公开(公告)号：US08082926B2

公开(公告)日：2011-12-27

申请号：US11665687

申请日：2005-10-25

申请人： Hiroko Yano ,  Hirofumi Kera ,  Wakae Matsuyama ,  Kumiko Kuroki ,  Miki Ishida ,  Yuko Sasaki ,  Miyako Okamoto ,  Yasuo Goto ,  Yoshiko Masushio ,  Etsu Nishijima

发明人： Hiroko Yano ,  Hirofumi Kera ,  Wakae Matsuyama ,  Kumiko Kuroki ,  Miki Ishida ,  Yuko Sasaki ,  Miyako Okamoto ,  Yasuo Goto ,  Yoshiko Masushio ,  Etsu Nishijima

IPC分类号： A45D24/00 ,  A45D7/00 ,  A45D44/00 ,  G06K9/00

CPC分类号： A45D44/005 ,  A45D40/30

摘要： A lip categorizing method uses the size and shape of the lips as viewed from the front of the face as a first categorization index and the three-dimensional form of the lips as a second categorization index. The lip categorizing map is composed of a first coordinate axis showing the degree of the first categorization index and a second coordinate axis showing the degree of the second categorization index and has a coordinate system in which the first and second coordinate axes are orthogonal. It also generates makeup information for two-dimensionally correcting the lips of a subject based on preset reference by setting a plurality of points for determining the form features of lips on an image that depicts the lips, and judges the form features of the lips of the subject based on analytical values of the two-dimensional features of the lips measured from the set points.

摘要翻译： 嘴唇分类方法使用从脸部前面观察的嘴唇的大小和形状作为第一分类指数，并将嘴唇的三维形式作为第二分类指数。 唇分类图由表示第一分类指数的程度的第一坐标轴和表示第二分类指标的程度的第二坐标轴组成，并具有其中第一和第二坐标轴正交的坐标系。 它还通过设置用于确定描绘嘴唇的图像上的嘴唇的形状特征的多个点来基于预设参考来生成用于二维地校正被摄体的嘴唇的化妆信息，并且判断唇部的形状特征 基于从设定点测量的唇的二维特征的分析值的主题。

公开(公告)号：US07737413B2

公开(公告)日：2010-06-15

申请号：US12183622

申请日：2008-07-31

申请人： Hiroyuki Ito ,  Yuko Sasaki ,  Yoshiya Higuchi ,  Takeshi Kawasaki

发明人： Hiroyuki Ito ,  Yuko Sasaki ,  Yoshiya Higuchi ,  Takeshi Kawasaki

IPC分类号： G21K1/08 ,  H01J3/14 ,  H01J3/26 ,  H01J49/42

摘要： In a charged-particle beam apparatus having a high-accuracy and high-resolution focusing optical system for charged-particle beam, a group of coils are arranged along a beam emission axis to extend through the contour of radial planes each radiating from the beam emission axis representing a rotary axis and each having a circular arc which subtends a divisional angle resulting from division of a circumferential plane by a natural number larger than 2 so that a superposed magnetic field may be generated on the incident axis of the charged-particle beam and the trajectory of the charged-particle beam may be controlled by the superposed magnetic field.

公开(公告)号：US07714289B2

公开(公告)日：2010-05-11

申请号：US12155347

申请日：2008-06-03

申请人： Yuko Sasaki ,  Mitsugu Sato

发明人： Yuko Sasaki ,  Mitsugu Sato

IPC分类号： G01N23/00

CPC分类号： H01J37/265 ,  G01N23/2251 ,  H01J2237/043 ,  H01J2237/049 ,  H01J2237/28

摘要： When conditions for an electron gun mainly represented by extraction voltage V1 and accelerating voltage V0 are changed, a charged particle beam is once focused on a fixed position by means of a condenser lens and a virtual cathode position is calculated from a lens excitation of the condenser lens at that time and the mechanical positional relation of the electron gun to set an optical condition. For more accurate setting of the optical condition, a deflecting electrode device is provided at a crossover position of the condenser lens and a voltage is applied to the deflecting electrode device at a constant period so as to control the lens excitation of the condenser lens such that the amount of movement of an image is minimized on an image display unit such as CRT.

