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公开(公告)号:US09633708B2
公开(公告)日:2017-04-25
申请号:US15101809
申请日:2014-12-03
Applicant: TOHOKU UNIVERSITY
Inventor: Takashi Ohsawa , Tetsuo Endoh
CPC classification number: G11C11/1673 , G11C11/1655 , G11C11/1659 , G11C11/1675 , G11C11/1693 , G11C11/1697 , G11C14/0081
Abstract: A memory circuit (100) includes a plurality of memory cells (50), an N-type MOSFET (30a) and an N-type MOSFET (30b). The drain of the N-type MOSFET (30a) is connected to one of a pair of bit lines, and the drain of the N-type MOSFET (30b) is connected to the other of the pair of bit lines. The gate of the N-type MOSFET (30a) is connected to the drain of the N-type MOSFET (30b), and the gate of the N-type MOSFET (30b) is connected to the drain of the N-type MOSFET (30a).
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公开(公告)号:US09466363B2
公开(公告)日:2016-10-11
申请号:US14369974
申请日:2012-12-04
Applicant: TOHOKU UNIVERSITY
Inventor: Tetsuo Endoh , Takashi Ohsawa , Hiroki Koike , Takahiro Hanyu , Hideo Ohno
IPC: G11C14/00 , G11C13/00 , G11C11/16 , G11C15/04 , G11C19/02 , H03K3/356 , H03K3/59 , H03K19/18 , G11C29/50
CPC classification number: G11C13/0038 , G11C11/161 , G11C11/1659 , G11C11/1673 , G11C11/1675 , G11C11/1693 , G11C13/0004 , G11C13/0007 , G11C13/0069 , G11C14/00 , G11C14/0081 , G11C15/046 , G11C19/02 , G11C29/50012 , H03K3/356139 , H03K3/59 , H03K19/18
Abstract: An integrated circuit that does not involve increase in power consumption or decrease in switching probability during a write operation that occur when a latch circuit using STT-MTJ device, etc. of the prior art is operated at high speed is provided. The integrated circuit 1 includes: a memory element 1B where write occurs when a specified period τ has elapsed after a write signal is input; and a basic circuit element 1A, which is an elementary device constituting a circuit and has a data retaining function, and characterized in that an operation frequency f1 in a first operation mode in the process of memory access of the basic circuit element 1A satisfies the following relation: τ>λ1/f1(0
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公开(公告)号:US20160104714A1
公开(公告)日:2016-04-14
申请号:US14880690
申请日:2015-10-12
Applicant: TOHOKU UNIVERSITY
Inventor: Tetsuo Endoh , Seo Moon-Sik
IPC: H01L27/115 , H01L29/66 , H01L29/788
CPC classification number: H01L27/11556 , G11C16/0425 , G11C16/0433 , G11C16/0483 , H01L27/088 , H01L27/11524 , H01L27/11551 , H01L29/42328 , H01L29/66477 , H01L29/66825 , H01L29/7883 , H01L29/7889
Abstract: Provided is a semiconductor integrated circuit that uses a novel vertical MOS transistor that is free of interference between cells, that enables the short-channel effect to be minimized, that does not have hot electron injection, and that does not require the formation of shallow junction. Also provided is a method of producing the semiconductor integrated circuit. A memory cell 1 in the semiconductor integrated circuit is provided with: a semiconductor pillar 2 that serves as a channel; a floating gate 5 that circumferentially covers the semiconductor pillar 2 via a tunnel insulation layer 6 on the outer circumference of the semiconductor pillar 2; and a control gate 4 that circumferentially covers the semiconductor pillar via an insulating layer 8 on the outer circumference of the semiconductor pillar 2, and that circumferentially covers the floating gate 5 via an insulating layer 7 on the outer circumference of the floating gate.
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34.
公开(公告)号:US20150332745A1
公开(公告)日:2015-11-19
申请号:US14758100
申请日:2013-12-25
Applicant: TOHOKU UNIVERSITY
Inventor: Takashi Ohsawa , Tetsuo Endoh
CPC classification number: G11C7/22 , G11C11/1655 , G11C11/1657 , G11C11/1659 , G11C11/1673 , G11C11/1675 , G11C11/1693 , G11C13/0004 , G11C13/0007 , G11C13/0069 , G11C14/0081 , G11C14/009
Abstract: A memory cell (1) includes a first storage circuit (2) with a write time t1 and a data retention time τ1 and a second storage circuit (3) with a write time t2 and a data retention time τ2 (t1
Abstract translation: 存储单元(1)包括具有写入时间t1和数据保持时间τ1的第一存储电路(2)和写入时间t2和数据保持时间τ2(t1
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公开(公告)号:US20140355330A1
公开(公告)日:2014-12-04
申请号:US14369974
申请日:2012-12-04
Applicant: TOHOKU UNIVERSITY
Inventor: Tetsuo Endoh , Takashi Ohsawa , Hiroki Koike , Takahiro Hanyu , Hideo Ohno
IPC: G11C13/00
CPC classification number: G11C13/0038 , G11C11/161 , G11C11/1659 , G11C11/1673 , G11C11/1675 , G11C11/1693 , G11C13/0004 , G11C13/0007 , G11C13/0069 , G11C14/00 , G11C14/0081 , G11C15/046 , G11C19/02 , G11C29/50012 , H03K3/356139 , H03K3/59 , H03K19/18
Abstract: An integrated circuit that does not involve increase in power consumption or decrease in switching probability that occur when a latch circuit using STT-MTJ device, etc. of the prior art is operated at high speed is provided. The integrated circuit 1 includes: a memory element 1B where write occurs when a specified period τ has elapsed after a write signal is input; and a basic circuit element 1A, which is an elementary device constituting a circuit and has a data retaining function, and characterized in that an operation frequency f1 in a first operation mode in the process of information processing of the basic circuit element 1A satisfies the following relation: τ>λ1/f1(0
