摘要:
A current source including a current mirror circuit and an active load circuit which form a reference branch, for setting a reference current value, and a mirroring branch, defining an output current value, connected between supply and ground. A voltage stabilizing transistor is interposed between the current mirror circuit and the load circuit in the reference branch only, and is so biased as to maintain its gate terminal at a predetermined voltage. As such, the potential with respect to ground of the drain terminal of the reference branch load transistor is fixed, so that its drain-source voltage drop (and the current through it) is substantially independent of supply voltage. The current source may be used to advantage in an oscillator for generating the: clock signal of a nonvolatile memory.
摘要:
A circuit for detecting a reduction below a threshold value in a supply voltage provided to storage devices integrated into a semiconductor. A comparator is coupled between a voltage supply line and a signal ground and has a first or reference input and a second or test-signal input. A generator of a stable voltage reference has an output coupled to the first input and a divider of the supply voltage coupled to the second input of the comparator. A circuit means is arranged to feed the voltage supply line with the higher of the supply voltage and a programming voltage also provided to the storage devices.
摘要:
A regulating circuit for discharging non-volatile memory cells in an electrically programmable memory device, of the type which comprises at least one switch connected between a programming voltage reference and a line shared by the source terminals of the transistors forming said memory cells, and at least one discharge connection between said common line to the source terminals and a ground voltage reference, further comprises a second connection to ground of the line in which a current generator is connected and a normally open switch. Also provided is a logic circuit connected to the line to compare the voltage value present on the latter with a predetermined value, and to output a control signal for causing the switch to make. This solution allows a slow discharging phase of the line to be effected at the end of the erasing phase.
摘要:
A method for testing an electrically programmable non-volatile memory including a cell matrix and an internal state machine which governs the succession and timing of the memory programming phases includes excluding the internal state machine, modifying at least one of the control signals to program the cell matrix, and verifying programming correctness.
摘要:
A circuit for detecting a reduction below a threshold value in a supply voltage provided to storage devices integrated into a semiconductor. A comparator is coupled between a voltage supply line and a signal ground and has a first or reference input and a second or test-signal input. A generator of a stable voltage reference has an output coupled to the first input and a divider of the supply voltage coupled to the second input of the comparator. A circuit means is arranged to feed the voltage supply line with the higher of the supply voltage and a programming voltage also provided to the storage devices.
摘要:
A double-row address decoding and selection circuitry for an electrically erasable and programmable non-volatile memory device with redundancy comprises a plurality of identical circuit blocks supplied with address signals and each one generating a respective selection signal which is activated by a particular logic configuration of said address signals for the selection of a particular row of the matrix; each one of said circuit blocks also generates a carry-out signal which is supplied to a carry-in input of a following circuit block and is activated when the respective selection signal is activated; a first circuit block of said plurality of circuit blocks has the respective carry-in input connected to a reference voltage; each of said circuit blocks is also supplied with a control signal, which is activated by a control circuitry of the memory device when, during a preprogramming operation preceding an electrical erasure of the memory device, a defective row is addressed, to enable the activation of the respective selection signal if the carry-out signal supplying the respective carry-in input is activated, so that two adjacent rows can be simultaneously selected.