MICROMECHANICAL PRESSURE SENSOR ELEMENT

    公开(公告)号:US20240385064A1

    公开(公告)日:2024-11-21

    申请号:US18692654

    申请日:2022-08-04

    Abstract: A micromechanical pressure sensor element. The micromechanical pressure sensor element includes: a substrate; and a layer structure formed on the substrate. The layer structure includes a top electrode, a bottom electrode, and a movable central electrode arranged between the top and bottom electrodes. The central electrode is formed in flat fashion without a stepped boundary section. The layer structure has a planar surface directly after the production of the central electrode.

    MICROMECHANICAL COMPONENT FOR A CAPACITIVE PRESSURE SENSOR DEVICE

    公开(公告)号:US20220003621A1

    公开(公告)日:2022-01-06

    申请号:US17282736

    申请日:2019-12-18

    Abstract: A micromechanical component for a capacitive pressure sensor device, including a diaphragm that is stretched with the aid of a frame structure in such a way that a cantilevered area of the diaphragm spans a framed partial surface, and including a reinforcement structure that is formed at the cantilevered area. A first spatial direction oriented in parallel to the framed partial surface is definable in which the cantilevered area has a minimal extension, and a second spatial direction oriented in parallel to the framed partial surface and oriented perpendicularly with respect to the first spatial direction is definable in which the cantilevered area has a greater extension. The reinforcement structure is present at a first distance from the frame structure in the first spatial direction, and at a second distance in the second spatial direction, the second distance being greater than the first distance.

    MICROMECHANICAL COMPONENT FOR A SENSOR OR MICROPHONE DEVICE

    公开(公告)号:US20210354978A1

    公开(公告)日:2021-11-18

    申请号:US17315975

    申请日:2021-05-10

    Abstract: A micromechanical component for a sensor or microphone device, including a substrate, a frame structure, which is situated on the substrate surface and/or at least one intermediate layer, and a diaphragm, which spans an inner volume, which is at least partially framed by the frame structure. The micromechanical component includes a bending beam structure, which is situated in the inner volume and includes at least one anchoring area, which is attached to the frame structure, to the substrate surface and/or to the at least one intermediate layer, and at least one self-supporting area, which is connected via at least one coupling structure to the diaphragm inner side of the diaphragm in such a way that the at least one self-supporting area is bendable by way of a warping of the diaphragm.

    METHOD FOR PRODUCING A WAFER CONNECTION

    公开(公告)号:US20210292160A1

    公开(公告)日:2021-09-23

    申请号:US17265451

    申请日:2019-09-24

    Abstract: A method for producing a wafer connection between a first and a second wafer. The method includes providing a first and second material for forming a eutectic alloy, providing a first wafer having a receiving structure for a die structure, filling the receiving structure with the first material, providing a second wafer having a die structure, the second material being situated on the die structure, providing a stop structure on the first and/or second wafer, so that when the two wafers are joined, a defined stop is provided, heating the first and second material at least to the eutectic temperature of the eutectic alloy, joining the first and second wafer so that the die structure is at least partly introduced into the receiving structure, the stop structure, the receiving structure, the die structure.

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