Abstract translation: 提供了当使用现有技术的STT-MTJ装置等的锁存电路以高速运行时,不涉及增加功耗或降低切换概率的集成电路。 集成电路1包括:存储元件1B,其中在写入信号被输入之后经过了指定的周期τ时发生写入; 以及作为构成电路并具有数据保持功能的基本装置的基本电路元件1A,其特征在于,在基本电路元件1A的信息处理的处理中的第一动作模式中的动作频率f1满足以下 关系:τ>λ1/ f1(0 <λ1&nlE; 1)。
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公开(公告)号:US20250031581A1
公开(公告)日:2025-01-23
申请号:US18569910
申请日:2022-06-15
Applicant: TOHOKU UNIVERSITY
Inventor: Yoshiaki Saito , Tetsuo Endoh , Shoji Ikeda
Abstract: There is provided a stacked film that allows flowing a write current and achieves a high-density and/or high-speed memory and a magnetoresistive effect element using the stacked film. A magnetic stacked film 10 is formed of a three-layered structure that includes a first ferromagnetic layer 12, an antiferromagnetic coupling layer 10a provided on the first ferromagnetic layer 12, and a second ferromagnetic layer 16 provided on the antiferromagnetic coupling layer 10a. The antiferromagnetic coupling layer 10a includes a first non-magnetic layer 13, an interlayer coupling layer 14, and a second non-magnetic layer 15. The interlayer coupling layer 14 is selected from a metal or an alloy including at least any one of Ir, Ru, and Rh. The first non-magnetic layer 13 and the second non-magnetic layer 15 are selected from a metal or an alloy including Pt.
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公开(公告)号:US11790966B2
公开(公告)日:2023-10-17
申请号:US17417917
申请日:2019-11-28
Applicant: TOHOKU UNIVERSITY
Inventor: Masanori Natsui , Takahiro Hanyu , Tetsuo Endoh
CPC classification number: G11C11/161 , H03K19/18 , H10B61/00 , H10N50/80 , H03K19/20
Abstract: A nonvolatile logic circuit includes: a memory unit having a pair of resistive memory elements; a computation unit connected to the memory unit and configured to perform an operation based on an input signal and a logic value corresponding to a resistance state of the pair of resistive memory elements; a determination circuit configured to determine whether the resistance state of the pair of resistive memory elements is a complementary state or a non-complementary state; and an output circuit connected to the computation unit and the determination circuit, and configured to output a signal corresponding to an operation result by the computation unit or a signal corresponding to a determination result by the determination circuit.
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公开(公告)号:US11765981B1
公开(公告)日:2023-09-19
申请号:US17264655
申请日:2019-06-21
Applicant: TOHOKU UNIVERSITY
Inventor: Sadahiko Miura , Hiroaki Honjo , Hideo Sato , Shoji Ikeda , Tetsuo Endoh
CPC classification number: H10N50/10 , G11C11/161
Abstract: A magnetoresistance effect element with a small element size can be provided which achieves both an increase in a thermal stability factor Δ and a reduction in a writing current IC0 and which improves a performance index Δ/IC0(μA−1) obtained by dividing the thermal stability factor Δ by the writing current IC0. The magnetoresistance effect element includes a first reference layer (B1), a first junction layer (11), a first magnetic layer (21), a first non-magnetic coupling layer (31), a second magnetic layer (22), and a second junction layer (12), and a film thickness of the first non-magnetic coupling layer (31) is 0.1 nm or more and 0.3 nm or less.
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公开(公告)号:US11610615B2
公开(公告)日:2023-03-21
申请号:US17274099
申请日:2018-09-07
Applicant: TOHOKU UNIVERSITY
Inventor: Takahiro Hanyu , Daisuke Suzuki , Tetsuo Endoh
IPC: G11C11/16
Abstract: A lookup table circuit constituting a programmable logic device includes: a memory cell array including a plurality of memory cells, each having a resistive memory element; a selection circuit connected to the memory cell array and configured to output, to the memory cell array, a single cell-select signal or two or more cell-select signals for selecting a single memory cell or two or more memory cells among the plurality of memory cells, based on input of a plurality of logic signals; and a read circuit connected to the memory cell array and configured to read data from the single memory cell or the two or more memory cells selected by the single cell-select signal or the two or more cell-select signals, among the plurality of memory cells. The selection circuit is separated from a path along which the read circuit is configured to read data from the memory cell array.
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40.
公开(公告)号:US11610614B2
公开(公告)日:2023-03-21
申请号:US17047316
申请日:2019-04-11
Applicant: TOHOKU UNIVERSITY
Inventor: Yoshiaki Saito , Shoji Ikeda , Hideo Sato , Tetsuo Endoh
Abstract: Provided are a magnetoresistive element, a magnetic memory device, and a writing and reading method for a magnetic memory device, in which an aspect ratio of a junction portion can be decreased. A magnetoresistive element 1 of the invention, includes: a heavy metal layer 2 that is an epitaxial layer; and a junction portion 3 including a recording layer 31 that is provided on the heavy metal layer 2 and includes a ferromagnetic layer of an epitaxial layer magnetized in an in-plane direction, which is an epitaxial layer, a barrier layer 32 that is provided on the recording layer 31 and includes an insulating body, and a reference layer 33 that is provided on the barrier layer 32 and has magnetization fixed in the in-plane direction, in which the recording layer 31 is subjected to magnetization reversal by applying a write current to the heavy metal layer 2.
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