Multiple via structure for high performance standard cells

    公开(公告)号:US10236886B2

    公开(公告)日:2019-03-19

    申请号:US15393180

    申请日:2016-12-28

    Abstract: A MOS device of an IC includes pMOS and nMOS transistors. The MOS device further includes a first Mx layer interconnect extending in a first direction and coupling the pMOS and nMOS transistor drains together, and a second Mx layer interconnect extending in the first direction and coupling the pMOS and nMOS transistor drains together. The first and second Mx layer interconnects are parallel. The MOS device further includes a first Mx+1 layer interconnect extending in a second direction orthogonal to the first direction. The first Mx+1 layer interconnect is coupled to the first Mx layer interconnect and the second Mx layer interconnect. The MOS device further includes a second Mx+1 layer interconnect extending in the second direction. The second Mx+1 layer interconnect is coupled to the first Mx layer interconnect and the second Mx layer interconnect. The second Mx+1 layer interconnect is parallel to the first Mx+1 layer interconnect.

    Digital power multiplexor
    23.
    发明授权

    公开(公告)号:US10103626B1

    公开(公告)日:2018-10-16

    申请号:US15647326

    申请日:2017-07-12

    Abstract: A power multiplexor includes: a first branch including a first transistor coupled in series with a second transistor between a first power supply and a power output; a second branch including a third transistor coupled in series with a fourth transistor between a second power supply and the power output; a controller configured to selectively assert and de-assert a control signal to the first branch and the second branch; a first voltage level shifter coupled between the second transistor and the controller; and a second voltage level shifter coupled between the third transistor and the controller.

    Pulse-generator
    26.
    发明授权

    公开(公告)号:US09979394B2

    公开(公告)日:2018-05-22

    申请号:US15044988

    申请日:2016-02-16

    CPC classification number: H03K19/00384 H03K3/033 H03K3/0375 H03K5/04

    Abstract: The apparatus may include a first latch configured to store a first state or a second state. The first latch may have a first latch input, one of a set input or a reset input, a first pulse clock input, and a first latch output. The first latch input may be coupled to a fixed logic value. The one of the set input or the reset input may be coupled to a clock signal or an inverted clock signal, respectively. The apparatus may include an AND gate having a first AND gate input, a second AND gate input, and a first AND gate output. The clock signal may be coupled to the first AND gate input. The first latch output may be coupled to the second AND gate input. The AND gate output may be configured to output a pulsed clock. The pulsed clock may be coupled to the first pulse clock input.

    HIGH-SPEED LEVEL-SHIFTING MULTIPLEXER
    28.
    发明申请
    HIGH-SPEED LEVEL-SHIFTING MULTIPLEXER 有权
    高速水平移位多路复用器

    公开(公告)号:US20160134286A1

    公开(公告)日:2016-05-12

    申请号:US14534967

    申请日:2014-11-06

    Abstract: Systems and methods for level-shifting multiplexing are described herein. In one embodiment, a method for level-shifting multiplexing comprises selecting one of a plurality of inputs based on one or more select signals, and pulling down one of first and second nodes based on a logic state of the selected one of the plurality of inputs. The method also comprises pulling up the first node if the second node is pulled down, and pulling up the second node if the first node is pulled down.

    Abstract translation: 本文描述了用于电平转换复用的系统和方法。 在一个实施例中,一种用于电平转换复用的方法包括:基于一个或多个选择信号选择多个输入中的一个,并且基于所述多个输入中所选择的一个输入的逻辑状态来下拉第一和第二节点中的一个 。 该方法还包括如果第二节点被拉下来则拉起第一节点,并且如果第一节点被拉下来则提起第二节点。

    AUTOMATIC TEST PATTERN GENERATION FOR A RECONFIGURABLE INSTRUCTION CELL ARRAY
    29.
    发明申请
    AUTOMATIC TEST PATTERN GENERATION FOR A RECONFIGURABLE INSTRUCTION CELL ARRAY 审中-公开
    用于可重构指令单元阵列的自动测试图形生成

    公开(公告)号:US20160004617A1

    公开(公告)日:2016-01-07

    申请号:US14323916

    申请日:2014-07-03

    Abstract: An instruction cell array is provided that comprises an array of tiles. Each tile includes a set of input/output (I/O) ports for switching between a plurality of input channels and a plurality of corresponding output channels. In addition, each tile includes an instruction cell comprising a plurality of dedicated logic gates for producing an instruction cell output from selected ones of the tile's input channels. Each I/O port is configured to select from the tile's instruction cell output and from the input channels for the remaining I/O ports for the tile to form the I/O port's output channels. To prevent combinatorial loops during an automatic test pattern generation (ATPG) of the array, the instruction cell array disclosed herein is configured in the testing mode such at least a subset of the I/O ports for each tile prevent any of their output channels from being formed as combinatorial signals.

    Abstract translation: 提供了包括瓦片阵列的指令单元阵列。 每个瓦片包括用于在多个输入通道和多个相应的输出通道之间切换的一组输入/输出(I / O)端口。 此外,每个瓦片包括指令单元,该指令单元包括多个专用逻辑门,用于产生从瓦片的输入通道中的选定的输入通道输出的指令单元。 每个I / O端口被配置为从瓦片的指令单元输出和输入通道中选择用于瓦片的剩余I / O端口以形成I / O端口的输出通道。 为了在阵列的自动测试模式生成(ATPG)期间防止组合循环,本文公开的指令单元阵列被配置在测试模式中,使得每个瓦片的I / O端口的至少一个子集阻止其任何输出通道 被形成为组合信号。

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