摘要翻译： 当主要由提取电压V1和加速电压V0表示的电子枪的条件改变时，通过聚光透镜将带电粒子束一次聚焦在固定位置，并且从冷凝器的透镜激发计算虚拟阴极位置 透镜和电子枪的机械位置关系来设定光学条件。 为了更精确地设置光学条件，在聚光透镜的交叉位置处设置偏转电极装置，并且将电压以恒定周期施加到偏转电极装置，以便控制聚光透镜的透镜激发，使得 在诸如CRT的图像显示单元上图像的移动量​​最小化。

公开(公告)号：US20090173887A1

公开(公告)日：2009-07-09

申请号：US12349708

申请日：2009-01-07

申请人： Hiroyuki ITO ,  Yuko Sasaki ,  Ryoichi Ishii ,  Takashi Doi

发明人： Hiroyuki ITO ,  Yuko Sasaki ,  Ryoichi Ishii ,  Takashi Doi

IPC分类号： H01J3/20

CPC分类号： H01J37/153 ,  H01J37/145 ,  H01J37/28 ,  H01J2237/1534

摘要： The invention relates to a trajectory correction method for a charged particle beam, and provides a low-cost, high accuracy and high-resolution converging optical system for use with a charged particle beam to solve problems with conventional aberration correction systems. To this end, the present invention uses a configuration which forms electromagnetic field which is concentrated towards a center of a beam trajectory axis, causes oblique of the beam to make use of lens effects and bend the trajectory, and consequently, cancels out large external side non-linear effects such a spherical aberration of the electron lens. Specifically, the configuration generates an electric field concentration in a simple manner by providing electrodes above the axis and applying voltages to the electrodes. Further, the above configuration can be realized trough operations using lenses and deflectors with incident axes and image formation positions that are normal.

摘要翻译： 本发明涉及一种用于带电粒子束的轨迹校正方法，并且提供了一种用于带电粒子束的低成本，高精度和高分辨率会聚光学系统，以解决常规像差校正系统的问题。 为此，本发明使用形成朝向光束轨迹轴的中心集中的电磁场的结构，使得光束的倾斜利用透镜效果并弯曲轨迹，因此抵消了大的外侧 电子透镜的非线性效应如球面像差。 具体地说，该配置通过在轴上方设置电极并向电极施加电压，以简单的方式产生电场浓度。 此外，可以通过使用具有入射轴和成像位置的透镜和偏转器的槽操作来实现上述配置。

公开(公告)号：US07397031B2

公开(公告)日：2008-07-08

申请号：US11452989

申请日：2006-06-15

申请人： Hiroyuki Shinada ,  Atsuko Takafuji ,  Takanori Ninomiya ,  Yuko Sasaki ,  Mari Nozoe ,  Hisaya Murakoshi ,  Taku Ninomiya ,  Yuji Kasai ,  Hiroshi Makino ,  Yutaka Kaneko ,  Kenji Tanimoto

发明人： Hiroyuki Shinada ,  Atsuko Takafuji ,  Takanori Ninomiya ,  Yuko Sasaki ,  Mari Nozoe ,  Hisaya Murakoshi ,  Taku Ninomiya ,  Yuji Kasai ,  Hiroshi Makino ,  Yutaka Kaneko ,  Kenji Tanimoto

IPC分类号： H01J37/28

CPC分类号： G01N23/225 ,  G01R31/307 ,  H01J37/28 ,  H01J2237/2817

摘要： An apparatus for inspecting a sample using a scanning electron microscope includes a sample stage, a first electron-optical system to scan an electron beam of a first beam current on the sample, a second electron-optical system to scan an electron beam of a second beam current smaller than the first beam current on the sample, a mechanism to move the sample stage, a detector provided in each of the first and second electron-optical systems to detect a secondary electron. The first electron-optical system is operable in a first mode and the second electron-optical system is operable in a second mode with higher resolution than that of the first mode. In the first mode, the sample is observed while the sample stage is moved continuously, and in the second mode, the sample is observed by detecting a secondary electron using the detector while the sample stage is held stationary.

摘要翻译： 使用扫描电子显微镜检查样品的装置包括样品台，用于扫描样品上的第一束电流的电子束的第一电子 - 光学系统，用于扫描第二电子束的电子束的第二电子 - 光学系统 光束电流小于样品上的第一光束电流，移动样品台的机构，设置在每个第一和第二电子光学系统中的检测二次电子的检测器。 第一电子 - 光学系统可在第一模式中操作，并且第二电子 - 光学系统可以以比第一模式更高的分辨率在第二模式中操作。 在第一模式中，在样品台连续移动时观察样品，在第二模式中，通过在样品台保持静止时使用检测器检测二次电子来观察样品。

公开(公告)号：US20060016990A1

公开(公告)日：2006-01-26

申请号：US11183906

申请日：2005-07-19

申请人： Makoto Suzuki ,  Kenji Tanimoto ,  Yuko Sasaki

发明人： Makoto Suzuki ,  Kenji Tanimoto ,  Yuko Sasaki

IPC分类号： H01J37/28 ,  H01J37/256

CPC分类号： H01J37/21 ,  H01J37/265 ,  H01J37/28 ,  H01J2237/216 ,  H01J2237/24592 ,  H01J2237/2487 ,  H01J2237/2817 ,  H01J2237/2826

摘要： A charged particle beam apparatus obtains an image by detecting a generation signal inclusively indicative of secondary electrons generated from a specimen. The apparatus has an input unit for inputting current and voltage values to be applied to a charged particle optical system through which the charged particle beam travels, a memory unit for storing shape, position and physical properties of the charged particle optical system and accuracy of the applied current or voltage, an electromagnetic field calculation unit for calculating an electromagnetic field near a path of the charged particle beam, a charged particle trajectory calculation unit for calculating a trajectory of the charged particle beam in the calculated electromagnetic field, a memory unit for storing a result of the trajectory calculation and a controller for controlling the charged particle optical system on the basis of the result of the trajectory calculation.

