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公开(公告)号：US20170310277A1
公开(公告)日：2017-10-26
申请号：US15133281
申请日：2016-04-20
Applicant: International Business Machines Corporation
Inventor： Shu-Jen Han , Keith A. Jenkins
CPC classification number: H03B5/1278 , H03B5/1212 , H03B5/1243 , H03B5/1268 , H03K3/03
Abstract: A voltage controlled oscillator (VCO) and a method of operating the VCO are disclosed. The VCO includes an inductor device, a capacitor device coupled in parallel with the inductor device through first and second nodes, and a pair of cross-coupled transistors coupled in parallel with the inductor device and the capacitor device through the first and second nodes. At least one of the pair of cross-coupled transistor includes a plurality of sub transistors coupled in parallel. The sub transistors are individually switchable to adjust current drive capability of each of the sub transistors. Each of the sub transistors includes a first gate and a second gate.
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公开(公告)号：US20170276728A1
公开(公告)日：2017-09-28
申请号：US15080937
申请日：2016-03-25
Applicant: International Business Machines Corporation
Inventor： Keith A. Jenkins , Barry P. Linder
IPC: G01R31/3183
Abstract: Embodiments are directed to a system for measuring a degradation characteristic of a plurality of electronic components. The system includes a parallel stress generator communicatively coupled to the plurality of electronic components, and a serial electronic measuring component communicatively coupled to the plurality of electronic components. The parallel stress generator is configured to generate a plurality of stress signals, apply the plurality of stress signals in parallel to the plurality of electronic components and remove the plurality of stress signals from the plurality of electronic components. The serial electronic measuring component is configured to, subsequent to the removal of the plurality of stress signals, sequentially measure the degradation characteristic of each one of the plurality of electronic components in order to determine their degradation resulting from the applied stress signals.
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公开(公告)号：US20170254846A1
公开(公告)日：2017-09-07
申请号：US15060497
申请日：2016-03-03
Applicant: International Business Machines Corporation
Inventor： Chen-Yong Cher , Keith A. Jenkins , Barry P. Linder
IPC: G01R31/02 , G01R19/165
CPC classification number: G01R31/025 , G01R19/165 , G01R31/2884 , G01R31/3008
Abstract: Method of measuring semiconductor device leakage which includes: providing a semiconductor device powered by a supply voltage and having a circuit block of transistors; providing on the semiconductor device a test circuit providing an input to a counter and a fixed-frequency measurement clock to provide a clock signal to the counter; disconnecting a system clock from the circuit block; receiving by the test circuit the supply voltage as an input; initializing the counter; starting the counter when the supply voltage is at or below a first voltage Vhigh; monitoring a decrease of the supply voltage with time; stopping the counter when the supply voltage is at or below a second voltage Vlow such that Vhigh is greater than Vlow; and reading the counter to provide the semiconductor device leakage metric. Also disclosed is an apparatus and a computer program product.
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公开(公告)号：US20170160339A1
公开(公告)日：2017-06-08
申请号：US14962043
申请日：2015-12-08
Applicant: International Business Machines Corporation
Inventor： Keith A. Jenkins
IPC: G01R31/28
CPC classification number: G01R31/2882
Abstract: A computer system may determine a first set of output values for a set of test paths at a first time. Each output value may correspond to a test path in the set of test paths. The computer system may then determine a second set of output values at a second time. Each output value in the second set of output values may have an associated output value in the first set of output values. The computer system may then determine whether degradation of the semiconductor chip has occurred by comparing the first set of output values to the second set of output values.
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公开(公告)号：US20160313276A1
公开(公告)日：2016-10-27
申请号：US14744574
申请日：2015-06-19
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Shu-Jen Han , Keith A. Jenkins
IPC: G01N27/414
CPC classification number: G01N27/4141 , G01N27/4146 , G01N33/0075
Abstract: A method of assembling a remote sensor system to detect a gas or chemical and a remote sensor system are described. The method includes fabricating a sensor, the sensor outputting a sensor signal that changes upon contact of the sensor with the gas or chemical and the sensor having an input port for a clock signal, coupling a capacitor to the sensor, the capacitor output voltage resulting from the sensor signal output by the sensor, and coupling a mixer to the capacitor and a low frequency oscillator, the mixer configured to mix the capacitor output voltage with the low frequency oscillator output to generate an output signal. The method also includes coupling an antenna to the mixer, the antenna configured to transmit the output signal indicating detection of the gas or chemical.
