公开(公告)号：US20140354344A1

公开(公告)日：2014-12-04

申请号：US14229307

申请日：2014-03-28

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  John J. Pickerd

IPC: H03M1/12 ,  G01R23/14

CPC classification number: H03M1/121 ,  G01R13/0272 ,  G01R23/14 ,  H03M1/1215

Abstract: A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers.

Abstract translation: 一种测试和测量仪器，包括分配器，其被配置为将具有特定带宽的输入信号分割成多个分离信号，每个分离信号基本上包括输入信号的整个带宽; 多个谐波混合器，每个谐波混频器被配置为将所述多个分离信号的相关联的分离信号与相关联的谐波信号混合以产生相关联的混合信号; 以及多个数字转换器，每个数字转换器被配置为数字化多个谐波混频器中相关联的谐波混频器的混合信号。 与谐波混频器相关联的至少一个谐波信号的一阶谐波与至少一个数字化仪的有效采样率不同。

公开(公告)号：US20130134999A1

公开(公告)日：2013-05-30

申请号：US13734345

申请日：2013-01-04

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett ,  Ira G. Pollock ,  Daniel G. Knierim ,  Michael Duane Stevens

IPC: G01R23/16

CPC classification number: G01R23/16 ,  G01R1/06766 ,  G01R1/06772 ,  G01R35/00

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统具有带反馈回路电路的输入放大器和耦合到输入电路的并联极点对，提供极 - 零对以保持平坦度 信号采集系统频率带宽。

公开(公告)号：US20240369665A1

公开(公告)日：2024-11-07

申请号：US18652163

申请日：2024-05-01

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Noah Brummer ,  Roger D. Bighouse

IPC: G01R35/00 ,  G01R1/067 ,  G01R13/02

Abstract: A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.

公开(公告)号：US20240310413A1

公开(公告)日：2024-09-19

申请号：US18604102

申请日：2024-03-13

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  Daniel G. Knierim ,  Matthew J. Hull

IPC: G01R1/20 ,  G01R1/067

CPC classification number: G01R1/203 ,  G01R1/06794

Abstract: A test and measurement accessory includes a shunt configured to be located in a current path including a device under test, the shunt comprising a wire bundle of individually insulated wires as a resistive portion and a sense lead, the wire bundle and the sense lead electrically connected at a first end, a first electrical contact electrically connected to the sense lead at a second end, and a second electrical contact electrically connected to the wires of the wire bundle at the second end to allow measurement of a voltage drop across the first and second electrical contacts. A test and measurement system includes a test and measurement instrument and the test and measurement accessory. A method includes measuring current using the accessory.

公开(公告)号：US20240159797A1

公开(公告)日：2024-05-16

申请号：US18511977

申请日：2023-11-16

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Shane A. Hazzard ,  Scott T. Harrison ,  Timothy E. Bieber

IPC: G01R1/20

CPC classification number: G01R1/20 ,  G02B6/12

Abstract: A test and measurement system includes one or more remote heads, each of the one or more remote heads configured to be coupled to a respective device under test (DUT) to receive an electrical test signal from the DUT and each of the one or more remote heads including an electrical-to-optical (EOM) configured to convert the received electrical test signal into an optical test signal. Optical interconnection circuitry receives the optical test signal from the EOM of the one or more remote heads and, in response to control signals, selects one of the optical test signals to be provided to a test and measurement system. The optical interconnection circuitry further converts the selected optical test signal into an electrical test signal to be supplied to a test port of the test and measurement instrument. Methods are also described.

公开(公告)号：US20240087776A1

公开(公告)日：2024-03-14

申请号：US18243632

申请日：2023-09-07

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  Christopher R. Muggli ,  Daniel G. Knierim ,  David M. Ediger ,  Richard N. Atherton

IPC: H01C7/00 ,  G01R1/067

CPC classification number: H01C7/00 ,  G01R1/067

Abstract: A shunt resistor has a substrate having electrically conductive structures to carry current in a current path, a resistive portion in electrical contact with the electrically conductive structures, and one or more canceling inductance leads electrically connected to the electrically conductive structures and the resistive portion, the one or more canceling inductance configured to cancel inductive effects in a voltage measurement across the resistive portion. A modular tip interconnect has a connector at a first end of the interconnect configured to connect to a probe tip of a test and measurement instrument, and the above shunt resistor located at a second end of the interconnect configured to connect to a device under test (DUT).

公开(公告)号：US11768161B2

公开(公告)日：2023-09-26

申请号：US17307989

申请日：2021-05-04

Applicant: Tektronix, Inc.

Inventor： Jonathan S. Dandy ,  Daniel G. Knierim

IPC: G01N22/00 ,  G01R15/26 ,  H03L7/06

CPC classification number: G01N22/00 ,  G01R15/26 ,  H03L7/06

Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.

公开(公告)号：US11652494B1

公开(公告)日：2023-05-16

申请号：US17555226

申请日：2021-12-17

Applicant: Lawrence Livermore National Security, LLC ,  Tektronix, Inc.

Inventor： Brandon Walter Buckley ,  Ryan Douglas Muir ,  Daniel G. Knierim

IPC: H03M1/20 ,  H03M1/12

CPC classification number: H03M1/201 ,  H03M1/124

Abstract: Methods and devices for digitizing an analog repetitive signal using waveform averaging are described. An example method includes generating a discrete set of analog dither offset voltages, wherein at least two of the discrete set of analog dither offset voltages are different from each other, receiving the analog repetitive signal comprising multiple instances of a waveform, wherein the waveform has a waveform duration, generate a timing alignment to align each waveform of the analog repetitive signal and the corresponding analog dither offset voltage over the waveform duration, combining, based on the timing alignment, each waveform and the corresponding analog dither offset voltage over the waveform duration to produce an analog output signal, converting the analog output signal to a digital output signal, and producing, based on the timing alignment, a digital averaged signal based on averaging the multiple instances of the waveform in the analog output signal.

公开(公告)号：US20220018896A1

公开(公告)日：2022-01-20

申请号：US17379940

申请日：2021-07-19

Applicant: Tektronix, Inc.

Inventor： Charles W. Case ,  Daniel G. Knierim ,  Joshua J. O'Brien ,  Josiah A. Bartlett ,  Julie A. Campbell

IPC: G01R31/28 ,  G01R29/26

Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.

公开(公告)号：US11041884B2

公开(公告)日：2021-06-22

申请号：US16450921

申请日：2019-06-24

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Barton T. Hickman

IPC: G01R13/02 ,  H03M1/12 ,  G01R35/00 ,  H03M1/06 ,  H03M1/10

Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.