Microplate scanning read head
    21.
    发明授权
    Microplate scanning read head 有权
    微孔板扫描读头

    公开(公告)号:US06024920A

    公开(公告)日:2000-02-15

    申请号:US291787

    申请日:1999-04-14

    申请人: Chris Cunanan

    发明人: Chris Cunanan

    摘要: A scanning head assembly is provided, the scanning head suited for use with instruments that characterize the absorption, fluorescence, and/or luminescence properties of one or more samples contained within a sample plate or microplate. The scanning head assembly is coupled to a pair of scanning mechanisms, thereby allowing the head assembly to be raster scanned along both the x- and y-axis. Although the scanning preferably follows a serpentine pattern, other scan patterns can be utilized. Single or multiple measurements can be made per sample well, multiple measurements either being reported individually or averaged together. Although the scanning head assembly can utilize a variety of configurations, in the preferred embodiment the scanning head assembly has a C-shape with the light source and associated optics mounted in the lower arm of the assembly and the detector and associated optics mounted in the upper arm. Preferably the optics associated with the source include one or more optical filters that regulate the wavelength of light radiating the sample.

    摘要翻译: 提供扫描头组件,扫描头适用于表征样品板或微板中所含的一种或多种样品的吸收,荧光和/或发光特性的仪器。 扫描头组件耦合到一对扫描机构,从而允许头部组件沿x轴和y轴沿光栅扫描。 虽然扫描优选地遵循蛇形图案,但是可以利用其他扫描图案。 可以对每个样品进行单次或多次测量,多次测量单独报告或一起平均。 尽管扫描头组件可以利用各种配置,但是在优选实施例中,扫描头组件具有C形,其中光源和相关联的光学器件安装在组件的下臂中,并且检测器和相关联的光学器件安装在上部 臂。 优选地,与源相关联的光学器件包括调节辐射样品的光的波长的一个或多个滤光器。

    Equipment and method for diagnosing sliding condition of rotating electrical machine
    22.
    发明授权
    Equipment and method for diagnosing sliding condition of rotating electrical machine 有权
    旋转电机滑动条件诊断设备及方法

    公开(公告)号:US09217708B2

    公开(公告)日:2015-12-22

    申请号:US14065531

    申请日:2013-10-29

    摘要: Disclosed are equipment and method for diagnosing the sliding condition of a rotating electrical machine that make it possible to achieve early detection of abnormal sliding with a simple configuration containing flexibly arranged elements and reduce the downtime and maintenance cost of the rotating electrical machine. The equipment for diagnosing the sliding condition of a rotating electrical machine includes a light source that emits light onto the sliding surface of a collecting brush relative to the surface of a rotating body of the rotating electrical machine, a light-receiving section that receives the light reflected from the sliding surface, and a determination section that processes a signal from the light-receiving section. The determination section detects an increase in a specific wavelength component of the reflected light to determine whether the sliding condition of the rotating body surface of the rotating electrical machine is abnormal.

    摘要翻译: 公开了用于诊断旋转电机的滑动状态的设备和方法,其能够以包含灵活布置的元件的简单配置来实现异常滑动的早期检测,并且减少了旋转电机的停机时间和维护成本。 用于诊断旋转电机的滑动状态的设备包括:相对于旋转电机的旋转体的表面将光发射到集电刷的滑动面上的光源,接收光的光接收部 从滑动面反射的判定部和处理来自受光部的信号的判定部。 确定部分检测反射光的特定波长分量的增加,以确定旋转电机的旋转体表面的滑动状态是否异常。

    Sorting method and apparatus
    23.
    发明授权
    Sorting method and apparatus 有权
    排序方法和装置

    公开(公告)号:US09000319B2

    公开(公告)日:2015-04-07

    申请号:US13141863

    申请日:2009-12-21

    摘要: A method of and apparatus for sorting foreign matter from a flow, the method comprising the steps of: identifying objects within a flow; for each identified object, determining reflectance intensities at at least two different wavelengths or ranges of wavelengths; and for each identified object, comparing the reflectance intensities at the at least two different wavelengths or ranges of wavelengths to a reference intensity profile, wherein the identified object is characterized as foreign matter when the reflectance intensities at the at least two different wavelengths or ranges of wavelengths fall within a predetermined region of the reference intensity profile.

