METHOD FOR MANUFACTURING A COVER FOR AN ELECTRONIC PACKAGE AND ELECTRONIC PACKAGE COMPRISING A COVER

    公开(公告)号:US20180190511A1

    公开(公告)日:2018-07-05

    申请号:US15685285

    申请日:2017-08-24

    Abstract: A method for manufacturing a cover for an electronic package includes placing an electrically conductive insert (including an electrical contact surface) inside a cavity of a mold in a position such that the electrical contact surface is in contact with a face of the cavity of the mold. A coating material is injected into said cavity and set so as to produce a substrate that is overmolded around the insert and forms the cover where the electrical contact surface of the overmolded substrate is not covered by the coating material. An electronic package is then formed from a chip mounted on a carrier substrate that is covered by the cover. The electrical contact surface is located above and electrically connected to an electrical connection pad of either the chip or the carrier substrate.

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    发明申请

    公开(公告)号:US20180158854A1

    公开(公告)日:2018-06-07

    申请号:US15372017

    申请日:2016-12-07

    Inventor: Cedric Tubert

    CPC classification number: H01L27/14612

    Abstract: A circuit includes a pixel structure having a photo sensitive element and a read transistor. The read transistor includes a first load path terminal coupled to the photo sensitive element, and a second load path terminal coupled to a voltage bus. The circuit also includes a first transistor having a third load path terminal coupled to a power supply node, and a fourth load path terminal configured to be coupled to a current source. The circuit further includes a first control switch coupled between the voltage bus and the fourth load path terminal of the first transistor.

    SCAN CHAIN CIRCUIT SUPPORTING LOGIC SELF TEST PATTERN INJECTION DURING RUN TIME

    公开(公告)号:US20180128876A1

    公开(公告)日:2018-05-10

    申请号:US15867285

    申请日:2018-01-10

    Inventor: Bruno Fel

    CPC classification number: G01R31/3177 G01R31/318547 G01R31/318563

    Abstract: A scan chain for testing a combinatorial logic circuit includes a first scan chain path of flip-flops connected to the combinatorial logic circuit for functional mode operation during runtime of the combinatorial logic circuit. A second scan chain path of flip-flops is also connected to the combinatorial logic circuit and supports both a shift mode and a capture mode. The second scan chain path operates in shift mode while the first scan chain path is connected to the combinatorial logic circuit for functional mode operation. The second scan chain is then connected to the combinatorial logic circuit when run time is interrupted and operates in capture mode to apply the test data to the combinatorial logic circuit.

    Scan chain circuit supporting logic self test pattern injection during run time

    公开(公告)号:US09897653B2

    公开(公告)日:2018-02-20

    申请号:US15071342

    申请日:2016-03-16

    Inventor: Bruno Fel

    CPC classification number: G01R31/3177 G01R31/318547 G01R31/318563

    Abstract: A scan chain for testing a combinatorial logic circuit includes a first scan chain path of flip-flops connected to the combinatorial logic circuit for functional mode operation during runtime of the combinatorial logic circuit. A second scan chain path of flip-flops is also connected to the combinatorial logic circuit and supports both a shift mode and a capture mode. The second scan chain path operates in shift mode while the first scan chain path is connected to the combinatorial logic circuit for functional mode operation. The second scan chain is then connected to the combinatorial logic circuit when run time is interrupted and operates in capture mode to apply the test data to the combinatorial logic circuit.

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