Method for reading machine-readable marks on racks and receptacles

    公开(公告)号:US11487959B2

    公开(公告)日:2022-11-01

    申请号:US17220954

    申请日:2021-04-02

    Inventor: David Opalsky

    Abstract: A method of reading machine-readable marks on a movable support and object of a sample instrument. The method includes capturing a first image of the moveable support as the moveable support moves from a first position to a second position using an image capture device; determining whether a first fiducial machine-readable mark on the moveable support is in the first image; determining, when the first fiducial machine-readable mark is in the first image, whether a first machine-readable mark on a first object coupled to the moveable support is in the first image at a predetermined position relative to the first fiducial machine-readable mark; and associating information decoded from the first machine-readable mark on the first object with a first location on the moveable support associated with the first fiducial machine-readable mark.

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