摘要翻译： 带电粒子束装置通过检测包含从样本产生的二次电子的生成信号来获得图像。 该装置具有用于输入要施加到带电粒子光束通过的带电粒子光学系统的电流和电压值的输入单元，用于存储带电粒子光学系统的形状，位置和物理特性的存储单元以及 施加电流或电压的电磁场计算单元，用于计算带电粒子束路径附近的电磁场的电磁场计算单元，用于计算计算出的电磁场中的带电粒子束的轨迹的带电粒子轨迹计算单元，存储 轨迹计算的结果和基于轨迹计算结果来控制带电粒子光学系统的控制器。

公开(公告)号：US06582118B1

公开(公告)日：2003-06-24

申请号：US09583135

申请日：2000-05-30

申请人： Kenichi Nakajima ,  Takayuki Satodate ,  Akihiro Matouge ,  Akihiko Inada ,  Mitsuru Ishii ,  Yoshio Koyama ,  Shigeo Suzuki ,  Masayuki Kawata ,  Yuko Sasaki ,  Eriko Takakuwa

发明人： Kenichi Nakajima ,  Takayuki Satodate ,  Akihiro Matouge ,  Akihiko Inada ,  Mitsuru Ishii ,  Yoshio Koyama ,  Shigeo Suzuki ,  Masayuki Kawata ,  Yuko Sasaki ,  Eriko Takakuwa

IPC分类号： G04B1924

CPC分类号： G04C3/12 ,  G04C17/0066

摘要： An electronic timepiece has a wheel train mounted for undergoing rotation and a transmission wheel for undergoing rotation in accordance with rotation of the wheel train. A contact point spring is connected to the transmission wheel for rotation therewith. The contact point spring extends substantially linearly through a rotational center of the transmission wheel. First and second detection patterns contact the contact point spring during rotation of the transmission wheel to generate a rotational position detecting signal corresponding to a rotational position of the transmission wheel. The first and second detection patterns are disposed at an angle of substantially 180 degree relative to the rotational center of the transmission wheel.

摘要翻译： 电子钟表具有安装用于转动的轮系和用于根据轮系的旋转进行旋转的传动轮。 接触点弹簧连接到传动轮以与其一起旋转。 接触点弹簧基本上直线地延伸通过传动轮的旋转中心。 第一和第二检测图案在传动轮旋转期间接触接触点弹簧以产生对应于传动轮的旋转位置的旋转位置检测信号。 第一和第二检测图案相对于传动轮的旋转中心以大致180度的角度设置。

公开(公告)号：US5190623A

公开(公告)日：1993-03-02

申请号：US335661

申请日：1989-03-29

申请人： Yuko Sasaki ,  Takashi Honda ,  Saburo Shoji ,  Shiro Kobayashi ,  Yasumasa Furutani

发明人： Yuko Sasaki ,  Takashi Honda ,  Saburo Shoji ,  Shiro Kobayashi ,  Yasumasa Furutani

IPC分类号： G21F9/22 ,  B01D61/44 ,  G21C19/46

CPC分类号： G21C19/46 ,  Y02W30/883 ,  Y10S422/903

摘要： In a nuclear fuel reprocessing plant for processing a used nuclear fuel by a nitric acid solution, the present invention provides a nuclear fuel reprocessing plant characterized by including electrolytic reduction means for reducing the valence of oxidizing metal ions consisting of the nuclear fuel and dissolved in the nitric acid solution while they are kept under the ionic state. In a processing method of a nuclear fuel reprocessing plant for processing a used nuclear fuel by a nitric acid solution, the present invention provides also a corrosion-proofing method of a nuclear fuel reprocessing plant characterized in that electrolytic reduction is carried out so that the valence of oxidizing metal ions consisting of the nuclear fuel and dissolved in the nitric acid solution is reduced while the metal ions are kept under the ionic state and NOx gas is also generated. The invention is directed to provide a nuclear fuel reprocessing plant and its corrosion-proofing method which prevents corrosion of equipment without allowing the precipitation of corrosive metal ions in a nitric acid solution as the metals.

