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231.
公开(公告)号:US5265039A
公开(公告)日:1993-11-23
申请号:US716752
申请日:1991-06-18
Applicant: Raul Curbelo , Warren R. Howell
Inventor: Raul Curbelo , Warren R. Howell
IPC: H03M1/20
Abstract: A technique for improving the resolution of an A/D converter (30). The input analog signal is sampled to generate an analog level and the analog level is held (20) for an interval. A dither signal (22) is superimposed (23) on the held level to generate a fluctuating voltage. This fluctuating voltage is then sampled (25) a plurality of at least N times, and N sampled values are communicated to the A/D converter (30) so that N digitized values are generated. These digitized values are averaged (32) to provide an output having a digitization error reduced by a factor of up to N.sup.1/2.
Abstract translation: 一种用于提高A / D转换器(30)的分辨率的技术。 输入模拟信号被采样以产生模拟电平,并且模拟电平保持(20)一段间隔。 抖动信号(22)在保持电平上叠加(23)以产生波动电压。 然后对该波动电压进行采样(25)多次至少N次,并且将N个采样值传送到A / D转换器(30),从而生成N个数字化值。 这些数字化值被平均(32),以提供数字化误差降低到N1 / 2的因子的输出。
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公开(公告)号:US4722604A
公开(公告)日:1988-02-02
申请号:US461203
申请日:1983-01-20
Applicant: Herbert A. French , Philip Sutton
Inventor: Herbert A. French , Philip Sutton
CPC classification number: G01J9/02 , G01J2009/0211 , G01J3/45
Abstract: An interference device for discriminating between radiation sources of differing coherence length comprises means to divide received radiation from a source into two components. A path difference, defining a coherence length cut-off, is introduced into the path of one component and the components are brought together for interference. The recombined light passes through a reticle with alternate opaque and tranparent bars and an optical band-pass filter to a detector. Interference fringes present in the plane of the reticle are swept across the reticle by the action of the collection optical system of the device which includes a scanning rotating mirror. Two similar devices can be arranged for band-pass coherence length filtering and when used in conjunction with a light soruce whose coherence is modulated the device can be used for signalling.
Abstract translation: 用于区分不同相干长度的辐射源的干扰装置包括将来自源的接收辐射分成两部分的装置。 定义相干长度截止的路径差被引入到一个组件的路径中,并且组件被聚集在一起用于干扰。 重新组合的光通过具有交替的不透明透明棒和光学带通滤光器的掩模版到检测器。 通过包括扫描旋转镜的装置的收集光学系统的作用,存在于掩模版的平面中的干涉条纹扫过光罩。 可以安排两个类似的装置用于带通相干长度滤波,并且当与光耦合器一起使用时,其相干性被调制,该装置可以用于信令。
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公开(公告)号:US12031863B2
公开(公告)日:2024-07-09
申请号:US16625688
申请日:2018-07-06
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Tatsuya Sugimoto , Tomofumi Suzuki , Kyosuke Kotani
Abstract: An optical device includes: a base which includes a main surface; a movable mirror which includes a mirror surface; a first and a second elastic support portions which support the movable mirror so as to be movable along a first direction perpendicular to the main surface; an actuator which moves the movable mirror; and a first optical function portion which is disposed at one side of the movable mirror in a second direction perpendicular to the first direction. The first elastic support portion includes a pair of first levers extending from the movable mirror toward both sides of the first optical function portion in a third direction perpendicular to the first and the second directions. A length of each of first levers in the second direction is larger than the shortest distance between an outer edge of the mirror surface and an edge of the first optical function portion.
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公开(公告)号:US12029547B2
公开(公告)日:2024-07-09
申请号:US17238052
申请日:2021-04-22
Applicant: Hyperspectral Corp.
Inventor: David M. Palacios , Harry Hopper
IPC: A61B5/08 , A61B5/00 , A61B5/097 , A61B10/00 , G01J3/18 , G01J3/45 , G01N1/42 , G01N21/25 , G01N21/3504 , G01N21/359 , G01N33/497
CPC classification number: A61B5/082 , A61B5/7282 , A61B10/00 , G01J3/18 , G01J3/45 , G01N1/42 , G01N21/255 , G01N21/3504 , G01N21/359 , G01N33/497 , A61B5/097 , A61B2010/0087 , G01N2033/4975 , G01N2201/063
Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.
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公开(公告)号:US12029481B2
公开(公告)日:2024-07-09
申请号:US16854515
申请日:2020-04-21
Applicant: Digital Diagnostics Inc.
