CO-INTEGRATED VERTICALLY STRUCTURED CAPACITIVE ELEMENT AND FABRICATION PROCESS

    公开(公告)号:US20230223332A1

    公开(公告)日:2023-07-13

    申请号:US18118935

    申请日:2023-03-08

    CPC classification number: H01L23/5223 H10B41/35 H01L28/91 H01L28/92

    Abstract: First and second wells are formed in a semiconductor substrate. First and second trenches in the first second wells, respectively, each extend vertically and include a central conductor insulated by a first insulating layer. A second insulating layer is formed on a top surface of the semiconductor substrate. The second insulating layer is selectively thinned over the second trench. A polysilicon layer is deposited on the second insulating layer and then lithographically patterned to form: a first polysilicon portion over the first well that is electrically connected to the central conductor of the first trench to form a first capacitor plate, a second capacitor plate formed by the first well; and a second polysilicon portion over the second well forming a floating gate electrode of a floating gate transistor of a memory cell having an access transistor whose control gate is formed by the central conductor of the second trench.

    INTEGRATED FILLER CAPACITOR CELL DEVICE AND CORRESPONDING MANUFACTURING METHOD

    公开(公告)号:US20230207449A1

    公开(公告)日:2023-06-29

    申请号:US18116672

    申请日:2023-03-02

    CPC classification number: H01L23/5223 H01L29/66181 H01L21/76224 H01L27/0805

    Abstract: A semiconductor region includes an isolating region which delimits a working area of the semiconductor region. A trench is located in the working area and further extends into the isolating region. The trench is filled by an electrically conductive central portion that is insulated from the working area by an isolating enclosure. A cover region is positioned to cover at least a first part of the filled trench, wherein the first part is located in the working area. A dielectric layer is in contact with the filled trench. A metal silicide layer is located at least on the electrically conductive central portion of a second part of the filled trench, wherein the second part is not covered by the cover region.

    NFC DEVICE DETECTION
    357.
    发明公开

    公开(公告)号:US20230189149A1

    公开(公告)日:2023-06-15

    申请号:US18077396

    申请日:2022-12-08

    CPC classification number: H04W52/0229 H04B5/02

    Abstract: In the case of a potential detection, by a first near field communication (NFC) device, of a second NFC device, a validation of this detection is performed according to the time variation gradient of at least one environmental condition of the first device. A value of one of an amplitude and an phase of a signal across an oscillating circuit of the first NFC device is compared to first thresholds to potentially detect the second NFC device. Validation of detection occurs when one of the amplitude and the phase of the signal is outside the first thresholds adjusted as a function of the time variation gradient. Validation detection also occurs when one of the amplitude and the phase of the signal adjusted as a function of the time variation gradient is outside the first thresholds.

    WOBULATED SIGNAL GENERATOR
    359.
    发明公开

    公开(公告)号:US20230163754A1

    公开(公告)日:2023-05-25

    申请号:US18056153

    申请日:2022-11-16

    CPC classification number: H03K5/133 H03K5/1565 G11C8/18

    Abstract: A wobulated signal generator includes a chain of delay elements and control circuitry. The chain of delay elements includes first delay elements, second delay elements, and third delay elements. The control circuitry, in operation, enables a number of the first delay elements, disables a number of the third delay elements, and enables a selected number of the second delay elements, defining a period of time between two consecutive rising edges of a digital wobulated signal at an output of the wobulated signal generator. The control circuitry monitors an average frequency of the digitally wobulated signal, and selectively modifies the number of enabled first delay elements and the number of disabled third delay elements based on the monitored average frequency of the digitally wobulated signal.

Patent Agency Ranking