公开(公告)号：US20150211842A1

公开(公告)日：2015-07-30

申请号：US14601280

申请日：2015-01-21

Applicant: MITUTOYO CORPORATION

Inventor： Masaoki YAMAGATA ,  Kentaro NEMOTO ,  Toshihisa TAKAI ,  Tadashi IWAMOTO

IPC: G01B11/24

CPC classification number: G01B11/24 ,  G01B11/25

Abstract: An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector.

Abstract translation: 根据本发明的照明装置包括光源，反射镜，光学系统和计算器。 反射镜包括第一反射器和第二反射器，并且能够在改变反射角的同时将物体反射并引导到第一分开的光，所述第一分割光是来自所述光源的光的一部分 第一反射器 光学系统将来自光源的光分成第一分割光和第二分光，并将第二分光引导到第二反射器。 计算器能够通过接收由第二反射器反射的第二分割光来计算反射镜的反射角。

公开(公告)号：US20150177027A1

公开(公告)日：2015-06-25

申请号：US14575027

申请日：2014-12-18

Applicant: Mitutoyo Corporation

Inventor： Yoshiaki Kato

IPC: G01D5/347

CPC classification number: G01D5/34707 ,  G01D5/34715 ,  G01D5/34746

Abstract: An optical encoder according to the present invention includes a light source that emits light; a scale including scale gratings each having a predetermined pitch; a light source grating disposed between the light source and the scale and having a predetermined pitch; and an interference fringe detector that detects an interference fringe generated by the light source grating and the scale. The scale gratings are disposed side by side, and the adjacent scale gratings are displaced from each other by a ½ period.

Abstract translation: 根据本发明的光学编码器包括发光的光源; 尺度包括每个具有预定间距的刻度光栅; 光源光栅，设置在所述光源和所述标尺之间并具有预定的间距; 以及干涉条纹检测器，其检测由光源光栅和刻度产生的干涉条纹。 刻度光栅并排布置，并且相邻的刻度光栅彼此相移一个半周期。

公开(公告)号：US20150159987A1

公开(公告)日：2015-06-11

申请号：US14563205

申请日：2014-12-08

Applicant: MITUTOYO CORPORATION

Inventor： Shinsaku ABE

IPC: G01B5/008

CPC classification number: G01B5/008 ,  G01B21/047

Abstract: A multi-axis type three-dimensional measuring apparatus includes a multi-axis arm mechanism, a probe formed in a distal end of the multi-axis arm mechanism and configured to measure a workpiece, and a projector formed in the distal end of the multi-axis arm mechanism and configured to scale a range of a projected projection image according to a distance between the workpiece and the probe. The projector is configured to project full-scale projection graphics of said workpiece so as to match the full-scale projection graphics with the workpiece regardless of a difference in a distance between the workpiece and the probe, and to project display information identifying a measurement schedule position by the probe.

Abstract translation: 多轴型三维测量装置包括多轴臂机构，形成在多轴臂机构的远端并构造成测量工件的探针，以及形成在多轴臂机构的远端的投影仪 并且被构造为根据工件和探头之间的距离来缩放投影投影图像的范围。 该投影仪被配置为投影所述工件的全尺寸投影图形，以便将全尺寸投影图形与工件匹配，而不管工件和探针之间的距离的差异，以及投影识别测量计划的显示信息 探头位置。

公开(公告)号：US20150131697A1

公开(公告)日：2015-05-14

申请号：US14514882

申请日：2014-10-15

Applicant: MITUTOYO CORPORATION

Inventor： Hisayoshi SAKAI

IPC: G01N25/16 ,  G01B11/14 ,  G01B7/14

CPC classification number: G01N25/16 ,  G01B5/0014 ,  G01B5/008 ,  G01B21/045

Abstract: An industrial machine includes a moving mechanism moving one of a probe and a tool relative to a work piece, using three displacement axes parallel to each of three orthogonal axis directions; a low thermal expansion member formed with a material having a smaller thermal expansion coefficient than a material forming a structural element of the moving mechanism; and an expansion/contraction measurer measuring, using the low thermal expansion member as a reference, an amount of expansion/contraction of the structural element in one of the three orthogonal axis directions, the expansion/contraction occurring due to a change in temperature.

