光束的接触面确定通孔的位置。

公开(公告)号：US20160258827A1

公开(公告)日：2016-09-08

申请号：US14897444

申请日：2014-06-10

Applicant: MTU AERO ENGINES AG

Inventor： Martin Stadlbauer ,  Jurgen Grundmayer ,  Felix Von Plehwe

IPC: G01L1/24 ,  G01N25/72 ,  G01J5/10

CPC classification number: G01L1/241 ,  G01J5/10 ,  G01J2005/0085 ,  G01M9/067 ,  G01N25/72

Abstract: The invention relates to a method for determining a transition point and/or for determining wall shear stresses on surfaces (1) around which surfaces a flow circulates by means of thermography, wherein the method comprises the following steps: providing a surface with a heat insulation layer (3) on the surface (1) around which a flow is to circulate, circulating a flow around the surface (1) around which a flow is to circulate, heating the surface (1) around which a flow circulates, contactless measuring of the emitted flow intensity of the surface (1) around which a flow circulates by means of a camera system (7), determining at least one temperature decay coefficient on the surface (1) around which a flow circulates and ascertaining the transition point and/or the wall shear stresses on the surface (1) around which a flow circulates.

Abstract translation: 本发明涉及一种用于确定转变点和/或用于确定表面（1）上的壁剪切应力的方法，在该表面上，流体通过热成像流动循环的表面，其中该方法包括以下步骤：为表面提供绝热 在流动周围的表面（1）上的层（3），围绕流动循环的表面（1）周围流动，加热流动循环的表面（1），非接触测量 流体通过相机系统（7）循环的表面（1）的发射流强度，确定表面（1）上的至少一个温度衰减系数，流体周围循环并确定转换点和/ 或流动循环周围的表面（1）上的壁剪切应力。

公开(公告)号：US20160069756A1

公开(公告)日：2016-03-10

申请号：US14820653

申请日：2015-08-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sangkyu KIM ,  Joonhyung LEE ,  Seongho CHO

IPC: G01L1/24 ,  G01N21/31 ,  G01M11/00

CPC classification number: G01L1/24 ,  G01L1/241 ,  G01L1/25 ,  G01L9/0076 ,  G01L11/02 ,  G01N21/3103 ,  G01N23/046 ,  G01N2021/1787 ,  G01N2223/419 ,  G06F3/0325 ,  G06F3/041 ,  G06F3/0414 ,  G06F3/042 ,  G06F3/0421 ,  G06F3/0423 ,  G06F3/0428 ,  G06F2203/04104 ,  G06F2203/04109

Abstract: An apparatus and method for measuring a contact pressure and a method of manufacturing the apparatus. The apparatus includes: a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine the contact pressure of the subject based on the determined intensity.

Abstract translation: 用于测量接触压力的装置和方法及其制造方法。 该装置包括：材料层，被配置为提供入射光沿着该光路传播到与材料层接触的被摄体的光路; 频谱分析器，被配置为检测从所述材料层发射的光并对所述检测到的光执行光吸收光谱分析以确定所检测的光的强度; 以及压力计算器，被配置为基于所确定的强度来确定对象的接触压力。

公开(公告)号：US09218660B2

公开(公告)日：2015-12-22

申请号：US14208941

申请日：2014-03-13

Applicant: Southwest Research Institute

Inventor： John T. Carrola, Jr. ,  Warren Carl Couvillion, Jr. ,  Susan M. Porter ,  David R. Chambers ,  Christopher J. Guerra

IPC: G06K9/00 ,  G06T7/00 ,  G01L1/06 ,  G01L1/24 ,  G01B11/16 ,  H04N5/33 ,  G06T7/60 ,  G06K9/46 ,  G06K9/62

CPC classification number: G06T7/0012 ,  A61B34/10 ,  G01B11/168 ,  G01L1/06 ,  G01L1/241 ,  G01L1/248 ,  G01N21/21 ,  G01N21/23 ,  G01N21/55 ,  G01N2021/557 ,  G06F3/011 ,  G06K9/00624 ,  G06K9/4642 ,  G06K9/6267 ,  G06T7/60 ,  G09B23/28 ,  H04N5/33

Abstract: A method and system for analysis of a viscoelastic response in a deformable material. The system includes a light source configured to provide linearly polarized light and a polariscope configured to receive said linearly polarized light and to generate an image associated with a viscoelastic response of said deformable material. The system also includes a machine vision system configured to operate on the image to locate the response on the deformable material and to classify the response as one of a plurality of predefined types of responses. A display may then be provide that is configured to provide feedback of the location of the viscoelastic response and classification of the response to a user of said system.

