Thermal control method and thermal control system
    22.
    发明授权
    Thermal control method and thermal control system 有权
    热控制方法和热控系统

    公开(公告)号:US09280188B2

    公开(公告)日:2016-03-08

    申请号:US14294170

    申请日:2014-06-03

    Applicant: MEDIATEK INC.

    CPC classification number: G06F1/206 H04M1/18

    Abstract: The present invention provides a thermal control method and a thermal control system. The thermal control method comprises: detecting a temperature variance of a component of the electronic device to generate a detecting result; and determining a temperature threshold value for the integrated circuit as a throttling point according to the detecting result. The thermal control system comprises: a detecting unit, for detecting a temperature variance of a component of the electronic device to generate a detecting result; and a determining unit, for determining a temperature threshold value for the integrated circuit as a throttling point according to the detecting result.

    Abstract translation: 本发明提供一种热控制方法和热控制系统。 热控制方法包括:检测电子设备的部件的温度变化以产生检测结果; 以及根据所述检测结果,将所述集成电路的温度阈值确定为节流点。 热控制系统包括:检测单元,用于检测电子设备的部件的温度变化以产生检测结果; 以及确定单元,用于根据检测结果将集成电路的温度阈值确定为节流点。

    THERMAL CONTROL METHOD AND THERMAL CONTROL SYSTEM
    24.
    发明申请
    THERMAL CONTROL METHOD AND THERMAL CONTROL SYSTEM 有权
    热控制方法和热控制系统

    公开(公告)号:US20150350407A1

    公开(公告)日:2015-12-03

    申请号:US14670418

    申请日:2015-03-27

    Applicant: Mediatek Inc.

    CPC classification number: H04M1/72569 G06F1/206 H04M1/72525 H04M1/72577

    Abstract: The invention provides a thermal control method and a thermal control system. The thermal control method comprises: detecting a temperature variance of a component of the electronic device to generate a detecting result; and determining a temperature threshold value for the integrated circuit as a throttling point according to the detecting result. The thermal control system comprises: a detecting unit, for detecting a temperature variance of a component of the electronic device to generate a detecting result; and a determining unit, for determining a temperature threshold value for the integrated circuit as a throttling point according to the detecting result.

    Abstract translation: 本发明提供一种热控制方法和热控制系统。 热控制方法包括:检测电子设备的部件的温度变化以产生检测结果; 以及根据检测结果确定集成电路的温度阈值作为节流点。 热控制系统包括:检测单元,用于检测电子设备的部件的温度变化以产生检测结果; 以及确定单元,用于根据检测结果将集成电路的温度阈值确定为节流点。

    Semiconductor package structure
    26.
    发明授权

    公开(公告)号:US12230560B2

    公开(公告)日:2025-02-18

    申请号:US17546191

    申请日:2021-12-09

    Applicant: MEDIATEK INC.

    Abstract: A semiconductor package structure includes a frontside redistribution layer, a first semiconductor die, a first capacitor, a conductive terminal, and a backside redistribution layer. The first semiconductor die is disposed over the frontside redistribution layer. The first capacitor is disposed over the frontside redistribution layer and electrically coupled to the first semiconductor die. The conductive terminal is disposed below the frontside redistribution layer and electrically coupled to the frontside redistribution layer. The backside redistribution layer is disposed over the first semiconductor die.

    Semiconductor package structure
    30.
    发明授权

    公开(公告)号:US11621211B2

    公开(公告)日:2023-04-04

    申请号:US16881206

    申请日:2020-05-22

    Applicant: MEDIATEK INC.

    Abstract: A semiconductor package structure is provided. The semiconductor package structure includes a substrate, a semiconductor die, a molding material, a first bonding layer, and a thermal interface material. The semiconductor die is disposed over the substrate. The molding material surrounds the semiconductor die. The first bonding layer is disposed over the semiconductor die. The thermal interface material is disposed over the molding material.

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