FLASH MEMORY APPARATUS AND STORAGE MANAGEMENT METHOD FOR FLASH MEMORY

    公开(公告)号:US20180143876A1

    公开(公告)日:2018-05-24

    申请号:US15874895

    申请日:2018-01-19

    Abstract: A method used for a flash memory module having a plurality of storage blocks each can be used as a first block or a second block includes: classifying data into a plurality of groups of data; respectively executing error code encoding to generate a first corresponding parity check code to store the groups of data and the first corresponding parity check code into the flash memory module as first blocks; reading out the groups of data from the first blocks; executing error correction and de-randomize operation upon read out data to generate de-randomized data; executing randomize operation upon the de-randomized data according to a set of seeds to generate randomized data; performing error code encoding upon the randomized data to generate a second corresponding parity check code; and storing the randomized data and the second corresponding parity check code into the flash memory module as the second block.

    Data Storage Device and Data Writing Method Thereof

    公开(公告)号:US20180101302A1

    公开(公告)日:2018-04-12

    申请号:US15659203

    申请日:2017-07-25

    Inventor: Wen-Sheng Lin

    Abstract: A data storage device including a flash memory and a controller is provided. The flash memory has a plurality of TLC blocks, each of which includes a plurality of pages. The controller checks whether any of the TLC blocks was undergoing a write operation and unfinished at the time that the power-off event occurred when the data storage device resumes operation after a power-off event. When a first TLC block was undergoing the write operation and unfinished at the time that the power-off event occurred, the controller further checks whether data stored in a page which was the last one being written in the first TLC block can be successfully read, and continues to write the remaining data into the first TLC block when the data of the page which was the last one being written in the first TLC block can be successfully read.

    METHOD FOR SCREENING BAD COLUMN IN DATA STORAGE MEDIUM

    公开(公告)号:US20170372797A1

    公开(公告)日:2017-12-28

    申请号:US15598239

    申请日:2017-05-17

    Inventor: Sheng Yuan Huang

    Abstract: A method for screening bad columns in a data storage medium includes steps of: writing predetermined data into at least one sample block; comparing the written data with the predetermined data to calculate numbers of error bits in the plurality of columns; defining an inspection window covering a portion of the columns; summing the numbers of error bits in the portion of columns in the inspection window to obtain a total number of error bits and determining whether the total number of error bits is greater than a number of correctable bits; if yes, determining a start point and a terminal point of a bad column interval in the inspection window, wherein the numbers of error bits in the columns between the start point and the terminal point are greater than a threshold of error bits; and labeling the columns in the bad column interval as bad columns.

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