Abstract translation: 用于分析可变形材料中的粘弹性响应的方法和系统。 该系统包括被配置为提供线性偏振光的光源和被配置为接收所述线偏振光并且产生与所述可变形材料的粘弹性响应相关联的图像的偏光镜。 该系统还包括机器视觉系统，其被配置为在图像上操作以定位可变形材料上的响应并将响应分类为多种预定类型的响应之一。 然后可以提供被配置为提供粘弹性响应的位置的反馈和对所述系统的用户的响应的分类的显示。

公开(公告)号：US20150276706A1

公开(公告)日：2015-10-01

申请号：US14678156

申请日：2015-04-03

Applicant: Universität Leipzig

Inventor： Josef Käs ,  Jochen Guck

IPC: G01N33/483 ,  G01N33/50

CPC classification number: G01N33/4833 ,  G01L1/24 ,  G01L1/241 ,  G01N33/5011

Abstract: In a method for diagnosing and/or prognosis of cancers, diagnosing origin of tumor cells, optimizing cancer therapy, and screening active substances for oncology, the mechanical properties of tumor cells and reference cells are analyzed under mechanical load that causes linear or non-linear deformation of the loaded cell. The engineering strain of the cells caused by directed mechanical stress being introduced is used to determine metastasis risk and the presence of uncontrollably proliferating and/or invasive cells, or the origin of the tumor. The metastasis risk is determined based on the proportion of cells in the sample exhibiting engineering strain in a direction opposite to the stressing direction. The risk of the presence of uncontrollably proliferating cells for non-linear deformation of the cell is determined in the sample based on the mean value of the engineering strain in the direction of cell stressing.

Abstract translation: 在癌症诊断和/或预后的方法中，诊断肿瘤细胞的起源，优化癌症治疗和筛选肿瘤学活性物质，在机械载荷下分析肿瘤细胞和参照细胞的机械性质，其导致线性或非线性 加载单元的变形。 由导向的机械应力引起的细胞的工程菌株用于确定转移风险和不可控制的增殖和/或侵入性细胞的存在或肿瘤的起源。 转移风险基于在与应激方向相反的方向显示工程应变的样品中的细胞比例来确定。 基于工程应变在细胞应激方向上的平均值，在样品中确定存在不可控制的增殖细胞用于细胞非线性变形的风险。

公开(公告)号：US09019498B2

公开(公告)日：2015-04-28

申请号：US13510769

申请日：2010-11-19

Applicant: Kazufumi Sakai ,  Kazuhiro Nonaka ,  Shinsuke Yamaguchi

Inventor： Kazufumi Sakai ,  Kazuhiro Nonaka ,  Shinsuke Yamaguchi

IPC: G01J4/00 ,  G01N21/95 ,  G01N21/21 ,  H01L21/66

CPC classification number: G01N21/9505 ,  G01L1/241 ,  G01N21/21 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

Abstract: Light from a light source device is polarized through a polarizer and is caused to impinge obliquely onto an object to be inspected. The resulting scattered light is received by a CCD imaging device having an element for separating scattered polarized light disposed in a dark field. Component light intensities are worked out for an obtained P-polarized component image and an obtained S-polarized component image and a polarization direction is determined as a ratio of them. The component light intensities and the polarization directions are determined from images obtained by imaging of the light scattering entities in a state where static stress is not applied to the object to the inspected and in a state where static load is applied thereto so as to generate tensional stress on the side irradiated by light. The component light intensities and the polarization directions are compared with predetermined threshold values.

Abstract translation: 来自光源装置的光通过偏振片偏振，并被倾斜地撞击到被检查物体上。 所得到的散射光由具有用于分离设置在暗场中的散射偏振光的元件的CCD成像装置接收。 对于获得的P偏振分量图像计算分量光强度，并且将所获得的S偏振分量图像和偏振方向确定为它们的比率。 分量光强度和偏振方向由静态应力未被施加到被检查物体的状态下的光散射体成像得到的图像和静电负荷施加到其上的状态确定，从而产生张力 在光线照射的一侧的应力。 将分量光强度和偏振方向与预定阈值进行比较。