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Patent Agency Ranking
公开(公告)号：US20160191255A1
公开(公告)日：2016-06-30
申请号：US14586103
申请日：2014-12-30
Applicant: International Business Machines Corporation
Inventor： Wilfried Haensch , Shu-Jen Han , Keith A. Jenkins , Dirk Pfeiffer
CPC classification number: H04L9/0861 , G09C1/00 , H04L9/0866 , H04L2209/12
Abstract: Techniques for use of carbon nanotubes as an anti-tampering feature and for use of randomly metallic or semiconducting carbon nanotubes in the generation of a physically unclonable cryptographic key generation are provided. In one aspect, a cryptographic key having an anti-tampering feature is provided which includes: an array of memory bits oriented along at least one bit line and at least one word line, wherein each of the memory bits comprises a memory cell, wherein the cryptographic key is stored in the memory cell, and wherein the memory cell is connected to the at least one bit line; and a metallic carbon nanotube interconnect which connects the memory cell to the at least one word line. A cryptographic key and method for processing the cryptographic key are also provided.
Abstract translation: 提供了使用碳纳米管作为防篡改特征的技术，并且在生成物理上不可克隆的密码密钥生成时使用随机金属或半导体碳纳米管。 一方面，提供了具有防篡改特征的密码密钥，其包括：沿至少一个位线和至少一个字线定向的存储器位阵列，其中每个存储器位包括存储器单元，其中， 加密密钥存储在存储器单元中，并且其中存储单元连接到至少一个位线; 以及将存储单元连接到至少一个字线的金属碳纳米管互连。 还提供了用于处理加密密钥的加密密钥和方法。
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公开(公告)号：US11131706B2
公开(公告)日：2021-09-28
申请号：US14962043
申请日：2015-12-08
Applicant: International Business Machines Corporation
Inventor： Keith A. Jenkins
IPC: G01R31/28 , G06F30/3312 , G01R31/3193 , G01R31/3177 , G01R31/317 , G01R31/30
Abstract: A computer system may determine a first set of output values for a set of test paths at a first time. Each output value may correspond to a test path in the set of test paths. The computer system may then determine a second set of output values at a second time. Each output value in the second set of output values may have an associated output value in the first set of output values. The computer system may then determine whether degradation of the semiconductor chip has occurred by comparing the first set of output values to the second set of output values.
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公开(公告)号：US10901025B2
公开(公告)日：2021-01-26
申请号：US16110275
申请日：2018-08-23
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Barry P. Linder , Keith A. Jenkins
IPC: G01R31/319 , G01R31/26 , G01R31/28
Abstract: Methods and systems for measuring degradation includes measuring an initial electrical characteristic of a test device in a ring oscillator that includes multiple oscillator stages and a test stage having a delay stage and the test device. The ring oscillator is operated for a period of time. The electrical characteristic of the test device is measured after operating the ring oscillator. A level of degradation in the test device is determined using a processor based on the measurements of the electrical characteristic of the test device.
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公开(公告)号：US20190266538A1
公开(公告)日：2019-08-29
申请号：US16406157
申请日：2019-05-08
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Karthik Balakrishnan , Keith A. Jenkins , Barry P. Linder
Abstract: A computer-implemented method for analyzing customer satisfaction is presented. The computer-implemented method may include capturing visual images related to individuals and order consumables, determining, by a processor, at least one measurable metric to predict variations indicating different satisfaction levels, and dynamically refining parameters if the variations exceed one or more thresholds. The computer-implemented method further includes receiving the captured visual images of the individuals and the order consumables by least one camera in communication with the processor.
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公开(公告)号：US20180322025A1
公开(公告)日：2018-11-08
申请号：US16035032
申请日：2018-07-13
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Keith A. Jenkins , Barry P. Linder , Emily A. Ray , Raphael P. Robertazzi , Peilin Song , James H. Stathis , Kevin G. Stawiasz , Franco Stellari , Alan J. Weger , Emmanuel Yashchin
CPC classification number: G06F11/2236 , G06F11/008 , G06F11/2273 , G06F11/24 , G06F11/263
Abstract: A method and system are provided for chip testing. The method includes selectively deploying a chip for future use or discarding the chip to prevent the future use, responsive to a stress history of the chip determined using a non-destructive test procedure. The test procedure includes ordering each of a plurality of functional patterns by a respective minimum operating period corresponding thereto. The test procedure further includes ranking each of the plurality of patterns based on at least one preceding available pattern to provide a plurality of pattern ranks. The test procedure also includes calculating a sum by summing the plurality of pattern ranks. The sum calculated during an initial performance of the test procedure is designated as a baseline, and the sum calculated during a subsequent performance of the test procedure is compared to a threshold derived from the baseline to determine the stress history of the chip.
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