Abstract translation: 一种工业机械包括使用平行于三个正交轴方向中的每一个的三个位移轴移动探针和工具中的一个相对于工件的移动机构; 低热膨胀构件，其形成有具有比形成移动机构的结构元件的材料更小的热膨胀系数的材料; 以及使用低热膨胀构件作为基准的膨胀/收缩测量器在三个正交轴方向中的一个方向上的结构元件的膨胀/收缩量，由于温度变化而发生膨胀/收缩。

公开(公告)号：US09029757B2

公开(公告)日：2015-05-12

申请号：US13787742

申请日：2013-03-06

Applicant: Mitutoyo Corporation

Inventor： Joseph Daniel Tobiason

IPC: G01D5/347

CPC classification number: G01D5/34715 ,  G01D5/34792

Abstract: An illumination portion of an optical encoder comprising a scale track extending along a measuring axis direction, an imaging portion, and a detector configuration. The illumination portion comprises: a light source configured to output source light; a collimation portion; and a structured illumination generating portion comprising a beam-separating portion and an illumination grating and configured to input the source light and output structured illumination to the scale track. The beam-separating portion is arranged to input the source light and output a first source light portion and a second source light portion to the illumination grating, such that they form beams that are spaced apart from one another along the measuring axis direction. The illumination grating is configured to diffract the first and second source light portions to the scale track such that only two orders of diffracted light overlap within an imaged region.

Abstract translation: 光学编码器的照明部分包括沿测量轴方向延伸的刻度轨道，成像部分和检测器配置。 照明部分包括：被配置为输出源光的光源; 准直部分 以及结构化照明产生部分，其包括光束分离部分和照明光栅，并被配置为输入源光并将结构化照明输出到刻度轨道。 光束分离部分被布置成输入源光并将第一源光部分和第二源光部分输出到照明光栅，使得它们形成沿着测量轴线方向彼此间隔开的光束。 照明光栅被配置为将第一和第二源光部分衍射到刻度轨道，使得在成像区域内只有两个衍射光重叠。

公开(公告)号：US20150077761A1

公开(公告)日：2015-03-19

申请号：US14483723

申请日：2014-09-11

Applicant: MITUTOYO CORPORATION

Inventor： Masaoki YAMAGATA

IPC: G01B11/00 ,  G01B11/24

CPC classification number: G01B11/005 ,  G01B11/24 ,  G01B11/25

Abstract: Coordinate measuring apparatus includes a probe having an optical system emitting light along a plane at a workpiece, an image capture apparatus having image capture elements arranged on an image capture plane and capturing an image of the workpiece from a position different from that of the predetermined plane, and a controller controlling the emitting optical system. The controller determines whether the image capture elements arranged in an image capture region on the image capture plane detect light incident on the workpiece due to the light from the emitting optical system, turns on the light emitted from the emitting optical system when the image capture elements arranged within the image capture region detect the incident light, and blinks the light emitted from the emitting optical system at a predetermined periodicity when the image capture elements arranged within the image capture region do not detect the incident light.

Abstract translation: 坐标测量装置包括具有沿着工件的平面发光的光学系统的探针，具有布置在图像捕获平面上的图像捕获元件并从与预定平面不同的位置捕获工件的图像的图像捕获装置 ，以及控制发光光学系统的控制器。 控制器确定布置在图像捕获平面上的图像捕获区域中的图像捕获元件是否由于来自发射光学系统的光而检测入射在工件上的光，当图像捕获元件 布置在图像拍摄区域内的图像捕获区域检测入射光，并且当布置在图像捕获区域内的图像捕获元件不检测入射光时，以预定的周期闪烁从发射光学系统发射的光。

公开(公告)号：US20150059196A1

公开(公告)日：2015-03-05

申请号：US14473444

申请日：2014-08-29

Applicant: MITUTOYO CORPORATION

Inventor： Yoshiro ASANO ,  Sadayuki MATSUMIYA ,  Shigeru OHTANI ,  Atsuya NIWANO ,  Shozaburo TSUJI

IPC: G01B3/18

CPC classification number: G01B3/18

Abstract: A micrometer with good usability is provided. A micrometer has a frame with an anvil at one end and a spindle at another end, the spindle moving closer to or further away from the anvil. The frame is covered with a heat shield cover. The heat shield cover has a first anti-slip part. The first anti-slip part preferably has a plurality of protrusions.