摘要翻译： PCT No.PCT / JP88 / 00694 Sec。 371日期：1989年3月29日 102（e）日期1989年3月29日PCT提交1988年7月13日PCT公布。 出版物WO89 / 0122400 日本1989年2月9日。在通过硝酸溶液处理使用的核燃料的核燃料后处理装置中，本发明提供了一种核燃料后处理装置，其特征在于包括用于降低氧化金属离子的价态的电解还原装置， 核燃料并在硝酸溶液中溶解，同时保持在离子状态。 在利用硝酸溶液处理使用的核燃料的核燃料后处理装置的处理方法中，本发明还提供了核燃料后处理装置的防腐蚀方法，其特征在于，进行电解还原， 氧化由核燃料组成的金属离子并溶解在硝酸溶液中的金属离子被还原，同时金属离子保持在离子状态并且还产生NOx气体。 本发明旨在提供一种核燃料后处理装置及其防腐蚀方法，其防止设备的腐蚀，而不允许将硝酸溶液中的腐蚀性金属离子沉淀为金属。

公开(公告)号：US4610732A

公开(公告)日：1986-09-09

申请号：US714398

申请日：1985-03-21

申请人： Yuko Sasaki ,  Katsumi Suzuki ,  Akira Minato ,  Tomio Yoshida

发明人： Yuko Sasaki ,  Katsumi Suzuki ,  Akira Minato ,  Tomio Yoshida

IPC分类号： C23C22/54 ,  C23C22/58

CPC分类号： C23C22/58 ,  C23C22/54

摘要： The invention is to provide zirconium or its alloy used as a material for a chemical device and a nuclear reactor etc. is surface-treated with an oxidizing acid containing an oxidizing metal ion. The oxidizing acid is at least one member or a mixture of two or more selected from the group consisting of, for example, nitric acid (HNO.sub.3), hydrogen peroxide (H.sub.2 O.sub.2), hypochlorous acid (HClO) and potassium permanganate (K.sub.2 MnO.sub.4) solution, among which nitric acid is most preferred. The oxidizing metal ion is at least one member selected from the group consisting of, for example, ruthenium, rhodium, palladium, osmium, iridium, platinum, chromium, vanadium and cerium ions. Particularly preferred treatment conditions comprise a nitric acid concentration of 14 mol/l (65%) which is close to an azeotropic concentration, a ruthenium ion concentration of at least 1.times.10.sup.-3 mol/l and a treatment temperature of a boiling temperature (120.degree. C.). The surface of zirconium or its alloy to be treated may be washed previously with an aqueous acid solution containing hydrofluoric acid. The method of inhibiting corrosion of zirconium or its alloy by surface-treating it with an oxidizing acid containing an oxidizing metal ion can be formed easily a uniform protective film on the surface thereof.

摘要翻译： 本发明提供用作化学装置的材料的锆或其合金，核反应堆等用含有氧化性金属离子的氧化酸进行表面处理。 氧化酸是选自例如硝酸（HNO 3），过氧化氢（H 2 O 2），次氯酸（HClO）和高锰酸钾（K2MnO4）溶液中的至少一种或两种以上的混合物， 其中硝酸是最优选的。 氧化金属离子是选自例如钌，铑，钯，锇，铱，铂，铬，钒和铈离子中的至少一种。 特别优选的处理条件包括硝酸浓度为14mol / l（65％），其接近共沸浓度，至少1×10 -3 mol / l的钌离子浓度和沸点温度（120℃）的处理温度 C。）。 锆或其待处理合金的表面可以预先用含有氢氟酸的酸性水溶液洗涤。 通过用含有氧化性金属离子的氧化酸进行表面处理来抑制锆或其合金的腐蚀的方法可以在其表面上容易地形成均匀的保护膜。

公开(公告)号：US20110174975A1

公开(公告)日：2011-07-21

申请号：US13079361

申请日：2011-04-04

申请人： Yuko SASAKI ,  Makoto Ezumi ,  Makoto Nishihara ,  Tsutomu Kawai ,  Toshiaki Yanokura

发明人： Yuko SASAKI ,  Makoto Ezumi ,  Makoto Nishihara ,  Tsutomu Kawai ,  Toshiaki Yanokura

IPC分类号： H01J37/304

CPC分类号： H01J37/28 ,  H01J37/265 ,  H01J2237/15 ,  H01J2237/2826 ,  H01J2237/3045

摘要： In a method of scanning a charged particle beam which can position the scan position to a proper location inside a deflectable range of the scan position of charged particle beam, the scan position of charged particle beam is deflected to a plurality of target objects inside a scan position deflectable region and on the basis of a shift of a target object at a scan location after deflection, the deflection amount at the scan location is corrected.

摘要翻译： 在扫描带电粒子束的方法中，其可以将扫描位置定位在带电粒子束的扫描位置的可偏转范围内的适当位置，带电粒子束的扫描位置偏转到扫描内的多个目标物体 位置可偏转区域，并且基于偏转之后的扫描位置处的目标物体的偏移，校正扫描位置处的偏转量。