SEMICONDUCTOR STORAGE DEVICE
    24.
    发明公开

    公开(公告)号:US20230290406A1

    公开(公告)日:2023-09-14

    申请号:US18318417

    申请日:2023-05-16

    摘要: A semiconductor storage device includes a memory transistor and a word line connected to a gate electrode of the memory transistor. When a write sequence is interrupted before a k+1th verification operation is ended after a kth verification operation is ended in the nth write loop of the write sequence, a voltage equal to or higher than a verification voltage corresponding to a first verification operation in the nth write loop is supplied to the word line before start of the k+1th verification operation after resumption of the write sequence. A time from the resumption of the write sequence to the start of the k+1th verification operation is shorter than a time from start of the first verification operation to end of the kth verification operation in the nth write loop.

    TEMPERATURE-BASED MEMORY MANAGEMENT
    28.
    发明公开

    公开(公告)号:US20230245704A1

    公开(公告)日:2023-08-03

    申请号:US18095787

    申请日:2023-01-11

    发明人: Minjian Wu

    IPC分类号: G11C16/14 G11C16/04

    摘要: A memory device and method of operation are described. The memory device may include memory cells of a first type that each store a single bit of information and memory cells of a second type that each store multiple bits of information. The memory cells of the first type may be more robust to extreme operating conditions than the second type but may have one or more drawbacks (e.g., lower density). The memory device may identify data to be written, and in response, may identify a temperature of the memory device. If the temperature is within a nominal operating range associated with a low risk of memory errors, the memory device may write the data to the memory cells of the second type. If the temperature is outside the nominal operating range, the memory device may write the data to the memory cells of the first type.

    SEMICONDUCTOR MEMORY DEVICE
    29.
    发明公开

    公开(公告)号:US20230245697A1

    公开(公告)日:2023-08-03

    申请号:US18131511

    申请日:2023-04-06

    发明人: Noboru SHIBATA

    IPC分类号: G11C11/56 G11C16/34 G11C16/10

    摘要: According to one embodiment, a semiconductor memory device includes a memory cell array, a data storage circuit and a control circuit. The data storage circuit holds first data to be written into the memory cell and holds 1 bit data calculated from the first data. The control circuit writes the data of n bits into the memory cell in a first write operation and then executes a second write operation. The control circuit carries out the following control in the second write operation. It reads data stored in the memory cell in the first write operation. It restores the first data based on the data read from the memory cell and the 1 bit data held in the data storage circuit. It writes the restored first data into the memory cell.