Abstract translation: 提供了具有良好可用性的千分尺。 千分尺具有在一端具有砧座的框架，另一端具有主轴，主轴移动靠近或远离砧座。 框架覆盖有隔热罩。 隔热罩具有第一防滑部分。 第一防滑部优选具有多个突起。

公开(公告)号：US08953170B2

公开(公告)日：2015-02-10

申请号：US13782084

申请日：2013-03-01

Applicant: Mitutoyo Corporation

Inventor： Atsushi Usami ,  Tatsuya Nagahama

IPC: G01B9/02 ,  G01B9/04

CPC classification number: G01B9/02075 ,  G01B9/02007 ,  G01B9/02058 ,  G01B9/0209 ,  G01B9/04 ,  G01B2290/70

Abstract: A white-light interferometric measuring device includes: a white light source that emits a white light beam; a beam splitter that reflects the white light beam; and an interference objective lens that collects the white light beam having reflected off the beam splitter in the direction of an optical axis and irradiates a measurement workpiece with the white light beam, the interference objective lens generating interference between a measurement light beam obtained by reflection of the white light beam off the measurement workpiece and a reference light beam obtained by branching of the white light beam to be converged on the measurement workpiece. Polarization correcting means that corrects the white light beam to enter the interference objective lens to circularly polarized light is arranged between the white light source and the interference objective lens.

Abstract translation: 白光干涉测量装置包括：发射白光束的白光源; 反射白光束的分束器; 以及干涉物镜，其收集沿光轴方向反射的分束器的白光束，并将白色光束照射测量工件，干涉物镜产生通过反射获得的测量光束之间的干涉 白光束离开测量工件，通过白光束的分支获得的参考光束被聚焦在测量工件上。 在白光源和干涉物镜之间配置有将白光进入干涉物镜的圆偏振光进行偏振校正的装置。

公开(公告)号：US20150033859A1

公开(公告)日：2015-02-05

申请号：US14448108

申请日：2014-07-31

Applicant: MITUTOYO CORPORATION

Inventor： Shogo SHIRASAWA

IPC: G01P15/125

CPC classification number: G01P15/125 ,  G01P15/097

Abstract: A physical quantity detector includes a first displacement detector configured by a pair of capacitors, which are configured by first movable electrodes formed on a pendulum, and a pair of first fixed electrodes; a second displacement detector provided below the first displacement detector, and configured by a pair of capacitors, which are configured by second movable electrodes formed on the pendulum, and a pair of second fixed electrodes; a first detection circuit detecting a difference between capacitance values of each of the pair of capacitors of the first displacement detector; a second detection circuit detecting the difference between the capacitance values of each of the pair of capacitors of the second displacement detector; and an instrumentation amplifier calculating a difference between the differences in the capacitance values detected by the first detection circuit and the second detection circuit.

Abstract translation: 物理量检测器包括由一对电容器构成的第一位移检测器，其由形成在摆锤上的第一可动电极和一对第一固定电极构成; 第二位移检测器，设置在第一位移检测器的下方，由一对电容器构成，该电容器由形成在摆锤上的第二可动电极构成，以及一对第二固定电极; 第一检测电路，检测第一位移检测器的一对电容器中的每一个的电容值之差; 第二检测电路，检测所述第二位移检测器的所述一对电容器中的每一个的电容值之间的差; 以及仪表放大器，其计算由所述第一检测电路和所述第二检测电路检测的电容值之差。

公开(公告)号：US08931185B2

公开(公告)日：2015-01-13

申请号：US13705085

申请日：2012-12-04

Applicant: Mitutoyo Corporation

Inventor： Casey Emtman ,  Michael Nahum

IPC: G01B3/24 ,  G01B3/00 ,  G01B3/20

CPC classification number: G01B3/002 ,  G01B3/205

Abstract: An electronic caliper generates power for measurement operations. The caliper comprises a scale member, a slider, a signal processing portion configured to measure a displacement between the scale member and slider, a power generating arrangement attached to the slider comprising a gear assembly configured to rotate in response to a force provided through the scale member to the gear assembly by a user opening or closing the caliper, and a power generator coupled to the gear assembly and configured to rotate in response to force provided by the rotating gear assembly and provide power to the signal processing portion. The power generating arrangement generates power as the user opens or closes the caliper and is configured such that it contributes a motion resistance force component of at most 20N during the user opening or closing the caliper using a maximum manual acceleration and/or speed.

Abstract translation: 电子卡尺产生用于测量操作的电力。 卡尺包括刻度部件，滑块，被配置为测量刻度尺和滑块之间的位移的信号处理部分，附接到滑块的发电装置，包括齿轮组件，该齿轮组件响应于通过刻度尺提供的力而旋转 通过使用者打开或关闭卡钳到齿轮组件的构件，以及耦合到齿轮组件并被配置为响应于由旋转齿轮组件提供的力而旋转并且向信号处理部分提供动力的发电机。 当用户打开或关闭卡钳时，发电装置产生电力，并且被配置为使得在用户使用最大手动加速度和/或速度打开或关闭卡尺期间，其产生至多20N的运动阻力分量。