    摘要翻译: 一种用于从流中分选异物的方法和装置,所述方法包括以下步骤:识别流内的物体; 对于每个识别的对象,确定至少两个不同波长或波长范围的反射率强度; 并且对于每个识别的对象,将至少两个不同波长或波长范围的反射强度与参考强度分布进行比较,其中当所述至少两个不同波长或范围内的反射强度为 波长落在参考强度分布的预定区域内。

    Apparatus for photodynamic therapy and photodetection
    24.
    发明授权
    Apparatus for photodynamic therapy and photodetection 有权
    光动力治疗和光电检测装置

    公开(公告)号:US08382812B2

    公开(公告)日:2013-02-26

    申请号:US12473745

    申请日:2009-05-28

    IPC分类号: A61N5/06

    摘要: The present invention provides an apparatus for photodynamic therapy and fluorescence detection, in which a combined light source is provided to illuminate an object body and a multispectral fluorescence-reflectance image is provided to reproduce various and complex spectral images for an object tissue, thus performing effective photodynamic therapy for various diseases both outside and inside of the body.For this purpose, the present invention provides an apparatus for photodynamic therapy and photodetection, which provides illumination with light of various wavelengths and multispectral images, the apparatus including: an optical imaging system producing an image of an object tissue and transmitting the image to a naked eye or an imaging device; a combined light source including a plurality of coherent and non-coherent light sources and a light guide guiding incident light emitted from the light sources; a multispectral imaging system including at least one image sensor; and a computer system outputting an image of the object tissue to the outside. Thus, the apparatus for photodynamic therapy and photodetection of the present invention can effectively perform the photodynamic therapy and photodetection by means of the combined light source capable of irradiating light having various spectral components to an object tissue and the multispectral imaging system capable of obtaining images from several spectral portions for these various spectral ranges at the same time, thus improving the accuracy of diagnosis and efficiency of the photodynamic therapy.

    摘要翻译: 本发明提供了一种用于光动力学治疗和荧光检测的装置,其中提供组合光源以照射物体,并且提供多光谱荧光反射图像以再现对象组织的各种和复杂的光谱图像,从而执行有效 身体各种疾病的光动力治疗。 为此,本发明提供了一种用于光动力学治疗和光电检测的装置,其提供具有各种波长和多光谱图像的光的照明,所述装置包括:光学成像系统,其产生对象组织的图像并将图像发送到裸体 眼睛或成像装置; 包括多个相干和非相干光源的组合光源和引导从光源发射的入射光的光导; 包括至少一个图像传感器的多光谱成像系统; 以及将对象组织的图像输出到外部的计算机系统。 因此,本发明的光动力学治疗和光电检测装置可以通过能够将具有各种光谱成分的光照射到对象组织上的组合光源和能够获得图像的多光谱成像系统而有效地进行光动力学治疗和光电检测 同时对于这些不同光谱范围的几个光谱部分,从而提高光动力疗法的诊断准确性和效率。

    Sample analyzer
    26.
    发明授权
    Sample analyzer 有权
    样品分析仪

    公开(公告)号:US07760340B2

    公开(公告)日:2010-07-20

    申请号:US11724934

    申请日:2007-03-16

    IPC分类号: G01N33/48

    摘要: A sample analyzer includes (a) a measuring part for measuring optical information of a sample at first wavelength, second wavelength, and third wavelength, first light of the first wavelength and second light of the second wavelength being absorbed by a second substance but substantially not absorbed by a first substance, and third light of the third wavelength being absorbed by the first substance; and (b) an obtaining part for obtaining content of the first substance in the sample, and content of the second substance in the sample, influence by the second substance being excluded from the content of the first substance, based on the optical information at the first wavelength, second wavelength, and third wavelength measured by the measuring part.

    摘要翻译: 样品分析仪包括:(a)测量部件,用于测量第一波长,第二波长和第三波长处的样品的光学信息,第一波长的第一光和第二波长的第二光被第二物质吸收,但基本上不 被第一物质吸收,第三波长的第三光被第一物质吸收; 和(b)获取部分,用于获得样品中第一物质的含量和样品中第二物质的含量,第二物质的含量根据第一物质的含量而被排除在第一物质的含量之外 第一波长,第二波长和第三波长由测量部件测量。

    LASER PROCESSING DEVICE AND ITS PROCESSING METHOD
    27.
    发明申请
    LASER PROCESSING DEVICE AND ITS PROCESSING METHOD 审中-公开
    激光加工装置及其加工方法

