SEMICONDUCTOR MEMORY DEVICE
    32.
    发明申请

    公开(公告)号:US20220301615A1

    公开(公告)日:2022-09-22

    申请号:US17472361

    申请日:2021-09-10

    Inventor: Hiroshi Maejima

    Abstract: According to one embodiment, a semiconductor memory device includes a first bit line extending in a first direction and coupled to a first memory cell, a first pad coupled to the first bit line, a first sense amplifier coupled to the first pad, a second bit line being adjacent to the first bit line and extending in the first direction and coupled to a second memory cell, a second pad coupled to the second bit line, and a second sense amplifier coupled to the second pad. The first and second sense amplifiers are adjacent to each other and are arranged in a second direction intersecting the first direction. The first and second pads are adjacent to each other and are arranged in a third direction intersecting the first direction and the second direction.

    Semiconductor memory device
    33.
    发明授权

    公开(公告)号:US12230327B2

    公开(公告)日:2025-02-18

    申请号:US18524458

    申请日:2023-11-30

    Inventor: Hiroshi Maejima

    Abstract: A semiconductor memory device includes a memory cell array having memory strings that include memory cells and first and second selection transistors. During a read operation, a controller applies a first voltage higher than ground to a source line, and a second voltage to a first and second selection gate lines that are connected to a selected memory string. The second voltage is also applied to the first selection gate lines connected to non-selected memory strings during a first period of the read operation. A third voltage higher than ground and lower than the second voltage is applied to the first selection gate lines connected to non-selected memory strings during a second period of the read operation subsequent to the first period.

    Semiconductor memory device having memory chip bonded to a CMOS chip including a peripheral circuit

    公开(公告)号:US12211544B2

    公开(公告)日:2025-01-28

    申请号:US18239140

    申请日:2023-08-29

    Inventor: Hiroshi Maejima

    Abstract: A memory device includes a first memory cell provided above a substrate; a first bit line coupled to the first memory cell and extending in a first direction; a first sense amplifier configured to sense a voltage of the first bit line; a second memory cell provided above the substrate; a second bit line adjacent to the first bit line and extending in the first direction, the second bit line being coupled to the second memory cell; a second sense amplifier configured to sense a voltage of the second bit line; and a third memory cell provided above the substrate. A third bit line not adjacent to the second bit line extends in the first direction, and is coupled to the third memory cell; and a third sense amplifier is configured to sense a voltage of the third bit line. The first and second sense amplifiers belong to a first sense amplifier group, are adjacent to each other and are arranged in a second direction intersecting the first direction. The third sense amplifier belongs to a second sense amplifier group. The first and second sense amplifier groups are adjacent to each other and are arranged in the first direction.

    Semiconductor memory device
    36.
    发明授权

    公开(公告)号:US11942153B2

    公开(公告)日:2024-03-26

    申请号:US17552225

    申请日:2021-12-15

    Inventor: Hiroshi Maejima

    Abstract: According to one embodiment, a semiconductor memory device includes a first string unit including a first memory string including a first selection transistor and a first memory cell coupled to the first selection transistor, a second string unit including a second memory string including a second selection transistor and a second memory cell coupled to the second selection transistor, a first select gate line, a second select gate line, a first bit line, a second bit line, and a first word line. Both of the first select gate line and the second select gate line are selected in a first read operation. The first select gate line is selected and the second select gate line is not selected in a second read operation.

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