摘要:
A semiconductor memory has memory cells arranged in arrays, direct-type sense amplifiers arranged in each column of the memory cells, for writing and reading data to and from a memory cell to be accessed, column selection lines for selecting sense amplifiers that are in a column that involves the memory cell to be accessed, write-only column selection lines for selecting sense amplifiers that are in a row that involves the memory cell to be accessed if the memory cell is accessed to write data thereto, and local drivers. The sense amplifiers are grouped, in each row, into sense amplifier blocks. The write-only column selection lines consist of first selection lines for selecting sense amplifier blocks that are in the row that involves the memory cell to be accessed for data write and second selection lines for selecting sense amplifiers that are contained in the selected sense amplifier blocks. The local drivers apply a selection signal to the second selection lines according to a selection signal from the first selection lines. The write-only column selection lines are controlled by signals that are used to control the sense amplifiers.
摘要:
A photomask has a plurality of transparent regions defined in an opaque region and classified into first and second groups. Each of the transparent regions belonging to one of the first and second groups is provided with a phase shifter, so that the phase of light transmitted through the transparent region belonging to the first group becomes different from the phase of light transmitted through the transparent region belonging to the second group. The photomask includes: a pair of first transparent regions belonging to the first group and including linear portions disposed in parallel, a virtual straight line interconnecting one ends of the first transparent regions intersecting at a right angle with the extension direction of the linear portions; and a second transparent region belonging to the second group and disposed at the center between, and in parallel to, the linear portions of the pair of first transparent regions, the second transparent region including a linear thickportion and a linear thin portion, the linear thin portion being disposed in an area between the pair of first transparent regions and continuously coupled to the linear thick portion, and a connection portion between the thick and thin portions being indented from the virtual straight line toward the area between the pair of first transparent regions.
摘要:
A semiconductor device includes a word line drive circuit for resetting the word line by driving the word line connected to a memory cell and is constituted so as to switch a reset level of the word line drive circuit, which is set at the time of the reset operation of the word line, between a first potential such as a ground potential and a second potential such as a negative potential. Further, a semiconductor device including a memory cell array formed by arranging a plurality of memory cells and a word line reset level generating circuit for generating a negative potential makes it possible to vary the amount of a current supply of the word line reset level generating circuit when non-selected word lines are set to a negative potential by applying the output of the word line reset level generating circuit to the non-selected word lines, and varies the amount of the current supply of the negative potential in accordance with the operation of the memory cell array. Furthermore, in a semiconductor device including a plurality of power source circuits each having an oscillation circuit and a capacitor, for driving the capacitor by the oscillation signal outputted by the oscillation circuit, at least a part of these power source circuits shares in common the oscillation circuit, and different capacitors are driven by the oscillation signal outputted from the common oscillation circuit.
摘要:
A semiconductor memory device having a shift redundancy function includes a switch circuit for changeably connecting a plurality of decode signal lines decoding an address signal to a plurality of selecting lines and redundancy selecting lines, and executes a switch operation for shifting at least one of a plurality of decode lines in the direction of a first redundancy selecting line positioned at one of the ends among a plurality of selecting lines or a second switch operation for shifting at least one of the decode lines in the direction of a second redundancy selecting line positioned at the other end among the selecting lines or both of the first and second operations when any fault occurs in a plurality of selecting lines. The semiconductor memory device preferably includes two or more first redundancy selecting lines positioned at one of the ends of a plurality of selecting lines, two or more second redundancy selecting lines positioned at the other end, and first and second switch units disposed in two stages. When any fault selecting line occurs, the first switch unit executes a first switch operation for shifting at least one of the decode signal lines in the direction of the first redundancy selecting line or a second switch operation for shifting the same in the direction of the second redundancy selecting line, or the second switch unit executes a third switch operation for shifting at least one decode signal line in the direction of the first redundancy selecting line or a fourth switch operation for shifting it in the direction of the second redundancy selecting line.