Inventor: Michael D. Abramoff , Edward DeHoog
IPC: A61B3/10 , A61B3/00 , A61B3/12 , A61B3/14 , G01B9/02 , G01B9/02015 , G01B9/02091 , G01J3/45
CPC classification number: A61B3/102 , A61B3/0008 , A61B3/0025 , A61B3/1005 , A61B3/1225 , A61B3/14 , G01B9/02027 , G01B9/02028 , G01B9/02044 , G01B9/02091 , G01J3/45 , G01B2290/65
Abstract: Provided is a snapshot spectral domain optical coherence tomographer comprising a light source providing a plurality of beamlets; a beam splitter, splitting the plurality of beamlets into a reference arm and a sample arm; a first optical system that projects the sample arm onto multiple locations of a sample; a second optical system for collection of a plurality of reflected sample beamlets; a third optical system projecting the reference arm to a reflecting surface and receiving a plurality of reflected reference beamlets; a parallel interferometer that provides a plurality of interferograms from each of the plurality of sample beamlets with each of the plurality of reference beamlets; an optical image mapper configured to spatially separate the plurality of interferograms; a spectrometer configured to disperse each of the interferograms into its respective spectral components and project each interferogram in parallel; and a photodetector providing photon quantification.
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公开(公告)号:US20240201014A1
公开(公告)日:2024-06-20
申请号:US18066899
申请日:2022-12-15
Applicant: Lawrence Livermore National Security, LLC
Inventor: David J. Erskine
IPC: G01J3/45
CPC classification number: G01J3/45 , G01J2003/283 , G01J2003/451
Abstract: Methods, systems and devices are described that improve optical spectroscopic techniques and particularly those that involve externally dispersed interferometer (EDI) techniques that result in an output spectrum having improved stability characteristics. The output spectrum minimizes the unwanted shifts in wavelength when the spectrograph component of the EDI instrument is under stresses that would otherwise shift or distort the wavelength positions of the spectrum.
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公开(公告)号:US11999612B2
公开(公告)日:2024-06-04
申请号:US17525950
申请日:2021-11-14
Applicant: Naiqian Han
Inventor: Naiqian Han
CPC classification number: B81B3/0021 , B81B3/0024 , G01J3/021 , G01J3/0218 , G01J3/10 , G01J3/45 , B81B2201/0264 , B81B2201/0271 , B81B2201/0278 , B81B2201/047 , G02B27/30
Abstract: Provided is an optical micro-electro-mechanical system (MEMS) based monitoring system, comprising: a broadband light source, a tunable optical filter (TOF), an optical etalon, a plurality of optical receivers, a plurality of optical couplers, and a plurality of optical MEM sensors; the TOF is configured to capture a transmission, reflection or interference spectrum of the optical MEMS sensors; wherein the peak or depression wavelength in the transmission, reflection or interference spectrum corresponds to a parameter of the pressure, temperature or stress, and the peak or depression wavelength can be obtained by comparing the spectrum with the periodic spectrum of the optical etalon, the optical etalon has an absolute wavelength mark; and the optical MEMS sensor comprises an optical MEMS resonator. The parameter of the pressure, temperature or stress can be obtained by the peak or depression wavelength in the transmission, the reflection or the interference spectrum of the optical MEMS sensor.
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公开(公告)号:US11913837B2
公开(公告)日:2024-02-27
申请号:US17687908
申请日:2022-03-07
Applicant: TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
Inventor: Hsin-Yen Hsu , Ye-Quang Chen , Ho-Kai Liang , Yi-Mou Huang , Jian-Zong Liu
CPC classification number: G01J3/45 , G01J3/0202 , G01J3/0208 , G01J3/024 , G01J3/0272 , G01J2003/045 , G01J3/18 , G01J2003/284
Abstract: An optical module includes a micro spectrometer. The micro spectrometer includes an optical crystal, a lens, and a photosensitive assembly. The optical crystal is configured to receive detection light and covert the detection light into interference light. The optical crystal is surrounded by a sleeve, the sleeve configured to fix a position of the optical crystal. The lens is configured for receiving the interference light and focusing the interference light. The photosensitive assembly is configured for imaging the interference light into an interference image. The optical module further comprises a controller. The controller is electrically connected to the photosensitive assembly, and the controller is used to convert the interference image into light wavelength signals and light intensity signals.
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公开(公告)号:US20240027341A1
公开(公告)日:2024-01-25
申请号:US18222109
申请日:2023-07-14
Applicant: Salvus, LLC
Inventor: Ron LEVIN , Clinton BEELAND , James LeFILES , Joseph EGAN , Timothy ZOLLERS , Jacob THOMPSON
CPC classification number: G01N21/45 , G01J3/45 , G01N33/5308 , G01N21/77 , G01N2021/7779
Abstract: A point of use analyte detection and quantification system for aquatic applications is provided. Related methods are also provided.
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240.
公开(公告)号:US20240003743A1
公开(公告)日:2024-01-04
申请号:US18467121
申请日:2023-09-14
Applicant: Gigaphoton Inc.
Inventor: Takamitsu KOMAKI , Toshihiro OGA
IPC: G01J3/45
CPC classification number: G01J3/45
Abstract: A laser device connectable to an exposure apparatus includes a spectrometer configured to generate a measurement waveform from an interference pattern of laser light output from the laser device; and a processor configured to calculate a first spectral waveform indicating a relationship between a wavelength and a light intensity using the measurement waveform, calculate a representative waveform included in a wavelength range of the first spectral waveform, and calculate an evaluation value of the first spectral waveform using a first integration value obtained by integrating, over the wavelength range, a product of a function of a wavelength deviation from the representative wavelength and the light intensity.
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