    公开(公告)号:US20100068673A1

    公开(公告)日:2010-03-18

    申请号:US12523290

    申请日:2008-01-16

    IPC分类号: A61C3/00

    摘要: A laser processing apparatus 1 includes: a processing light source 2 for emitting a processing light for processing a tooth 13A or a gingiva 13B; a halogen lamp 3 for emitting an illumination light for illuminating the tooth 13A or the gingiva 13B; a detector 4 capable of detecting a multiple-wavelength light from the tooth 13A or the gingiva 13B; and a controller 5 for controlling the light-emitting state of the first light-emitting part 2. The detector 4 has a first detection element 6 and a second detection element 7 with light-receiving sensitivities that differ in accordance with wavelength, detects light intensities of different wavelengths, and outputs the detection result to the controller 5. The controller 5 controls the light-emitting state of the processing light source 2 on the basis of the ratio of the respective intensities of the different wavelength light detected by the detector 4.

    摘要翻译: 激光加工设备1包括:处理光源2,用于发出用于处理牙齿13A或牙龈13B的处理光; 用于发射用于照明牙齿13A或牙龈13B的照明光的卤素灯3; 能够检测来自牙齿13A或牙龈13B的多波长光的检测器4; 以及用于控制第一发光部分2的发光状态的控制器5.检测器4具有第一检测元件6和具有根据波长不同的光接收灵敏度的第二检测元件7,检测光强度 并将检测结果输出到控制器5.控制器5基于由检测器4检测到的不同波长光的各自的强度的比率来控制处理光源2的发光状态。

    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected
    29.
    发明申请
    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected 失效
    半导体基板的制造方法以及检查被检查体的图案的缺陷的方法和装置

    公开(公告)号:US20040075837A1

    公开(公告)日:2004-04-22

    申请号:US10686584

    申请日:2003-10-17

    IPC分类号: G01B011/00

    摘要: A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.

    摘要翻译: 一种用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法及其装置以及以高产率制造半导体晶片等半导体基板的半导体基板的制造方法和系统。 通过将通过物镜的环形照明照射到安装在台架上的晶片上,检查被检查物体上的微细图案,晶片上具有微细精细图案。 照明光可以根据在物镜的光瞳上检测到的图像而被圆形或椭圆偏振并且被控制,并且通过检测来自晶片的反射光来获得图像信号。 将图像信号与参考图像信号进行比较,并且检测出显示不一致的图案的一部分作为缺陷,从而同时以高分辨率检测微细微图案或微细图案上的缺陷。 此外,通过分析缺陷的原因和在图案上发生的缺陷因素来控制生产线的工艺条件。

    Optical measuring head, in particular for automatic chemical or biological reaction analyzer
    30.
    发明授权
    Optical measuring head, in particular for automatic chemical or biological reaction analyzer 失效
    光学测头,特别适用于自动化学或生物反应分析仪

    公开(公告)号:US06630108B1

    公开(公告)日:2003-10-07

    申请号:US09806869

    申请日:2001-04-05

    IPC分类号: G01N2125

    摘要: An optical measuring head 10 of an automatic chemical or biochemical reaction analyzer comprises a first calorimetric analysis detector 12 controlled by a light source 20 associated to an optic fibre 28 for transmission of the light beam to one of the sides of a reaction analysis plate 18. A photodetector device 37 is arranged on the opposite side to collect the light beam emerging from the cup 16. The light source 20 and the reaction analysis plate 18 are stationary whereas the measuring head 10 is mounted on a U-shaped mobile support 19 framing the parallel opposite faces of the analysis plate 18 and able to be moved by a drive mechanism 48 facing a predetermined cup 16. The optic fibre 28 has one end secured to the fixed light source 20 and an opposite end arranged in a housing 30 of the mobile support 19.

    摘要翻译: 自动化学或生化反应分析仪的光学测量头10包括由与光纤28相关联的光源20控制的第一量热分析检测器12,用于将光束传输到反应分析板18的一侧。 光检测器装置37布置在相对侧以收集从杯16出射的光束。光源20和反应分析板18是静止的,而测量头10安装在U形移动支架19上,框架 分析板18的平行的相对面并且能够通过面向预定杯16的驱动机构48移动。光纤28的一端固定到固定光源20,并且相对端布置在移动的壳体30中 支持19。