公开(公告)号：US20150066393A1

公开(公告)日：2015-03-05

申请号：US14013481

申请日：2013-08-29

Applicant: CORNING INCORPORATED

Inventor： Anping Liu ,  Rostislav Vatchev Roussev ,  Robert Anthony Schaut

IPC: G01L1/24

CPC classification number: G01L1/24 ,  G01L1/241 ,  G01N21/23 ,  G01N21/4133

Abstract: Prism coupling systems and methods for characterizing curved parts are disclosed. A coupling surface of a coupling prism is interfaced to the curved outer surface of the curved part to define a coupling interface. Measurement light is directed through the coupling prism and to the interface, wherein the measurement light has a width of 3 mm or less. TE and TM mode spectra reflected from the interface are digitally captured. These mode spectra are processed to determine at least one characteristic of the curved part, such as the stress profile, compressive stress, depth of layer, refractive index profile and birefringence.

Abstract translation: 公开了用于表征弯曲部件的棱镜耦合系统和方法。 耦合棱镜的耦合表面与弯曲部分的弯曲外表面接合以限定耦合接口。 测量光被引导通过耦合棱镜和界面，其中测量光的宽度为3mm或更小。 从界面反射的TE和TM模式光谱被数字捕获。 处理这些模式光谱以确定弯曲部分的至少一个特征，例如应力分布，压应力，层深度，折射率分布和双折射。

公开(公告)号：US08919204B2

公开(公告)日：2014-12-30

申请号：US13717722

申请日：2012-12-18

Applicant: Advantest Corporation

Inventor： Masao Fujino ,  Toshiaki Hayakawa

IPC: G01L1/24

CPC classification number: G01L1/241

Abstract: To measure contact pressure of each of a plurality of small protrusions arranged at a narrow pitch and contacting a flat surface, provided is a contact pressure detection apparatus comprising a sensor section that is contacted by a target and has pressure applied thereto by the target; a light source section that radiates light with a wavelength causing Raman scattering in the sensor section to which the pressure is applied; and a detecting section that receives light from the sensor section and detects the pressure between the sensor section and the target. Also provided is a contact point pressure measurement apparatus that measures contact pressure of an electrode of a device under test, comprising: a fixing section that has the device under test mounted thereon and fixes the electrode of the device under test in a manner to press against the sensor section; and the contact pressure detection apparatus.

Abstract translation: 为了测量以窄间距布置并接触平坦表面的多个小突起中的每一个的接触压力，提供了一种接触压力检测装置，其包括传感器部分，所述传感器部分与靶接触并且由目标施加到其上的压力; 光源部，其在施加有压力的传感器部中散射具有引起拉曼散射的波长的光; 以及检测部，其从所述传感器部接收光，并检测所述传感器部与所述目标之间的压力。 还提供了一种接触点压力测量装置，其测量被测设备的电极的接触压力，该接触点压力测量装置包括：固定部件，其具有安装在其上的被测器件，并以被压制的方式固定被测器件的电极 传感器部分; 和接触压力检测装置。

公开(公告)号：US20140368808A1

公开(公告)日：2014-12-18

申请号：US14289056

申请日：2014-05-28

Applicant: CORNING INCORPORATED

Inventor： Rostislav Vatchev Roussev ,  Emily Elizabeth Young

IPC: G01B11/16

CPC classification number: G01L1/24 ,  C03C21/002 ,  G01B11/16 ,  G01L1/241 ,  G01N21/00 ,  G01N21/23 ,  G01N21/41

Abstract: Methods of capturing improved-contrast mode spectra of a double ion-exchanged (DIOX) glass sample using prism coupling of index np. The DIOX glass sample has a refractive index profile with a first region adjacent the surface that satisfies 0.0005≦π/n dn/dx|≦

Abstract translation: 使用索引np的棱镜耦合捕获双离子交换（DIOX）玻璃样品的改进对比度模式光谱的方法。 DIOX玻璃样品具有折射率分布，其中邻近表面的第一区域满足0.0005＆nlE;＆pgr; / n dn / dx |＆nlE; <0.0009，其中λ是测量光的波长。 棱镜样品界面包括指数nf的界面液体，其不同于np不超过0.03，并且可以超过np。 模式光谱具有比通过使用梯度照明或部分阻挡照明的常规棱镜耦合获得的对比度，其减少来自耦合棱镜的背景反射光的量。 可以使用常规方法处理改进的对比度模式光谱，以确定DIOX玻璃样品的至少一个应力特性。