Photostructuring method
    31.
    发明授权
    Photostructuring method 失效
    光结构方法

    公开(公告)号:US5234794A

    公开(公告)日:1993-08-10

    申请号:US847881

    申请日:1992-03-10

    IPC分类号: G03F7/40

    CPC分类号: G03F7/405 G03F7/40

    摘要: A simple method for diminishing the trench width in a photoresist structure to below the resolution limit is provided. A photoresist structure is produced and treated with an agent then contains a bulging constituent that reacts with functional groups of the photoresist structure. The bulging constituent causes a volume increase of the photoresist structure. The extent of the volume increase of the photoresist structures is controllable by varying various parameters.

    摘要翻译: 提供了一种用于将光致抗蚀剂结构中的沟槽宽度减小到分辨率极限以下的简单方法。 制备光致抗蚀剂结构并用试剂处理,然后含有与光致抗蚀剂结构的官能团反应的凸起成分。 凸起成分导致光致抗蚀剂结构的体积增加。 通过改变各种参数可以控制光致抗蚀剂结构体积增加的程度。

    Photosensitive formulation for buffer coatings, film containing the photosensitive formulation, and method for fabricating electronics with the photosensitive formulation
    36.
    发明授权
    Photosensitive formulation for buffer coatings, film containing the photosensitive formulation, and method for fabricating electronics with the photosensitive formulation 失效
    用于缓冲涂料的光敏剂,含有光敏剂的薄膜,以及用光敏剂制备电子学方法

    公开(公告)号:US06884567B2

    公开(公告)日:2005-04-26

    申请号:US10244257

    申请日:2002-09-16

    申请人: Recai Sezi

    发明人: Recai Sezi

    IPC分类号: G03F7/004 G03F7/038 G03F7/039

    摘要: A photosensitive formulation for high-temperature-resistant photoresists is based on polyhydroxyamides. The photosensitive formulations display a much higher photosensitivity than the comparable formulations based on quinone azide photoactive components. After conversion to the polybenzoxazole, the novel formulations also display a lower dielectric constant than the quinone azide-based formulations. A film can be made by applying the photosensitive formulation to a wafer and then evaporating the solvent. A method for fabricating electronics and micorelectronics structures a wafer by using the film in photolithography.

    摘要翻译: 用于耐高温光致抗蚀剂的光敏剂是基于聚羟基酰胺。 与基于醌叠氮化物光活性组分的可比配方相比,光敏剂具有高得多的光敏性。 转化成聚苯并恶唑后,新型配方也显示比基于叠氮化物的配方更低的介电常数。 可以通过将光敏剂配制到晶片上然后蒸发溶剂来制备薄膜。 用于制造电子学和微电子学的方法通过在光刻中使用该薄膜来构造晶片。

    O-aminophenolcarboxylic acid and o-aminothiophenolcarboxylic acid
    38.
    发明授权
    O-aminophenolcarboxylic acid and o-aminothiophenolcarboxylic acid 有权
    邻氨基苯甲酸和邻氨基苯硫酚羧酸

    公开(公告)号:US06437178B2

    公开(公告)日:2002-08-20

    申请号:US09901218

    申请日:2001-07-09

    IPC分类号: C07G22934

    摘要: The invention relates to novel o-aminophenolcarboxylic acids or o-aminothiophenolcarboxylic acids of the following structure in which: A1 to A7 are—independently of one another—H, CH3, OCH3, CH2CH3 or OCH2CH3; T is O or S, and m is 0 or 1; Z is a carbocyclic or heterocyclic aromatic radical.

    摘要翻译: 本发明涉及以下结构的新型邻氨基苯甲酸或邻氨基苯硫酚羧酸,其中:A 1至A 7彼此独立地为H,CH 3,OCH 3,CH 2 CH 3或OCH 2 CH 3; T为O或S,m为0 或1; Z是碳环或杂环芳族基团。