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公开(公告)号:US20250068861A1
公开(公告)日:2025-02-27
申请号:US18385344
申请日:2023-10-30
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Stephen Trinh , Hoa Vu , Stanley Hong , Thuan Vu
IPC: G06J1/00
Abstract: Numerous examples are disclosed of input blocks for an array of non-volatile memory cells and associated methods. In one example, a system comprises a vector-by-matrix multiplication array comprising non-volatile memory cells arranged into rows and columns; and an input block comprising a plurality of row circuits and a global digital-to-analog converter generator to generate 2m different analog voltages, where m is an integer; wherein the row circuits in the plurality of row circuits respectively apply one of the 2m different analog voltages to an associated row in the array.
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公开(公告)号:US12200926B2
公开(公告)日:2025-01-14
申请号:US17949962
申请日:2022-09-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: H10B41/42 , G06N3/08 , G11C16/04 , H01L29/788
Abstract: Numerous examples of an input function circuit block and an output neuron circuit block coupled to a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one example, an artificial neural network comprises a vector-by-matrix multiplication array comprising a plurality of non-volatile memory cells organized into rows and columns; an input function circuit block to receive digital input signals, convert the digital input signals into analog signals, and apply the analog signals to control gate terminals of non-volatile memory cells in one or more rows of the array during a programming operation; and an output neuron circuit block to receive analog currents from the columns of the array during a read operation and generate an output signal.
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公开(公告)号:US12176039B2
公开(公告)日:2024-12-24
申请号:US18140103
申请日:2023-04-27
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Stanley Hong , Stephen Trinh , Thuan Vu , Steven Lemke , Vipin Tiwari , Nhan Do
Abstract: In one example, a method comprises determining a program resolution current value; and setting levels for a programming operation of a plurality of non-volatile memory cells in a neural network array such that a delta current between levels of each pair of adjacent cells in the plurality is a multiple of the program resolution current value.
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公开(公告)号:US20240339136A1
公开(公告)日:2024-10-10
申请号:US18206488
申请日:2023-06-06
Applicant: Silicon Storage Technology, Inc.
Inventor: Kha Nguyen , Anh Ly , Hieu Van Tran , Hien Pham , Henry Tran
CPC classification number: G11C7/1039 , G11C7/12
Abstract: Numerous examples are disclosed of a row address decoding scheme. In one example, a memory system comprises m banks of non-volatile memory cells, the m banks respectively comprising n or fewer sectors and the sectors respectively comprising p rows, and a row decoder to receive a row address comprising r bits and to identify (i) a row using the least significant t bits in the r bits, (ii) a bank using the next u least significant bits, and (iii) a sector using the next v least significant bits, where m≤2u, n≤2v, and p≤2t.
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205.
公开(公告)号:US20240312517A1
公开(公告)日:2024-09-19
申请号:US18419079
申请日:2024-01-22
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Vipin Tiwari , Nhan Do
CPC classification number: G11C11/54 , G06N3/065 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/3418 , G11C2216/04
Abstract: In one example, a method comprises erasing at the same time a word of non-volatile memory cells in an array of non-volatile memory cells arranged into rows and columns, each non-volatile memory cell comprising a word line terminal, a bit line terminal, and an erase gate terminal, by turning on an erase gate enable transistor coupled to erase gate terminals of the word of non-volatile memory cells.
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公开(公告)号:US20240282369A1
公开(公告)日:2024-08-22
申请号:US18645184
申请日:2024-04-24
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C11/54 , G06N3/045 , G11C16/04 , G11C16/10 , G11C16/14 , H01L29/423 , H01L29/788 , H10B41/30
CPC classification number: G11C11/54 , G06N3/045 , G11C16/0483 , G11C16/10 , G11C16/14 , H01L29/42324 , H01L29/42328 , H01L29/7883 , H10B41/30
Abstract: A neural network device with synapses having memory cells each having a floating gate and a first gate over first and second portions of a channel region disposed between source and drain regions, and a second gate over the floating gate or the source region. First lines each electrically connect the first gates in one of the memory cell rows, second lines each electrically connect the second gates in one of the memory cell rows, third lines each electrically connect the source regions in one of the memory cell rows, and fourth lines each electrically connect the drain regions in one of the memory cell columns. The synapses receive a first plurality of inputs as electrical voltages on the fourth lines, and provide a first plurality of outputs as electrical currents on the third lines.
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207.
公开(公告)号:US12056601B2
公开(公告)日:2024-08-06
申请号:US16830733
申请日:2020-03-26
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G06F1/03 , G06F7/78 , G06F11/16 , G06F17/16 , G06N3/065 , G11C11/54 , G11C11/56 , G11C13/00 , G11C29/44
CPC classification number: G06N3/065 , G06F1/03 , G06F7/78 , G06F11/1666 , G06F17/16 , G11C11/54 , G11C11/5635 , G11C13/0021 , G11C29/44
Abstract: Numerous embodiments are provided for compensating for drift error in non-volatile memory cells within a VMM array in an analog neuromorphic memory system. For example, in one embodiment, a circuit is provided for compensating for drift error during a read operation, the circuit comprising a data drift monitoring circuit coupled to the array for generating an output indicative of data drift; and a bitline compensation circuit for generating a compensation current in response to the output from the data drift monitoring circuit and injecting the compensation current into one or more bitlines of the array.
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公开(公告)号:US20240095509A1
公开(公告)日:2024-03-21
申请号:US18520500
申请日:2023-11-27
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , STANLEY HONG , ANH LY , THUAN VU , HIEN PHAM , KHA NGUYEN , HAN TRAN
Abstract: In one example, a neural network device comprises a first plurality of synapses configured to receive a first plurality of inputs and to generate therefrom a first plurality of outputs, wherein the first plurality of synapses comprises a plurality of memory cells, each of the plurality of memory cells configured to store a weight value corresponding to a number of electrons on its floating gate and the plurality of memory cells are configured to generate the first plurality of outputs based upon the first plurality of inputs and the stored weight values.
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公开(公告)号:US20240079064A1
公开(公告)日:2024-03-07
申请号:US18139908
申请日:2023-04-26
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Stanley Hong , Stephen Trinh , Thuan Vu , Steven Lemke , Vipin Tiwari , Nhan Do
CPC classification number: G11C16/10 , G06N3/065 , G11C11/5628 , G11C16/0425 , G11C16/0433 , G11C16/14 , G11C16/3459
Abstract: In one example, a system comprises a neural network array of non-volatile memory cells arranged in rows and columns; and a logical cell comprising a first plurality of non-volatile memory cells in a first row of the array and a second plurality of non-volatile memory cells in a second row adjacent to the first row; wherein the first plurality of non-volatile memory cells and the second plurality of non-volatile memory cells are configured as one or more coarse cells and one or more fine cells.
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210.
公开(公告)号:US20240062813A1
公开(公告)日:2024-02-22
申请号:US18385281
申请日:2023-10-30
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran
CPC classification number: G11C11/54 , G06N3/063 , G11C16/0425 , G11C16/10 , G11C16/24 , G11C16/26 , H10B41/30
Abstract: A first example comprises programming a memory cell to store a value; applying a series of currents of increasing size to a bit line of the memory cell; and measuring a voltage of a control gate terminal of the memory cell to determine a bias. A second example comprises programming a memory cell to store a value; applying a predetermined current to a bit line of the memory cell; and measuring a voltage of a control gate terminal of the memory cell to determine a bias.
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