摘要:
A semiconductor device includes a word line drive circuit for resetting the word line by driving the word line connected to a memory cell and is constituted so as to switch a reset level of the word line drive circuit, which is set at the time of the reset operation of the word line, between a first potential such as a ground potential and a second potential such as a negative potential. Further, a semiconductor device including a memory cell array formed by arranging a plurality of memory cells and a word line reset level generating circuit for generating a negative potential makes it possible to vary the amount of a current supply of the word line reset level generating circuit when non-selected word lines are set to a negative potential by applying the output of the word line reset level generating circuit to the non-selected word lines, and varies the amount of the current supply of the negative potential in accordance with the operation of the memory cell array. Furthermore, in a semiconductor device including a plurality of power source circuits each having an oscillation circuit and a capacitor, for driving the capacitor by the oscillation signal outputted by the oscillation circuit, at least a part of these power source circuits shares in common the oscillation circuit, and different capacitors are driven by the oscillation signal outputted from the common oscillation circuit.
摘要:
It is intended to provide a semiconductor integrated circuit device and adjustment method of the same semiconductor integrated circuit device, capable of adjusting an analog signal outputted from an incorporated analog signal generating section without outputting it outside as an analog value. An analog signal AOUT is outputted from an analog signal generating section 3 in which an adjustment signal AD is inputted. The analog signal AOUT is inputted to a judgment section 1, in which it is compared and judged with a predetermined value and then a judgment signal JG is outputted. The judgment signal JG acts on a predetermined signal storing section 4 as an internal signal and the adjustment signal AD is fetched into the predetermined signal storing section 4. Further, the judgment signal JG is outputted as digital signal through an external terminal T2 and an external tester device acquires the adjustment signal and stores the acquired adjustment signal in the predetermined signal storing section 4. Consequently, the analog signal can be adjusted as analog value without being outputted outside and an adjustment test can be carried out with a simple tester device and according to a simple test method accurately and rapidly.
摘要:
The present invention provides a semiconductor memory device of a twin-storage type having an operation control method and a circuit structure that achieve a higher process rate, a less power consumption, and a smaller chip area. This semiconductor memory device includes bit lines in pairs, a sense amplifier connected to each pair of the bit lines, a first memory cell connected to one bit line of each pair of the bit lines, a second memory cell that is connected to the other bit line of each pair of the bit lines and stores the inverted data of the data stored in the first memory cell. This semiconductor memory device is characterized by not having means to pre-charge the bit lines to a predetermined potential. The semiconductor memory device of the present invention is also characterized by including a control circuit that controls the sense amplifier to start a pull-down operation after starting a pull-up operation.
摘要:
A semiconductor memory device is provided with a clock generation circuit that generates a first clock that has the same frequency and phase as an external clock, and a second clock that has the same frequency as the external clock but a phase a quarter phase shifted, and the first clock and the second clock are supplied to the two DDR-DRAMs as clocks so that the two DDR-DRAMs can operate in a state of being a quarter phase shifted from each other. A data output section outputs data respectively for time periods corresponding to a quarter phase from points a fixed phase behind the leading edge and the trailing edge of the first or the second clock and brings a data output circuit into a high impedance state for other time periods.
摘要:
During a read operation, data read from memory cells onto bit lines are amplified simultaneously by sense amplifiers and outputted to the exterior of a memory. In this operation, a data control circuit outputs to the exterior all the data read from the memory cells onto the bit lines and amplified simultaneously by the sense amplifiers. During a write operation, data supplied from the exterior to the bit lines are amplified by the sense amplifiers and written into the memory cells. In this operation, the data control circuit writes into the memory cells all the data inputted from the exterior and amplified simultaneously by the sense amplifiers. Since all the data amplified simultaneously by the sense amplifiers are inputted/outputted from/to the exterior, the data transfer rate of the input/output data can be improved and the power consumption per unit amount of transferred data can be reduced.