MEMORY DEVICE WRITE CIRCUITRY
    24.
    发明申请

    公开(公告)号:US20190198088A1

    公开(公告)日:2019-06-27

    申请号:US16049576

    申请日:2018-07-30

    Abstract: Devices and methods include, for a memory device, generating a main input-output line signal on a main input-output line using driving circuitry. The main input-output line is coupled to multiple sensing amplifiers. Each of the sensing amplifiers each locally generate a local data line from the main data line. Each of the sensing amplifiers also includes multiple local sensing amplifiers that are selectively coupled to the generated local data line for overwriting data in the respective local sensing amplifiers.

    Shifting data in sensing circuitry
    26.
    发明授权

    公开(公告)号:US10242722B2

    公开(公告)日:2019-03-26

    申请号:US15978578

    申请日:2018-05-14

    Abstract: The present disclosure includes apparatuses and methods related to shifting data. An example apparatus comprises sensing circuitry including a sense amplifier and a compute component having a first storage location and a second storage location associated therewith. A controller is coupled to the sensing circuitry. The controller is configured to control an amount of power associated with shifting a data value stored in the first storage location to the second storage location by applying a charge sharing operation.

    Column repair in memory
    27.
    发明授权

    公开(公告)号:US10068664B1

    公开(公告)日:2018-09-04

    申请号:US15600409

    申请日:2017-05-19

    CPC classification number: G11C29/702 G11C29/785 G11C29/81 G11C29/848

    Abstract: Apparatuses and methods related to column repair in memory are described. An apparatus can include sensing circuitry. The sensing circuitry can include a first sensing component, a second sensing component, and a third sensing component. The second sensing component can include a defective sense amplifier that is column repaired. The apparatus can include a controller configured to use the sensing circuitry to shift data from the first sensing component to the third sensing component by transferring the data through the second sensing component. The second sensing component can be physically located between the first sensing component and the third sensing component.

    Apparatuses including a memory array with separate global read and write lines and/or sense amplifier region column select line and related methods
    29.
    发明授权
    Apparatuses including a memory array with separate global read and write lines and/or sense amplifier region column select line and related methods 有权
    装置包括具有单独的全局读写线和/或读出放大器区列选择线和相关方法的存储器阵列

    公开(公告)号:US09224436B2

    公开(公告)日:2015-12-29

    申请号:US13902591

    申请日:2013-05-24

    CPC classification number: G11C7/062 G11C7/065 G11C7/12 G11C7/18

    Abstract: Apparatuses and methods for memory arrays with separate global read and write lines and/or sense amplifier region column select lines are disclosed. An example apparatus includes first and second memory sections, and further includes a sense amplifier region. A memory section includes a word line extending in a first direction and a digit line extending in a second direction, and the sense amplifier region is disposed between the first and second memory sections. The sense amplifier region includes a sense amplifier coupled to the digit line, a local input/output (LIO) line, a column select circuit coupled to the sense amplifier, and a column select line. The column select line extends in the first direction and is configured to provide a column select signal to the column select circuit. Capacitance of a LIO line may be reduced by coupling fewer sense amplifiers of a group to the LIO line.

    Abstract translation: 公开了具有单独的全局读写线和/或读出放大器区列选择线的存储器阵列的装置和方法。 示例性装置包括第一和第二存储器部分,并且还包括读出放大器区域。 存储器部分包括在第一方向上延伸的字线和在第二方向上延伸的数字线,并且读出放大器区域设置在第一和第二存储器部分之间。 感测放大器区域包括耦合到数字线的读出放大器,本地输入/输出(LIO)线,耦合到读出放大器的列选择电路和列选择线。 列选择线在第一方向上延伸并且被配置为向列选择电路提供列选择信号。 LIO线的电容可以通过将较少的组的读出放大器耦合到LIO线来减少。

    APPARATUSES INCLUDING A MEMORY ARRAY WITH SEPARATE GLOBAL READ AND WRITE LINES AND/OR SENSE AMPLIFIER REGION COLUMN SELECT LINE AND RELATED METHODS
    30.
    发明申请
    APPARATUSES INCLUDING A MEMORY ARRAY WITH SEPARATE GLOBAL READ AND WRITE LINES AND/OR SENSE AMPLIFIER REGION COLUMN SELECT LINE AND RELATED METHODS 有权
    具有独立全局读取和写入线和/或感测放大器区域列选择行的存储器阵列的装置及相关方法

    公开(公告)号:US20140347945A1

    公开(公告)日:2014-11-27

    申请号:US13902591

    申请日:2013-05-24

    CPC classification number: G11C7/062 G11C7/065 G11C7/12 G11C7/18

    Abstract: Apparatuses and methods related to memory arrays with separate global read and write lines and/or sense amplifier region column select lines are disclosed. An example apparatus includes first and second memory sections, and further includes a sense amplifier region. A memory section includes a word line extending in a first direction and a digit line extending in a second direction, and the sense amplifier region is disposed between the first and second memory sections. The sense amplifier region includes a sense amplifier coupled to the digit line, a local input/output (LIO) line, a column select circuit coupled to the sense amplifier, and a column select line. The column select line extends in the first direction and is configured to provide a column select signal to the column select circuit. Capacitance of a LIO line may be reduced by coupling fewer sense amplifiers of a group to the LIO line.

    Abstract translation: 公开了与具有单独的全局读写线和/或读出放大器区域列选择线的存储器阵列相关的装置和方法。 示例性装置包括第一和第二存储器部分,并且还包括读出放大器区域。 存储器部分包括在第一方向上延伸的字线和在第二方向上延伸的数字线,并且读出放大器区域设置在第一和第二存储器部分之间。 感测放大器区域包括耦合到数字线的读出放大器,本地输入/输出(LIO)线,耦合到读出放大器的列选择电路和列选择线。 列选择线在第一方向上延伸并且被配置为向列选择电路提供列选择信号。 LIO线的电容可以通过将较少的组的读出放大器耦合到LIO线来减少。

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